Search results for: 'Ø25.4'

Dimensions, mm: Ø25.4 (+0/-0.1mm) x 0.3 (+/-0.03mm)
Material: Schott D263T

Parallelism error: 0.05mm;

S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8nm
Wedge / Parallelism error: <1 arcmin

Surface quality, S-D: 20-10
Material: BK7
Dimensions, mm: Ø25.4 (+0/-0.1) x 3 (±0.1)
Clear Aperture: >90
Protective chamfers: 0.1-0.25 mm x 45°

Protective chamfers: 0.1-0.2 mm x 45°
Thickness, mm: 5 (±0.1)

S1 Surface flatness: < λ/8 @ 633 nm
Parallelism error: <1 arcmin
Material: UVFS (Corning 7980 0F)
Dimensions, mm: Ø25.4 (+0/-0.1)
Clear Aperture: >90
S1 Surface quality, S-D: 40-20

Material: UVFS (Corning 7980 0F)
Wedge / Parallelism error: <1arcmin

Protective chamfers: 0.1-0.25 mm x 45°
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8nm
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Clear Aperture: >90
Surface quality, S-D: 20-10

Material: UVFS Corning 7980 0F
Protective chamfers: 0.1-0.25 mm x 45°

Surface quality, S-D: 20-10
Dimensions, mm: Ø25.4 (+0/-0.1) x 3 (±0.1)
Clear Aperture: >90
Wedge / Parallelism error: <1 arcmin
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8nm

Protective chamfers: 0.1-0.25 mm x 45°
Thickness, mm: 6 (±0.1)

Wedge / Parallelism error: <1arcmin
Surface quality, S-D: 20-10
S1 Flatness, PV IR S2 Flatness, PV: λ/8 @ 632.8nm
Dimensions, mm: Ø25.4 (+0/-0.1)
Clear Aperture: >90
Material: N-BK7
Surface roughness, nm: 0.5 - 1.5

Surface roughness, nm: 0.5 - 1.5
Thickness, mm: 6 (±0.1)

Surface quality, S-D: 40-20
Protective chamfers: 0.1-0.25 mm x 45°
S1 Flatness, PV IR S2 Flatness, PV: λ/4 @ 632.8nm
Dimensions, mm: Ø25.4 (+0/-0.1)
Clear Aperture: >90
Wedge / Parallelism error: <1arcmin
Material: Zerodur

Protective chamfers: 0.1-0.25 mm x 45°
Surface roughness, nm: 0.5 - 1.5

Thickness, mm: 6 (±0.1)
Surface quality, S-D: 20-10
S1 Flatness, PV IR S2 Flatness, PV: λ/8 @ 632.8nm
Dimensions, mm: Ø25.4 (+0/-0.1)
Clear Aperture: >90
Wedge / Parallelism error: <1arcmin
Material: Zerodur

Protective chamfers: 0.1-0.25 mm x 45°
Clear Aperture: >90

Surface quality, S-D: 20-10
Wedge / Parallelism error: 0.5° ± 5 arcmin
Dimensions, mm: Ø25.4 (+0/-0.1) x 6 at thickest point (±0.1)
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8nm
Material: UVFS

S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8nm
Wedge / Parallelism error: 1° ± 5 arcmin

Surface quality, S-D: 20-10
Material: UVFS
Dimensions, mm: Ø25.4 ( +0/-0.1) x 3 at thickest point (±0.1)
Clear Aperture: >90
Protective chamfers: 0.1-0.25 mm x 45°

S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8nm
Surface quality, S-D: 20-10

Protective chamfers: 0.1-0.25 mm x 45°
Material: BK7
Wedge / Parallelism error: 1° ± 5 arcmin
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 at thickest point (±0.1)
Clear Aperture: >90

Material: UVFS Corning 7980 OF grade
Wedge / Parallelism error: <5 arcsec

Protective chamfers: <0.25 mm x 45°
S1 Flatness, PV IR S2 Flatness, PV: <λ/10 @ 632.8 nm
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Clear Aperture: >90
Surface quality, S-D: 10-5

Parallelism error: <5 arcmin
Thickness, mm: 2.0 (±0.1)

S1/S2 Surface roughness Rq RMS: ~4-8 angstroms
S1/S2 Surface quality, S-D: 10-5
Protective chamfers: 0.1-0.2 mm x 45°
Material: UVFS (Corning 7980 0F)
Dimensions, mm: Ø25.4 (+0/-0.1)
Clear Aperture: >90
S1/S2 Surface flatness: <λ/10 @ 633 nm

Dimensions, mm: Ø25.4 (+0/-0.1)
Thickness, mm: 1 (±0.1)

Surface quality, S-D: 20-10
S1 Flatness, PV IR S2 Flatness, PV: <λ/2 @ 632.8 nm per CA
Protective chamfers: <0.1 mm x 45°
Perpendicularity: <10 arcmin
Material: undoped YAG [111]
Clear apertute, %: >90
Parallelism error: <1 arcmin

S1 Flatness, PV IR S2 Flatness, PV: <λ/2 @ 632.8 nm per CA
Thickness, mm: 1 (±0.1)

Surface quality, S-D: 20-10
Perpendicularity: <10 arcmin
Parallelism error: <1 arcmin
Clear apertute, %: >90
Material: undoped YAG [111]
Protective chamfers: <0.1 mm x 45°
Dimensions, mm: Ø25.4 (+0/-0.1)

Surface quality, S-D: 20-10
Dimensions, mm: Ø25.4 (+0/-0.1)

Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Thickness, mm: 1 (±0.1)
Protective chamfers: <0.1 mm x 45°
Clear Aperture: >90
Material: undoped YAG [111]
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Parallelism error: <1 arcmin

Material: UVFS Corning 7980 OF grade
Protective chamfers: <0.25 mm x 45°

Surface quality, S-D: 10-5
Engraved: TO-WS8B V
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Clear Aperture: >90
Wedge / Parallelism error: <5 arcsec
S1 Flatness, PV IR S2 Flatness, PV: <λ/10 @ 632.8 nm

Material: UVFS (Corning 7980 0F)
Wedge / Parallelism error: <1arcmin

Thickness, mm: 6 (±0.1)
Surface roughness, nm: 0.5 - 1.5
Protective chamfers: 0.1-0.25 mm x 45°
S1 Flatness, PV IR S2 Flatness, PV: λ/2 @ 632.8nm
Dimensions, mm: Ø25.4 (+0/-0.1)
Clear Aperture: >90
Surface quality, S-D: 80-60

Material: UVFS (Corning 7980 0F)
Wedge / Parallelism error: <1arcmin

Thickness, mm: 6 (±0.1)
Surface roughness, nm: 0.5 - 1.5
Protective chamfers: 0.1-0.25 mm x 45°
S1 Flatness, PV IR S2 Flatness, PV: λ/4 @ 632.8nm
Dimensions, mm: Ø25.4 (+0/-0.1)
Clear Aperture: >90
Surface quality, S-D: 40-20

Protective chamfers: <0.25 mm x 45°
Transmitted wavefront distortion, PV: <λ/10 @ 633 nm

Suface flatness, PV: <λ/10 @ 633 nm
Material: IRFS (Suprasil 311)
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Clear Aperture: >90
Wedge (marked with an arrow): <30 arcmin (±5 arcmin)
Surface quality, S-D: 10-5

Material: UVFS Corning 7980 0F
Wedge / Parallelism error: <1 arcmin

Protective chamfers: 0.1-0.25 mm x 45°
Material: BK7
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8nm
Dimensions, mm: Ø25.4 (+0/-0.1) x 3 (±0.1)
Dimensions, mm: Ø25 (+0/-0.1) x 3 (±0.1)
Clear Aperture: >90
Surface quality, S-D: 20-10

Material: UVFS JGS1
Wedge / Parallelism error: <5 arcsec

TWD, PV: <λ/8 @ 632.8 nm
Surface quality, S-D: 10-5
Polishing technology: polished on 2-side polishing stage, no CeO2 used
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Clear Aperture: >90
Protective chamfers: 0.1-0.25 mm x 45°

Material: UVFS
Thickness, mm: 6.0 mm (+/-0.1mm)

Surface quality, S1/S2: 10-5 S-D
Surface quality S2, S-D: grinded
Surface quality S1, S-D: 20-10
S1 Flatness, PV IR S2 Flatness, PV: λ/10@ 633 nm
Protective chamfers: 0.2 – 0.3 mm x 45°
Wedge / Parallelism error: <1 arcmin
Protective chamfers: <0.25 mm x 45°
Flatness S1, PV: <λ/8 @ 632.8 nm
Dimensions, mm: Ø25.4 (+0/-0.1) x 6 (±0.1)
Diameter, mm: 25.4 mm (+0.0/-0.1 m)
Coatings: uncoated
Clear aperture: >90 %
Clear Aperture: >90
Parallelism error: <30 arcsec
Material: UVFS Corning 7980 (JGS1)

Dimensions, mm: Ø25.4
Material: UVFS

Protective chamfers: <0.25 mm x 45°
S1 Flatness, PV: <λ/10-λ/8 @ 632.8nm
S1 Surface quality, S-D: 40-20
S2 Flatness, PV: <λ/10-λ/8 @ 632.8nm
S2 Surface quality, S-D: 40-20
Thickness, mm: 3
Wedge / Parallelism error: 3° ± 5 arcmin

Material: UVFS
Wedge / Parallelism error: <1 arcmin

Thickness, mm: 6.35
Thickness tolerance, mm: ±0.1
S2 Surface quality, S-D: commercial polished
S1 Flatness, PV: <λ/10 @ 632.8 nm
Dimensions, mm: Ø25.4
Dimensions tolerance, mm: +0/-0.1
Clear Aperture: >90
S1 Surface quality, S-D: 10-5

S2 Flatness, PV: <λ/6 @ 632.8 nm
Wedge / Parallelism error: <3 arcmin

Thickness, mm: 6.35
S2 Surface quality, S-D: 40-20
S1 Flatness, PV: <λ/6 @ 632.8 nm
Protective chamfers: <0.25 mm x 45°
Material: IRFS
Dimensions, mm: Ø25.4
S1 Surface quality, S-D: 40-20

Apex angle, °: 130 (±0.5)
AR coatings: uncoated

Clear Aperture: >90
Diameter, mm: Ø25.4 (+0/-0.15)
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Surface quality, S-D: 40-20

Apex angle, °: 160 (±0.5)
AR coatings: uncoated

Clear Aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.15)
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Surface quality, S-D: 40-20

Apex angle, °: 140 (±0.5)
AR coatings: uncoated

Clear Aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.15)
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Surface quality, S-D: 40-20

Protective chamfers: 0.3 mm x 45°
Transmitted wavefront distortion, PV: <λ/4 @ 632.8nm

Transmitted wavefront distortion, PV: <λ/4 @ 632.8 nm per CA
Thickness, mm: 2 (±0.1)
Thickness, mm: 2 (+/-0.1)
Surface quality, S-D: 40-20
S1/S2 Surface quality, S-D: 40-20
S1: PR (Rs=0.5% +/-0.1%, Rp=0.5% +/-0.1%) @ 755 nm, AOI = 45°, stable @ T=10-80°C
Diameter, mm: Ø25.4 (+0/-0.1)
S2: PR (Rs=0.5% +/-0.1%, Rp=0.5% +/-0.1%) @ 755 nm, AOI = 45°, stable @ T=10-80°C
Coatings:
Dimensions, mm: Ø25.4 (+0/-0.1)
Material: BK7
Material: N-BK7
Parallelism error: < 1 arcmin
Parallelism error: <3
Clear aperture: >90%
Protective chamfers: <0.3 mm x 45°

Wedge / Parallel ism error: <1arcmin
Surface quality, S-D: 20-10

Protective chamfers: <0.25 mm x 45°
S1: AR(R<0.3%)@515-532nm
Dimensions, m m: Ø25.4 (+0/-0.1) x 5 (±0.1)
Coatings:
Clear Aperture: >90
Material: UVFS
S2: AR(R<0.3%)@515-532nm

Material: UVFS
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm

Thickness, mm: 5 (±0.1)
Surface quality, S-D: 20-10
S2: AR(R<0.2%)@1030 nm, AOI 0°
Protective chamfers: <0.25 mm x 45°
Dimensions, mm: Ø25.4 (+0.0/-0.1)
Coatings:
Clear Aperture: >90
S1: AR(R<0.2%)@1030 nm, AOI 0°

Protective chamfers: 0.1-0.25 mm x 45°
TWD, PV: <λ/10 @ 632.8 nm

Surface quality, S-D: 20-10
S1: AR(R<0.2%)@1064nm
Wedge / Parallelism error: <5 arcsec
Material: UVFS Corning 7980 OF grade
Dimensions, mm: Ø25.4 (+0/-0.1) x 3 (±0.1)
Coatings:
Clear Aperture: >90
S2: AR(R<0.2%)@1064nm

Protective chamfers: <0.25 mm x 45°
Material: UVFS (Corning 7980 0F)

Wedge / Parallelism error: <1 arcmin
Clear Aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Coatings: uncoated
Surface quality, S-D: 40-20
S1 Flatness, PV IR S2 Flatness, PV: <λ/10 @ 632.8 nm

Clear Aperture: >90
Wedge / Parallelism error: <1 arcmin

Surface quality, S-D: 40-20
Protective chamfers: <0.25 mm x 45°
Material: UVFS (Corning 7980 0F)
S1 Flatness, PV IR S2 Flatness, PV: <λ/10 @ 632.8 nm
Coatings: uncoated
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)

Clear aperture: >90 %
Coatings:

Dimensions, mm: Ø25.4 (+0/-0.1) x 3 (±0.1)
Material: UVFS
Protective chamfers: 0.1-0.3 mm x 45°
S1: AR(R<0.3%)@ 515-532 nm, AOI=0°
S2(wedge ^): uncoated
Surface quality, S1/S2: 20-10 S-D
Transmitted wavefront distortion, PV: <λ/8@ 632.8 nm
Wedge (^): 3° (±5 arcmin)

Wedge / Parallelism error: <1 arcmin
Wavelength, nm: 532

Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Dimensions, mm: Ø25.4 (+0/-0.1) x 3 (±0.1)
Clear Aperture: >90
Angle of Incidence (AOI), °: 0
Surface quality, S-D: 20-10
Reflectivity, %: <0.25

Surface quality, S-D: 20-10
Material: UVFS

Wedge / Parallelism error: <1 arcmin
Wavelength, nm: 1047-1064
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Protective chamfers: <0.25 mm x 45°
Angle of Incidence (AOI), °: 0
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Clear Aperture: >90
Reflectivity, %: <0.25

Material: UVFS
Wedge / Parallelism error: <1 arcmin

Wavelength, nm: 266
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Surface quality, S-D: 20-10
Protective chamfers: <0.25 mm x 45°
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Clear Aperture: >90
Angle of Incidence (AOI), °: 0
Reflectivity, %: <0.25

Angle of Incidence (AOI), °: 0
Clear Aperture: >90

Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflectivity, %: <0.25
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Wavelength, nm: 1550
Wedge / Parallelism error: <1 arcmin

Angle of Incidence (AOI), °: 0
Clear Aperture: >90

Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflectivity, %: <0.25
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Wavelength, nm: 527-532
Wedge / Parallelism error: <1 arcmin

Angle of Incidence (AOI), °: 0
Clear Aperture: >90

Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflectivity, %: <0.25
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Wavelength, nm: 515
Wedge / Parallelism error: <1 arcmin

Angle of Incidence (AOI), °: 0
Clear Aperture: >90

Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflectivity, %: <0.25
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Wavelength, nm: 343-355
Wedge / Parallelism error: <1 arcmin

Angle of Incidence (AOI), °: 0
Clear Aperture: >90

Dimensions, mm: Ø25.4 (+0/-0.1) x 6 (±0.1)
Material: BK7
Protective chamfers: <0.25 mm x 45°
Reflectivity, %: <0.25
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Wavelength, nm: 1550
Wedge / Parallelism error: <1 arcmin

Clear aperture: >90 %
Coatings:

Dimensions, mm: Ø25.4 (+0/-0.1) x 3 (±0.1)
Material: UVFS
Protective chamfers: 0.1-0.3 mm x 45°
S1: AR(R<0.3%) @ 343-355 nm, AOI=0°
S2(wedge ^): uncoated
Surface quality, S1/S2: 20-10 S-D
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Wedge (^): 3° (±5 arcmin)

Clear aperture: >90 %
Coatings:

Dimensions, mm: Ø25.4 (+0/-0.1) x 3 (±0.1)
Material: UVFS
Protective chamfers: 0.1-0.3 mm x 45°
S1: AR(R<0.3%) @ 1030-1064 nm, AOI=0°
S2(wedge ^): uncoated
Surface quality, S1/S2: 20-10 S-D
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Wedge (^): 3° (±5 arcmin)

S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
S1: uncoated

Surface quality: 20-10 S-D
S2: AR(Rsp<1%)@750-850nm; AOI 45°
LIDT: > 2.5J/cm² @ 300 ps 10Hz 800 nm
Dimensions, mm: Ø25.4 (+0/-0.5)
Clear aperture: >90 %
Coating adhesion and durability: Per MIL-C-675A
Material: UVFS
Thickness, mm: 3 (±1)

Protective chamfers: <0.25 mm x 45°
Wedge / Parallelism error: <1 arcmin

Surface quality, S-D: 40-20
S1: AR(R<0,2%)@355 nm+MS etching
Material: UVFS (Corning 7980 0F)
S1 Flatness, PV IR S2 Flatness, PV: <λ/10 @ 632.8 nm
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Coatings:
Clear Aperture: >90
Angle of Incidence (AOI), °: 0
S2: AR(R<0,2%)@355 nm+MS etching

S1/S2: AR (R<0,25%) @ 343-355 nm + AR (R<0,5%) @ 628-633 nm, AOI 0-10°
Clear Aperture: >90

Wedge / Parallelism error: <5 arcsec
Surface quality, S-D: 20-10
Protective chamfers: <0.25 mm x 45°
Material: UVFS Corning 7980 OF grade
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
S1 Flatness, PV IR S2 Flatness, PV: <λ/10 @ 632.8 nm

Surface quality, S-D: 20-10
Angle of Incidence (AOI), °: 0

Wedger: ≤ 10 arc sec
S1 Flatness, PV IR S2 Flatness, PV: λ/10 @ 632.8 nm
Substrate: UVFS
S2: Optically polished
Protective chamfers: <0.25 mm x 45°
Dimensions, mm: Ø25.4 ( +0/-0.2) x 4 (±0.1)
Coatings:
Clear aperture: ≥Central 85% of diameter
S1: AR (R<0.2%) @ 1054 nm

Protective chamfers: <0.25 mm x 45°
Wedger: ≤ 10 arc sec

Surface quality, S-D: 20-10
S1 Flatness, PV IR S2 Flatness, PV: λ/10 @ 632.8 nm
Substrate: UVFS
S1: AR (R<0.2%) @ 1054 + 808 nm
Dimensions, mm: Ø25.4 ( +0/-0.2) x 4 (±0.1)
Coatings:
Clear aperture: ≥Central 85% of diameter
Angle of Incidence (AOI), °: 0
S2: Optically polished

Material: BK7
Wedge / Parallelism error: <1 arcmin

Thickness, mm: 3 (±0.1)
Surface quality, S-D: 20-10
S2: AR (Ravg < 0.5%) @ 1000-1300 nm + 1567 nm
Protective chamfers: <0.25 mm x 45°
S1 Flatness, PV IR S2 Flatness, PV: Dimensions, mm: Ø25.4 (+0.0/-0.1)
Coatings:
Clear Aperture: >90
S1: AR (Ravg < 0.5%) @ 1000-1300 nm + 1567 nm

Protective chamfers: 0.1-0.25 mm x 45°
Surface quality, S-D: 20-10

S1: AR(R<0.5%) @ 343-355 nm, AOI = 0°
TWD, PV: <λ/10 @ 632.8 nm
Parallelism error: <5 arcsec
Material: UVFS Corning 7980 OF grade
S1 Flatness, PV IR S2 Flatness, PV: <λ/10 @ 632.8 nm
Dimensions, mm: Ø25.4 (+0/-0.1) x 3 (±0.1)
Coatings:
Clear Aperture: >90
S2: AR(R<0.5%) @ 343-355 nm, AOI = 0°

S1: AR(R<0.2%)@1030 nm, 0°
Clear Aperture: >90

TWD, PV: <λ/10 @ 632.8 nm
Wedge / Parallelism error: <5 arcsec
Surface quality, S1/S2, S/D: 10/5 (after coatings 20/10 S/D)
S2: AR(R<0.2%)@1030 nm, 0°
Material: UVFS Corning 7980 OF grade
S1 Flatness, PV IR S2 Flatness, PV: <λ/10 @ 632.8 nm
Coatings: e-Beam
Dimensions, mm: Ø25.4 (+0/-0.1) x 3 (±0.1)
Protective chamfers: 0.1-0.25 mm x 45°

Adhesion and Durability: Per MIL-C-675A
Clear Aperture: >90%

Coating:
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
LIDT: >100 mJ/cm2, 50 fsec, 800 nm typical
Material: UVFS
S1: AR (R<0.3%) @ 400 + 800 nm, AOI = 0°
S2: AR (R<0.3%) @ 400 + 800 nm, AOI = 0°
S1 Flatness, PV IR S2 Flatness, PV: λ/8 @ 632.8 nm
Surface quality: 20-10 S-D
Wedge / Parallelism error: <1 arcmin

Perpendicularity: <10 arcmin
Protective chamfers: <0.1 mm x 45°

Thickness, mm: 1 (±0.1)
Surface quality, S-D: 20-10 before and after
S1 Flatness, PV IR S2 Flatness, PV: <λ/2 @ 632.8 nm per CA
S1: AR (R<0.1%) @1064 nm, AOI=0°
Clear apertute, %: >90
Material: undoped YAG [111]
S2: AR (R<0.1%) @1064 nm, AOI=0°
LIDT: >50 J/cm2 @1064, 10 Hz, 5 ns
Dimensions, mm: Ø25.4 (+0/-0.1)
Coating:
Parallelism error: <1 arcmin

S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm per Ø25.4 mm
Surface quality, S-D: 20-20

S2: HT (T>80%) @ 630-670 nm + HT (T>99.4%) @ 1070-1090 nm
S1: HT (T>80%) @ 630-670 nm + HT (T>99.4%) @ 1070-1090 nm
Wedge / Parallelism error: <1 arcmin
Material: UVFS
Coatings:
Coating technology: Magnetron Sputtering
Clear Aperture: >90
Angle of Incidence (AOI), °: 0
Protective chamfers: <0.25 mm x 45°
Dimensions, mm: Ø50.8 (+0/-0.1) x 6 ( ±0.1)

Material: UVFS (Corning 7980 0F)
Wedge / Parallelism error: 1° ± 5 arcmin

Thickness, mm: 3.0 mm (+/-0.1 mm)
Surface quality, S1/S2: 20/10 S/D (40/20 S/D after coating)
S1 Flatness, PV IR S2 Flatness, PV: <λ/8@633 nm
S2: uncoated (wedged side marked with „W“)
Protective chamfers: <0.25 mm x 45°
Diameter, mm: Ø25.4 mm (+0.0/-0.1 mm)
Coatings: e-Beam
Clear aperture: >90%
S1: AR(R<1%)@343-355 nm + 515 nm + 1030 nm, AOI=0° (not wedged side, marked with „∆“ arrow pointing to AR side)

S1 Flatness, PV: <λ/10 @ 632.8 nm
S1: AR (R<0.1%) @ 532 nm; AOI 0°

Thickness, mm: 5 (+/-0.1)
S2: AR (R<0.1%) @ 532 nm; AOI 0°
S2 Flatness, PV: <λ/10 @ 632.8 nm
S1 Surface quality, S-D: 20-10
Parallelism, arcesc: <5
Material: UVFS (7980 OF)
LIDT: > 20 J/cm2 @ 10 Hz 10 ns 10 mm (1/e2) 532 nm
Dimensions, mm: Ø25.4 (+0/-0.1)
Coatings Ion Beam Sputtering):
Clear aperture %: >90
S2 Surface quality, S-D: 20-10
Protective chamfers: <0.25 mm x 45°

Parallelism, arcesc: <5
S1 Surface quality, S-D: 20-10

Thickness, mm: 5 (+/-0.1)
S2: AR (R<0.1%) @ 1064 nm; AOI 0°
S2 Surface quality, S-D: 20-10
S2 Flatness, PV: <λ/10 @ 632.8 nm
S1: AR (R<0.1%) @ 1064 nm; AOI 0°
Protective chamfers: <0.25 mm x 45°
Material: UVFS (7980 OF)
LIDT: > 20 J/cm2 @ 10 Hz 10 ns 10 mm (1/e2) 1064 nm
Dimensions, mm: Ø25.4 (+0/-0.1)
Coatings (Magnetron Sputtering):
Clear aperture %: >90
S1 Flatness, PV: <λ/10 @ 632.8 nm

Angle of Incidence (AOI), °: 0
Dimensions, mm: Ø25.4

Material: UVFS
Reflectivity, %: <0.2
Surface quality, S-D: 40-20
Thickness, mm: 2.5
Wavelength, nm: 1030
Wedge / Parallelism error: 30 arcmin

Material: UVFS
Clear Aperture: >90

Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Thickness, mm: 3 (+/-0.1 mm)
Surface quality, S-D: 20-10
S1: AR(R<0.5%)@1047-1064 nm, AOI=32.5°
Dimensions, mm: Ø25.4(+0/-0.1 mm)
Coatings:
S2: AR(R<0.5%)@1047-1064 nm, AOI=32.5°

Apex angle tolerance, °: ±0.5
Apex angle, °: 90

AR coatings: uncoated
Clear aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.15)
Edge thickness, mm: 5 (±0.1)
Material: UVFS
Surface quality, S-D: 40-20

Protective chamfers: <0.25 mm x 45°
Surface quality, S-D: 40-20

Material: UVFS
Dimensions, mm: Ø25.4 (+0/-0.15)
Clear Aperture: >90
Apex angle, °: 175 (±0.5)
AR coatings: uncoated
Edge thickness, mm: 3.5 (±0.1)

Edge thickness, mm: 3.5 (±0.1)
Protective chamfers: <0.25 mm x 45°

Material: UVFS
Clear Aperture: >90
AR coatings: uncoated
Apex angle, °: 170 (±0.5)
Surface quality, S-D: 40-20
Dimensions, mm: Ø25.4 (+0/-0.15)

Material: UVFS
Protective chamfers: <0.25 mm x 45°

Edge thickness, mm: 8.0 (±0.1)
Dimensions, mm: Ø25.4 (+0/-0.15)
Clear Aperture: >90
AR coatings: uncoated
Apex angle, °: 140 (±0.5)
Surface quality, S-D: 60-40

Apex angle, °: 179,25 (±0.5)
AR coatings: uncoated

Clear Aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.15)
Edge thickness, mm: 3.5 (±0.1)
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Surface quality, S-D: 40-20

Clear Aperture: >90
Surface quality, S-D: 40-20

Protective chamfers: <0.25 mm x 45°
Material: UVFS
Dimensions, mm: Ø25.4 (+0/-0.15)
AR coatings: BBAR (Ravg<1%) @ 800-1350nm
Apex angle, °: 176 (±0.5)
Edge thickness, mm: 3.5 (±0.1)

Dimensions, mm: Ø25.4 (+0/-0.15)
Surface quality, S-D: 40-20

Protective chamfers: <0.25 mm x 45°
Edge thickness, mm: 3.5 (±0.1)
Clear Aperture: >90
AR coatings: AR/AR (Ravg<0.8%) @ 600-1100 nm
Apex angle, °: 175 (±0.5)
Material: UVFS

Protective chamfers: <0.25 mm x 45°
Apex angle, °: 179 (±0.5)

Surface quality, S-D: 40-20
Material: UVFS
Edge thickness, mm: 3.5 (±0.1)
Dimensions, mm: Ø25.4 (+0/-0.15)
AR coatings: AR/AR (Ravg<0.8%) @ 600-1100 nm
Clear Aperture: >90

Dimensions, mm: Ø25.4 (+0/-0.15)
Surface quality, S-D: 40-20

Protective chamfers: <0.25 mm x 45°
Edge thickness, mm: 3.5 (±0.1)
Clear Aperture: >90
AR coatings: AR/AR (Ravg<0.8%) @ 600-1100 nm
Apex angle, °: 170 (±0.5)
Material: UVFS

Apex angle, °: 179,25 (±0.5)
AR coatings: AR/AR (Ravg<0.8%) @ 600-1100 nm

Clear Aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.15)
Edge thickness, mm: 3.5 (±0.1)
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Surface quality, S-D: 40-20

Apex angle, °: 179 (±0.5)
AR coatings: AR/AR (Ravg<0.8%) @ 600-1100 nm

Clear Aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.15)
Edge thickness, mm: 3.5 (±0.1)
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Surface quality, S-D: 40-40

Apex angle, °: 172.5-173
AR coatings: AR/AR (Ravg≤0.4%) @ 425 - 675 nm

Clear Aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.15)
Edge thickness, mm: 3.5 (±0.1)
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Surface quality, S-D: 40-20

Apex angle, °: 142.5-143
AR coatings: AR/AR (Ravg≤0.4%) @ 425 - 675 nm

Clear Aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.15)
Edge thickness, mm: 3.5 (±0.1)
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Surface quality, S-D: 40-20

Edge thickness, mm: 3.5 (±0.1)
Protective chamfers: <0.25 mm x 45°

Material: UVFS
Surface quality, S-D: 40-20
Dimensions, mm: Ø25.4 (+0/-0.15)
Clear Aperture: >90
AR coatings: AR/AR (Ravg≤0.4%) @ 425 - 675 nm
Apex angle, °: 179 (±0.02)

Material: UVFS
Surface quality, S-D: 40-20

Protective chamfers: <0.25 mm x 45°
Edge thickness, mm: 3.5 (±0.1)
Dimensions, mm: Ø25.4 (+0/-0.15)
Clear Aperture: >90
Apex angle, °: 127 (±0.5)
AR coatings: AR/AR (Ravg≤0.4%) @ 425 - 675 nm

Edge thickness, mm: 3.5 (±0.1)
Protective chamfers: <0.25 mm x 45°

Material: UVFS
Clear Aperture: >90
AR coatings: AR/AR (R<0.75%) @250-425 nm + (R<0.5%) @ 370-420 nm
Apex angle, °: 179 (±0.5)
Dimensions, mm: Ø25.4 (+0/-0.15)
Surface quality, S-D: 40-20

Dimensions, mm: Ø25.4 (+0/-0.15)
Surface quality, S-D: 40-20

Protective chamfers: <0.25 mm x 45°
Apex angle, °: 178 (±0.5)
Edge thickness, mm: 3.5 (±0.1)
Clear Aperture: >90
AR coatings: AR/AR (R<0.75%) @250-425 nm + (R<0.5%) @ 370-420 nm
Material: UVFS

Material: UVFS
Surface quality, S-D: 40-20

Edge thickness, mm: 3.5 (±0.1)
Dimensions, mm: Ø25.4 (+0/-0.15)
Clear Aperture: >90
AR coatings: AR/AR (R<0.75%) @250-425 nm + (R<0.5%) @ 370-420 nm
Apex angle, °: 178 (±0.5)
Protective chamfers: <0.25 mm x 45°

Apex angle, °: 170 (±0.5)
AR coatings: AR/AR (R<0.75%) @250-425 nm + (R<0.5%) @ 370-420 nm

Clear Aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.15)
Edge thickness, mm: 3.5 (±0.1)
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Surface quality, S-D: 40-20

Apex angle, °: 160 (±0.5)
AR coatings: AR/AR (R<0.75%) @250-425 nm + (R<0.5%) @ 370-420 nm

Clear Aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.15)
Edge thickness, mm: 3.5 (±0.1)
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Surface quality, S-D: 40-20

Apex angle, °: 140 (±0.5)
AR coatings: AR/AR (R<0.75%) @250-425 nm + (R<0.5%) @ 370-420 nm

Clear Aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.15)
Edge thickness, mm: 3.5 (±0.1)
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Surface quality, S-D: 40-20

Apex angle, °: 176 (±0.5)
AR coatings: AR/AR (R<0.75%) @250-425 nm + (R<0.5%) @ 370-420 nm

Clear Aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.15)
Edge thickness, mm: 5 (±0.1)
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Surface quality, S-D: 40-20

Apex angle, °: 179 (±0.5)
AR coatings: AR/AR (R<0.75%) @250-425 nm + (R<0.5%) @ 370-420 nm

Clear Aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.15)
Edge thickness, mm: 5 (±0.1)
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Surface quality, S-D: 40-20

Apex angle, °: 178 (±0.5)
AR coatings: AR/AR (R<0.75%) @250-425 nm + (R<0.5%) @ 370-420 nm

Clear Aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.15)
Edge thickness, mm: 5 (±0.1)
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Surface quality, S-D: 40-20

Apex angle tolerance, °: ±0.5
Apex angle, °: 160

AR coatings: AR<0.5%@1050-1620
Clear aperture: >90
Dimensions, mm: Ø25.4
Edge thickness, mm: 5
Material: UVFS
Surface quality, S-D: 60-40

Apex angle tolerance, °: ±0.5
Apex angle, °: 179,8

AR coatings: AR/AR (Ravg<0,8%)@600-1100nm
Clear aperture: >90 %
Dimensions tolerance, mm: +0.0/-0.1
Dimensions, mm: Ø25.4
Edge thickness, mm: 5
Protective chamfers: <0.25 mm x 45°
Thickness tolerance, mm: ±0.1

Apex angle tolerance, °: ±0.5
Apex angle, °: 178.45

AR coatings: uncoated
Clear aperture: >90
Comments: Bessel ok. Ring ok.
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: Ø25.4
Edge thickness, mm: 3.5
Material: UVFS
Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1

Apex angle tolerance, °: ±0.5
Apex angle, °: 178

AR coatings: AR/AR(Ravg≤0.5%)@425-675
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.15)
Dimensions, mm: Ø25.4
Edge thickness, mm: 5
Material: UVFS
Surface quality, S-D: 60-20
Thickness tolerance, mm: ±0.1

Apex angle tolerance, °: ±0.5
Apex angle, °: 170

AR coatings: AR/AR(Ravg<0.8%)@600-1100
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.15)
Dimensions, mm: Ø25.4
Edge thickness, mm: 3.5
Material: UVFS
Surface quality, S-D: 60-40
Thickness tolerance, mm: ±0.1

Apex angle tolerance, °: ±0.5
Apex angle, °: 170

AR coatings: AR/AR(Ravg≤0.4%)@425-675; AOI=0°.
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.15)
Dimensions, mm: Ø25.4
Edge thickness, mm: 3.68
Material: UVFS
Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1

Apex angle tolerance, °: ±0.5
Apex angle, °: 178.8

AR coatings: uncoated
Clear aperture: >90 %
Dimensions tolerance, mm: +0.0/-0.1
Dimensions, mm: Ø25.4
Edge thickness, mm: 3.5
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Surface quality, S-D: 60-20
Thickness tolerance, mm: ±0.1

Apex angle tolerance, °: ±0.5
Apex angle, °: 164

AR coatings: AR/AR (Ravg≤0.4%) @ 425-675 nm
Clear aperture: >90
Dimensions tolerance, mm: +0/-0.15
Dimensions, mm: Ø25.4
Edge thickness, mm: 3.5
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1

Apex angle tolerance, °: ±0.5
Apex angle, °: 176

AR coatings: AR/AR(Ravg≤0.4%)@425-675
Clear aperture: >90
Diameter, mm: 25.4
Dimensions tolerance, mm: (+0/-0.15)
Dimensions, mm: Ø25.4
Edge thickness, mm: 5
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1

Apex angle tolerance, °: ±0.5
Apex angle, °: 140

AR coatings: AR/AR (Ravg<0.8%) @ 600-1100 nm
Clear aperture: >90
Comments: Bessel OK. Ring OK
Diameter, mm: 25.4
Dimensions tolerance, mm: +0/-0.15
Dimensions, mm: Ø25.4
Edge thickness, mm: 3
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Surface quality, S-D: 60-20
Thickness tolerance, mm: ±0.1

S2 Surface quality: commertial polished
S1 Clear aperture, %: >90

S1 Irregularity: <λ/8 @ 632.8 nm
S1 Radius of Curvature (ROC), mm: -200 (±1)
S1 Surface Irregularity: <λ/8 @ 632.8 nm per CA
S1 Surface quality, S-D: 40-20
S1: 4 mm diameter hole, 7 mm from mirror center (diameter and positioning tolerance +/-0.1 mm)
S1: 4 mm diameter hole, 7 mm from mirror center (diameter and positioning tolerance ±0.1 mm)
S2: 4 mm diameter hole, 7 mm from mirror center (diameter and positioning tolerance +/-0.1 mm)
S2 Surface quality: commercially polished
S1 Chips: <0.2 mm (outside diameter and hole)
Material: UVFS
S2 Chips: <0.5 mm (outside diameter and hole)
Dimensions, mm: Ø25.4 (+0/-0.1mm)
Additional requirements:
Centration error: <3 arcmin
Material: UVFS (JGS1)
Dimensions, mm: Ø25.4 (+0/-0.1)
ROC S1, mm: -200 (+/-0,5%)
Dimensions, mm: Ø25.4 (+0/-0.1)
Edge thickness, mm: 3 (+/-0.1mm)
Edge thickness, mm: 3 (±0.1)
Hole:
S2: 4 mm diameter hole, 7 mm from mirror center (diameter and positioning tolerance ±0.1 mm)
Material: UVFS (F-HUV6)
Protective chamfers: <0.25 mm x 45°
Protective chamfers: protective. Outside diameter and inside diameter

S1 Surface Irregularity: <λ/8 @ 632.8 nm per CA
S1 Clear aperture, %: >90

S2: 3 mm diameter hole, 7 mm from mirror center (diameter and positioning tolerance +/-0.1 mm)
S1 Irregularity: <λ/8 @ 632.8 nm
S1 Radius of Curvature (ROC), mm: -200 (±1)
S2: 3 mm diameter hole, 7 mm from mirror center (diameter and positioning tolerance ±0.1 mm)
S1 Surface quality, S-D: 40-20
S1: 3 mm diameter hole, 7 mm from mirror center (diameter and positioning tolerance +/-0.1 mm)
S1: 3 mm diameter hole, 7 mm from mirror center (diameter and positioning tolerance ±0.1 mm)
S2 Chips: <0.5 mm (outside diameter and hole)
S2 Surface quality: commertial polished
Protective chamfers: <0.25 mm x 45°
S2 Surface quality: commercially polished
S1 Chips: <0.2 mm (outside diameter and hole)
ROC S1, mm: -200 (+/-0,5%)
Additional requirements:
Centration error: <3 arcmin
Protective chamfers: protective. Outside diameter and inside diameter
Dimensions, mm: Ø25.4 (+0/-0.1)
Dimensions, mm: Ø25.4 (+0/-0.1mm)
Edge thickness, mm: 3 (+/-0.1mm)
Edge thickness, mm: 3 (±0.1)
Material: UVFS
Material: UVFS (F-HUV6)
Material: UVFS (JGS1)
Dimensions, mm: Ø25.4 (+0/-0.1)

Focal length, mm: +500 ±3% @ 800 nm
Material: BK7

S1 Flatness, PV IR S2 Flatness, PV: <λ/2 @ 632.8 nm
Dimensions, mm: Ø25.4 (+0.0/-0.6)
Coatings: AR(R<0.3%)@700-900 nm
Clear Aperture: >90
Surface quality, S-D: 40-20
Edge thickness, mm: 4.0 (+2.0/-0.0)

Focal length, mm: -800 (±3%)
Surface quality, S-D: 40-20

Material: BK7
Edge thickness, mm: >4
Dimensions, mm: Ø25.4 (+0/-0.6)
Damage threshold: > 3J/cm² @ 500ps @ 800nm, 10 Hz
Coatings: AR/AR(R<0.3%)@700-900nm
Clear aperture: >90%
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm

Edge thickness, mm: 1.8 (+2/-0)
Surface quality, S-D: 40-20

S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Material: BK7
Focal length, mm: +4000 (±3%)
Dimensions, mm: Ø25.4 (+0/-0.6)
Coatings: AR/AR(R<0.3%)@527-532nm
Clear Aperture: >90
Centration error: <3 arcmin
LIDT: >7J/cm2 @ 532nm; 10ns; 10Hz

Focal length tolerance, %: ±3
Thickness tolerance, mm: ±0.1

Surface quality, S-D: 40-40
Protective chamfers: <0.25 mm x 45°
Material: BK7
Focal length, mm: +1000
Wavelength, nm: 800
Dimensions tolerance, mm: +0/-0.1
Edge thickness, mm: >2.5
Coatings: AR/AR(R<0.25%)@700-900nm, AOI=0deg
Clear aperture: 79
Centration error: <3 arcmin
Dimensions, mm: Ø25.4

Focal length tolerance, %: ±3
Wavelength, nm: 632.8

Thickness tolerance, mm: +2/-0
Surface quality, S-D: 40-20
Protective chamfers: <0.25 mm x 45°
Material: BK7
Focal length, mm: -800
Centration error: <3 arcmin
Dimensions tolerance, mm: +0/-0.6
Edge thickness, mm: 4
Coatings: AR/AR(R<0,3%)@700-900nm
Clear aperture: >90
Dimensions, mm: Ø25.4

Material: UVFS
Surface quality, S-D: 40-20

S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Protective chamfers: <0.25 mm x 45°
Focal length, mm: +100 (±3%)
Edge thickness, mm: 2.0 (±0.1)
Dimensions, mm: Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Clear Aperture: >90
Centration error: <3 arcmin
ROC S1, mm: +45.7

Dimensions, mm: Ø25.4 (+0/-0.1)
Surface quality, S-D: 40-20

S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
ROC S1, mm: +4570.12
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Edge thickness, mm: 2.0 (±0.1)
Wavelength, nm: 632.8
Clear Aperture: >90
Centration error: <3 arcmin
Focal length, mm: +10000 (±3%)

Dimensions, mm: Ø25.4 (+0/-0.1)
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm

ROC, mm: +1142.53
Protective chamfers: <0.25 mm x 45°
Surface quality, S-D: 40-20
Material: UVFS
Wavelength, nm: 632.8
Clear Aperture: >90
Centration error: <3 arcmin
Edge thickness, mm: 2 (±0.1)
Focal length, mm: +2500 (±3%)

Dimensions, mm: Ø25.4 (+0/-0.1)
Surface quality, S-D: 40-20

S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
ROC S1, mm: -22.85
Protective chamfers: <0.25 mm x 45°
Focal length, mm: -50 (±3%)
Wavelength, nm: 632.8
Clear Aperture: >90
Centration error: <3 arcmin
Center thickness, mm: 2 (±0.1)
Material: UVFS

ROC S1, mm: -2000 (±2%)
S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm

Protective chamfers: <0.25 mm x 45°
Material: UVFS
Dimensions, mm: Ø25.4 (+0/-0.1)
Clear Aperture: >90
Centration error: <3 arcmin
Center thickness, mm: 4.96 (±0.1)
Surface quality, S-D: 20-10
Edge thickness, mm: 5 (±0.1)

LIDT: 7J/cm2 for 10 ns, 10Hz @ 532nm
Adhesion and durability: Per MIL-C-675A

S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 40-20
Material: BK7
Edge thickness, mm: 1.8 (+2/-0)
Dimensions, mm: Ø25.4 (+0/-0.6)
Clear Aperture: >90
Coatings: AR/AR(R<0.3%)@527-532nm
Focal length, mm: +200 (±3%)

Edge thickness, mm: >4
TWD, PV: <λ/3 @ 632.8 nm

Surface quality, S-D: 40-20
Required documents: Reflectivity curve
Focal length, mm: +2000 (±1%)
Dimensions, mm: Ø25.4 (+0/-0.6)
Damage threshold: 2.5J/cm2 for 300 ps pulse @ 1064 nm
Coatings: AR/AR(R<0.3%)@700-900nm
Clear Aperture: >90
Adhesion and durability: Per MIL-C-675A
Configuration: Spherical convex
Material: BK7

Focal length, mm: -256 (±1%) @ 800nm
TWD, PV: <λ/2 @ 632.8 nm

Surface quality, S-D: 40-20
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
LIDT: >2.5J/cm2 @ 800nm (300ps) @ 10Hz
Edge thickness, mm: >4
Dimensions, mm: Ø25.4 (+0/-0.6)
Coatings: AR(R<0.3%)@700-900 nm
Clear Aperture: >90
Material: BK7

Damage threshold: >5J/cm² @ 10ns @532nm, 10 Hz
Surface quality, S-D: 40-20

S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
TWD, PV: <λ/4 @ 632.8 nm
Material: BK7
Dimensions, mm: Ø25.4 (+0/-0.6)
Coatings: AR/AR(R<0.3%)@527-532nm, AOI 0deg
Clear aperture: >90%
Edge thickness, mm: >4
Focal length, mm: -800 (±1%) @ 532nm

S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Center thickness, mm: 2 (±0.1)

Surface quality, S-D: 40-20
S2: AR(R<0.2%)@800nm
S1: AR(R<0.2%)@800nm
ROC S1, mm: -34.28
Protective chamfers: <0.25 mm x 45°
Focal length, mm: -75 (±3%)
Dimensions, mm:   Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Coatings:
Clear Aperture: >90
Centration error: <3 arcmin
Material: UVFS

S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Protective chamfers: <0.25 mm x 45°

Surface quality, S-D: 40-20
S2: AR(R<0.2%)@800nm
S1: AR(R<0.2%)@800nm
ROC S1, mm: -22.85
Focal length, mm: -50 (±3%)
Dimensions, mm:   Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Coatings:
Clear Aperture: >90
Centration error: <3 arcmin
Center thickness, mm: 2 (±0.1)
Material: UVFS

Surface quality, S-D: 40-20
Surface irregularity, PV: <λ/4 @ 632.8 nm

S2: AR(R<0.2%)@800nm
S1: AR(R<0.2%)@800nm
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Wavelength, nm: 355
Focal length, mm: per request
Dimensions, mm: Ø25.4 (+0/-0.12)
Coatings:
Clear Aperture: >90
Centration error: <3 arcmin
Center thickness, mm: 4 (±0.2)
Focal length tolerance: ± 2%
Focus length: 400 mm

Coatings:
Material: UVFS

Surface quality, S-D: 40-20
Surface irregularity, PV: <λ/4 @ 632.8 nm
S2: AR(R<0.2%)@800nm
S1: AR(R<0.2%)@800nm
Protective chamfers: <0.25 mm x 45°
Focus length: 200 mm
Focal length, mm: per request
Focal length tolerance: ± 2%
Wavelength, nm: 355
Clear Aperture: >90
Centration error: <3 arcmin
Center thickness, mm: 4 (±0.2)
Dimensions, mm: Ø25.4 (+0/-0.12)

Dimensions, mm: Ø25.4 (+0/-0.1)
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm

ROC S1, mm: +137.1
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Edge thickness, mm: 2 (±0.1)
Surface quality, S-D: 40-20
Wavelength, nm: 632.8
Coatings: AR/AR<0.3% @ 515-532 nm, AOI=0 deg
Clear Aperture: >90
Centration error: <3 arcmin
Focal length, mm: +300 (±3%)

Focal length, mm: -250 (±1%)
Transmitted wavefront, PV: <λ/2 @ 632.8 nm

Surface quality, S-D: 40-20
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Material: N-BK7
Edge thickness, mm: >4
Dimensions, mm: Ø25.4 (+0/-0.6)
Coatings: AR(R<0.3%)@1064 nm, AOI=0°
Clear Aperture: >90
Adhesion and durability: Per MIL-C-675A
Required documents: Reflectivity curve of both faces

ROC S1, mm: +182.8
Focal length, mm: +400 (±3%)

Surface quality, S-D: 40-20
S1 Flatness, PV IR S2 Flatness, PV:   <λ/4 @ 632.8 nm
S2: AR(R<0.2%)@800nm
S1: AR(R<0.2%)@800nm
Centration error: <3 arcmin
Clear Aperture: >90
Edge thickness, mm: 2 (±0.1)
Dimensions, mm:   Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Coatings:
Protective chamfers: <0.25 mm x 45°
Material: UVFS

S1: AR(R<0.5%)@266nm
Surface quality, S-D: 60/40

S2: AR(R<0.5%)@266nm
ROC S1, mm: +21.7
Protective chamfers: <0.25 mm x 45°
Material: CaF2
Dimensions, mm:   Ø25.4 (+0/-0.1)
Wavelength, nm: 588
Center thickness, mm: 6.1 (±0.1)
Coatings:
Centration error: <3 arcmin
Clear Aperture: >90
Edge thickness, mm: 2.0 (±0.1)
S1 Flatness, PV IR S2 Flatness, PV:   <λ/2 @ 632.8 nm

Wavelength, nm: 588
Protective chamfers: <0.25 mm x 45°

Surface quality, S-D: 60-40
S1 Flatness, PV IR S2 Flatness, PV:   <λ/2 @ 632.8 nm
S2: AR(R<0.5%)@266nm
S1: AR(R<0.5%)@266nm
ROC S1, mm: +43.4
Center thickness, mm: 3.9 (±0.1)
Dimensions, mm:   Ø25.4 (+0/-0.1)
Centration error: <3 arcmin
Coatings:
Clear Aperture: >90
Edge thickness, mm: 2.0 (±0.1)
Material: CaF2

Protective chamfers: <0.25 mm x 45°
ROC S1, mm: +114.25 +/-0.5%

Surface quality, S-D: 40-20
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
S2: AR(R<0.2%)@ 515 nm, AOI=0 deg
Centration error: <3 arcmin
Edge thickness, mm: 2 (±0.1)
Material: UVFS
Dimensions, mm: Ø25.4 (+0/-0.1)
Coatings:
Clear Aperture: >90
S1: AR(R<0.2%)@ 515 nm, AOI=0 deg

Edge thickness, mm: 2 (±0.1)
Surface quality, S-D: 40-20

S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
S2: AR(R<0.2%)@ 515 nm, AOI=0 deg
S1: AR(R<0.2%)@ 515 nm, AOI=0 deg
ROC S1, mm: +91.4 +/-0.5%
Centration error: <3 arcmin
Material: UVFS
Dimensions, mm: Ø25.4 (+0/-0.1)
Coatings:
Clear Aperture: >90
Protective chamfers: <0.25 mm x 45°

S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 40-20

S2: AR(R<0.2%)@ 515 nm, AOI=0 deg
S1: AR(R<0.2%)@ 515 nm, AOI=0 deg
ROC S1, mm: +68.55 +/-0.5%
Protective chamfers: <0.25 mm x 45°
Edge thickness, mm: 2 (±0.1)
Dimensions, mm: Ø25.4 (+0/-0.1)
Coatings:
Clear Aperture: >90
Centration error: <3 arcmin
Material: UVFS

ROC S1, mm: +57.13 +/-0.5%
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm

Clear Aperture: >90
S2: AR(R<0.2%)@ 515 nm, AOI=0 deg
Surface quality, S-D: 40-20
S1: AR(R<0.2%)@ 515 nm, AOI=0 deg
Material: UVFS
Edge thickness, mm: 2 (±0.1)
Coatings:
Centration error: <3 arcmin
Dimensions, mm: Ø25.4 (+0/-0.1)
Protective chamfers: <0.25 mm x 45°

Material: UVFS
Surface quality, S-D: 40-20

S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
S2: AR(R<0.2%)@ 515 nm, AOI=0 deg
S1: AR(R<0.2%)@ 515 nm, AOI=0 deg
Protective chamfers: <0.25 mm x 45°
Edge thickness, mm: 2 (±0.1)
Dimensions, mm: Ø25.4 (+0/-0.1)
Coatings:
Clear Aperture: >90
Centration error: <3 arcmin
ROC S1, mm: +45.7 +/-0.5%

Material: UVFS (Corning 7980 0F)
Surface quality, S-D: 40-20

S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Centration error: <3 arcmin
ROC S1, mm: +228.51
Protective chamfers: <0.25 mm x 45°
Edge thickness, mm: 2 (±0.1)
Dimensions, mm: Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Clear Aperture: >90
Focal length, mm: +500 (±3%)
Coatings: AR/AR<1%@ 515-532+AR<0,5%@ 1020-1070, AOI=0

Edge thickness, mm: 2.0 (±0.1)
Surface quality, S-D: 40-20

S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
ROC S1, mm: +45.7
Protective chamfers: <0.25 mm x 45°
Focal length, mm: +100 (±3%)
Dimensions, mm: Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Coatings: AR/AR<0.25%@ 1550 nm, AOI=0°
Clear Aperture: >90
Centration error: <3 arcmin
Center thickness, mm: 3.8 (±0.1)
Material: UVFS

LIDT: 2.5J/cm2 for 300 ps pulse @ 800 nm
Focal length, mm: +667 (±1%)

Transmitted wavefront, PV: <λ/3 @ 632.8 nm
Surface quality, S-D: 40-20
Material: BK7
Diameter, mm: Ø25.4 (+0/-0.6)
Coatings: AR/AR(R<0.3%)@700-900 nm, AOI=0deg
Clear Aperture: >90
Adhesion and durability: Per MIL-C-675A
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Edge thickness, mm: >4

Focal length, mm: +75 (±3%)
Surface quality, S-D: 40-20

S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
ROC S1, mm: +34.28
Protective chamfers: <0.25 mm x 45°
Material: UVFS (Corning 7980 0F)
Dimensions, mm: Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Coatings: AR/AR<1%@ 515-532+AR<0,5%@ 1020-1070, AOI=0 deg
Clear Aperture: >90
Centration error: <3 arcmin
Edge thickness, mm: 2 (±0.1)

Material: UVFS
Dimensions, mm: Ø25.4 (+0/-0.1)

Surface quality, S-D: 40-20
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
ROC S1, mm: +45.7
Protective chamfers: <0.25 mm x 45°
Center thickness, mm: 3.8 (±0.1)
Edge thickness, mm: 2.0 (±0.1)
Wavelength, nm: 632.8
Coatings: AR/AR<1%@ 515-532+AR<0,5%@ 1020-1070, AOI=0
Clear Aperture: >90
Centration error: <3 arcmin
Focal length, mm: +100 (±3%)

Edge thickness, mm: 2 (±0.1)
Surface quality, S-D: 40-20

Surface irregularity (spherical surface), PV: <λ/4 @ 632.8 nm
Surface flatness (flat surface), PV: <λ/4 @ 632.8 nm
ROC S1, mm: +1828.05 ±1%
Protective chamfers: <0.25 mm x 45°
Focal length, mm: +4000
Dimensions, mm: Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Clear Aperture: >90
Centration error: <3 arcmin
Material: UVFS (Corning 7980 0F)

Protective chamfers: <0.25 mm x 45°
Centration error: <3 arcmin

Surface quality, S-D: 40-20
Surface irregularity (spherical surface), PV: <λ/4 @ 632.8 nm
Surface flatness (flat surface), PV: <λ/4 @ 632.8 nm
ROC S1, mm: +137.1 ±0.5%
Material: UVFS (Corning 7980 0F)
Focal length, mm: +300
Edge thickness, mm: 2 (±0.1)
Dimensions, mm: Ø25.4 (+0/-0.1)
Clear Aperture: >90
Wavelength, nm: 632.8

Edge thickness, mm: 2 (±0.1)
Surface quality, S-D: 40-20

S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
ROC S1, mm: +34.28
Protective chamfers: <0.25 mm x 45°
Focal length, mm: +75 (±3%)
Dimensions, mm: Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Coatings: AR/AR (R<0.25%) @ 1020-1070 nm AOI=0 deg
Clear Aperture: >90
Centration error: <3 arcmin
Material: UVFS (Corning 7980 0F)

Coatings: AR/AR<0.3% @ 515-532 nm, AOI=0 deg
Surface quality, S-D: 40-20

S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
ROC S1, mm: +34.28
Protective chamfers: <0.25 mm x 45°
Material: UVFS (Corning 7980 0F)
Edge thickness, mm: 2 (±0.1)
Wavelength, nm: 632.8
Dimensions, mm: Ø25.4 (+0/-0.1)
Clear Aperture: >90
Centration error: <3 arcmin
Focal length, mm: +75 (±3%)

Dimensions, mm: Ø25.4 (+0/-0.1)
Surface quality, S-D: 40-20

S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
ROC S1, mm: +228.51
Protective chamfers: <0.25 mm x 45°
Material: UVFS (Corning 7980 0F)
Edge thickness, mm: 2 (±0.1)
Wavelength, nm: 632.8
Coatings: AR/AR<0.2% @ 800 nm AOI=0 deg
Clear Aperture: >90
Centration error: <3 arcmin
Focal length, mm: +500 (±3%)

Dimensions, mm: Ø25.4 (+0/-0.1)
Surface quality, S-D: 40-20

S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
ROC S1, mm: +57.13
Protective chamfers: <0.25 mm x 45°
Material: UVFS (Corning 7980 0F)
Edge thickness, mm: 2 (±0.1)
Wavelength, nm: 632.8
Coatings: AR/AR (R<0.1%) @ 532 nm, AOI 0° IBS
Clear Aperture: >90
Centration error: <3 arcmin
Focal length, mm: +125 (±3%)

Focal length, mm: +150 (±3%)
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm

Surface quality, S-D: 40-20
ROC S1, mm: +68.55
Protective chamfers: <0.25 mm x 45°
Material: UVFS (Corning 7980 0F)
Edge thickness, mm: 2 (±0.1)
Dimensions, mm: Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Coatings: AR/AR (R<0.1%) @ 532 nm, AOI 0° IBS
Centration error: <3 arcmin
Clear Aperture: >90

Focal length, mm: +100 (±3%)
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm

Surface quality, S-D: 40-20
ROC S1, mm: +45.7
Protective chamfers: <0.25 mm x 45°
Material: UVFS (Corning 7980 0F)
Dimensions, mm: Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Coatings: AR/AR (R<0.1%) @ 532 nm, AOI 0° IBS
Centration error: <3 arcmin
Clear Aperture: >90
Edge thickness, mm: 2.0 (±0.1)

Edge thickness, mm: 2.0 (±0.1)
Centration error: <3 arcmin

S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Protective chamfers: <0.25 mm x 45°
Material: BK7
Focal length, mm: +400 (±2%)
Surface quality, S-D: 20-10
Dimensions, mm: Ø25.4 (+0/-0.1)
Coatings: AR/AR (R < 0.25%) @ 532 nm
Clear Aperture: >90
LIDT: > 5J/cm2 for 10 ns laser pulses at 10 Hz

Material: BK7
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm

Surface quality, S-D: 20-10
Protective chamfers: <0.25 mm x 45°
Focal length, mm: +1000 (±2%)
Edge thickness, mm: 2.0 (±0.1)
Centration error: <3 arcmin
Dimensions, mm: Ø25.4 (+0/-0.1)
Clear Aperture: >90
Coatings: AR/AR (R < 0.25%) @ 532 nm
LIDT: > 5J/cm2 for 10 ns laser pulses at 10 Hz

Edge thickness, mm: 2.0 (±0.1)
Surface quality, S-D: 60-40

S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Protective chamfers: <0.25 mm x 45°
Material: BK7
Focal length, mm: +2000 (±2%)
Dimensions, mm: Ø25.4 (+0/-0.1)
Coatings: AR/AR (R < 0.25%) @ 532 nm
Clear Aperture: >90
Centration error: <3 arcmin
LIDT: > 5J/cm2 for 10 ns laser pulses at 10 Hz

Focal length, mm: +200 ± 2%
ROC S1, mm: +90.6

Surface quality, S-D: 40-20
Surface irregularity (spherical surface), PV: <λ/4 @ 632.8 nm
Surface flatness (flat surface), PV: <λ/4 @ 632.8 nm
S2: AR(R<0.2%)@800nm
S1: AR(R<0.2%)@800nm
Material: UVFS
Dimensions, mm:   Ø25.4 (+0/-0.1)
Wavelength, nm: 800
Coatings:
Clear Aperture: >90
Centration error: <3 arcmin
Center thickness, mm: 2 mm
Protective chamfers: <0.25 mm x 45°

Material: UVFS
Substrate ID: 1-PCV-2-E254

S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
S2: AR(R<0.2%)@1030 nm, 0°
S1: AR(R<0.2%)@1030 nm, 0°
ROC S1, mm: -68.55
Protective chamfers: <0.25 mm x 45°
Surface quality, S-D: 40-20
Focal length, mm: -150 (±3%)
Centration error: <3 arcmin
Center thickness, mm: 2 (±0.1)
Clear Aperture: >90
Coatings: e-Beam
Wavelength, nm: 632.8
Dimensions, mm: Ø25.4 (+0/-0.1)

Clear Aperture: >90
Protective chamfers: <0.25 mm x 45°

Surface quality, S-D: 40-20
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Substrate ID: 1-PCV-2-B254
S2: AR(R<0.2%)@1030 nm, 0°
S1: AR(R<0.2%)@1030 nm, 0°
ROC S1, mm: -22.85
Material: UVFS
Focal length, mm: -50 (±3%)
Dimensions, mm: Ø25.4 (+0/-0.1)
Coatings: e-Beam
Centration error: <3 arcmin
Center thickness, mm: 2 (±0.1)
Wavelength, nm: 632.8

Material: UVFS
Protective chamfers: <0.25 mm x 45°

Surface quality, S-D: 40-20
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
S2: AR(R<0.5%)@650+AR(R<0.5%)@760 nm – 800 nm, 0°
ROC S1, mm: +114.25
Centration error: <3 arcmin
Edge thickness, mm: 2 (±0.1)
S1: AR(R<0.5%)@650+AR(R<0.5%)@760 nm – 800 nm, 0°
Dimensions, mm: Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Coatings: e-Beam
Focal length, mm: +250 (±3%)

Edge thickness, mm: 2,0 (±0.1)
Surface quality, S-D: 40-20

S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
ROC S1, mm: +68.55
Protective chamfers: <0.25 mm x 45°
Focal length, mm: +150 (±3%)
Dimensions, mm: Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Coatings: AR (R<0.25%) @ 1020-1070 nm, AOI=0 deg
Clear Aperture: >90
Centration error: <3 arcmin
Center thickness, mm: 3,19 (±0.1)
Material: UVFS (Corning 7980 0F)

Material: UVFS (Corning 7980 0F)
Surface quality, S-D: 40-20

Surface irregularity (spherical surface), PV: <λ/4 @ 632.8 nm
Surface flatness (flat surface), PV: <λ/4 @ 632.8 nm
S2: AR(R<0.2%)@800nm
S1: AR(R<0.2%)@800nm
Protective chamfers: <0.25 mm x 45°
Focal length, mm: +1500
Edge thickness, mm: 2.0 (±0.1)
Dimensions, mm:   Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Coatings:
Clear Aperture: >90
Centration error: <3 arcmin
ROC S1, mm: +685.52 ±1%

ROC S1, mm: +119.0 ± 2%
Surface quality, S-D: 40-20

Surface irregularity (spherical surface), PV: <λ/4 @ 632.8 nm
Surface flatness (flat surface), PV: <λ/4 @ 632.8 nm
Material: UVFS
S1: AR(R<0.2%)@800nm
Protective chamfers: <0.25 mm x 45°
Edge thickness, mm: 3.3
Center thickness, mm: 4 (±0.2)
Dimensions, mm:   Ø25.4 (+0/-0.12)
Wavelength, nm: 355
Coatings:
Clear Aperture: >90
Centration error: <3 arcmin
Focal length, mm: +250
S2: AR(R<0.2%)@800nm

Material: UVFS (Corning 7980 0F)
Surface quality, S-D: 40-20

Surface irregularity (spherical surface), PV: <λ/4 @ 632.8 nm
Surface flatness (flat surface), PV: <λ/4 @ 632.8 nm
S2: AR(R<0.2%)@800nm
S1: AR(R<0.2%)@800nm
Protective chamfers: <0.25 mm x 45°
Focal length, mm: +2000
Edge thickness, mm: 2 (±0.1)
Dimensions, mm:   Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Coatings:
Clear Aperture: >90
Centration error: <3 arcmin
ROC S1, mm: +914.02 ±1%

ROC S1, mm: +34.28 ±0.2%
Focal length, mm: +75

Surface quality, S-D: 40-20
Surface irregularity (spherical surface), PV: <λ/4 @ 632.8 nm
Surface flatness (flat surface), PV: <λ/4 @ 632.8 nm
S2: AR(R<0.2%)@800nm
S1: AR(R<0.2%)@800nm
Material: UVFS (Corning 7980 0F)
Centration error: <3 arcmin
Edge thickness, mm: 2 (±0.1)
Dimensions, mm:   Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Coatings:
Clear Aperture: >90
Protective chamfers: <0.25 mm x 45°

Edge thickness, mm: 2 (±0.1)
ROC S1, mm: +457.01 ±0.8%

Surface quality, S-D: 40-20
Surface irregularity (spherical surface), PV: <λ/4 @ 632.8 nm
Surface flatness (flat surface), PV: <λ/4 @ 632.8 nm
S2: AR(R<0.2%)@800nm
S1: AR(R<0.2%)@800nm
Protective chamfers: <0.25 mm x 45°
Focal length, mm: +1000
Dimensions, mm:   Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Coatings:
Clear Aperture: >90
Centration error: <3 arcmin
Material: UVFS (Corning 7980 0F)

Protective chamfers: <0.25 mm x 45°
ROC S1, mm: +342.76 ±0.8%

Surface quality, S-D: 40-20
Surface irregularity (spherical surface), PV: <λ/4 @ 632.8 nm
Surface flatness (flat surface), PV: <λ/4 @ 632.8 nm
S2: AR(R<0.2%)@800nm
Coatings:
Material: UVFS (Corning 7980 0F)
Wavelength, nm: 632.8
Dimensions, mm:   Ø25.4 (+0/-0.1)
Edge thickness, mm: 2 (±0.1)
Clear Aperture: >90
Focal length, mm: +750
Centration error: <3 arcmin
S1: AR(R<0.2%)@800nm

Protective chamfers: <0.25 mm x 45°
Material: UVFS (Corning 7980 0F)

Surface quality, S-D: 40-20
Surface irregularity (spherical surface), PV: <λ/4 @ 632.8 nm
Surface flatness (flat surface), PV: <λ/4 @ 632.8 nm
S2: AR(R<0.2%)@800nm
S1: AR(R<0.2%)@800nm
Clear Aperture: >90
Centration error: <3 arcmin
Focal length, mm: +300
Edge thickness, mm: 2 (±0.1)
Dimensions, mm:   Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Coatings:
ROC S1, mm: +137.1 ±0.5%

Focal length, mm: +150 (±3%)
Surface quality, S-D: 40-20

S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
S2: AR(R<0.25%) @ 1064 nm, IBS
S1: AR(R<0.25%) @ 1064 nm, IBS
ROC S1, mm: +68.55
Material: UVFS
Edge thickness, mm: 2 (±0.1)
Dimensions, mm: Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Coatings:
Clear Aperture: >90
Centration error: <3 arcmin
Angle of Incidence, °: 0
Protective chamfers: <0.25 mm x 45°

Centration error: <1 arcmin
Material: UVFS (Corning 7980 0F)

Surface irregularity (spherical surface), PV: <λ/4 @ 632.8 nm
Surface flatness (flat surface), PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 40-20
ROC S1, mm: +22.85
ROC tolerance: <3 fringes
Protective chamfers: 0.1-0.25 mm x 45°
Focal length, mm: +50
Edge thickness, mm: 2 (±0.1)
Dimensions, mm: Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Clear Aperture: >90
Center thickness, mm: 5.85 (±0.1)
Coating: uncoated

Material: N-BK7
Dimensions, mm: Ø25.4 (+0/-0.6)

TWD, PV: <λ/2 @ 632.8 nm
Surface quality, S-D: 40-20
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Protective chamfers: <0.25 mm x 45°
Focal length, mm: +286 (±1%)
Adhesion and durability: Per MIL-C-675A
Coatings: AR/AR(R<0.3%) @ 527-532 nm
Clear aperture: >90%
Center thickness, mm: 4
Centration error: <3 arcmin
LIDT: 5J/cm2 for 10 ns pulse @ 532 nm

Material: UVFS
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm

ROC S1, mm: -22.85
S1: AR(R<0.5%)@650+AR(R<0.5%)@760 nm – 800 nm, 0°
Surface quality, S-D: 40-20
Protective chamfers: <0.25 mm x 45°
Dimensions, mm: Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Coatings: e-Beam
Clear Aperture: >90
Centration error: <3 arcmin
Center thickness, mm: 2 (±0.1)
Focal length, mm: -50 (±3%)
S2: AR(R<0.5%)@650+AR(R<0.5%)@760 nm – 800 nm, 0°

Edge thickness, mm: 2.0 (±0.1)
Surface quality, S-D: 40-20

S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
S2: AR(R<0.5%)@650+AR(R<0.5%)@760 nm – 800 nm, 0°
S1: AR(R<0.5%)@650+AR(R<0.5%)@760 nm – 800 nm, 0°
ROC S1, mm: +91.40
Protective chamfers: <0.25 mm x 45°
Centration error: <3 arcmin
Focal length, mm: +200 (±3%)
Dimensions, mm: Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Coatings: e-Beam
Clear Aperture: >90
Material: UVFS

S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 40-20

S2: AR(R<0.5%)@650+AR(R<0.5%)@760 nm – 800 nm, 0°
S1: AR(R<0.5%)@650+AR(R<0.5%)@760 nm – 800 nm, 0°
ROC S1, mm: +68.55
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Edge thickness, mm: 2 (±0.1)
Dimensions, mm: Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Coatings: e-Beam
Clear Aperture: >90
Centration error: <3 arcmin
Focal length, mm: +150 (±3%)

Center thickness, mm: 2 (±0.1)
Protective chamfers: <0.25 mm x 45°

Surface quality, S-D: 40-20
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
S2: AR(R<0.5%)@650+AR(R<0.5%)@760 nm – 800 nm, 0°
S1: AR(R<0.5%)@650+AR(R<0.5%)@760 nm – 800 nm, 0°
ROC S1, mm: -91.4
Material: UVFS
Focal length, mm: -200 (±3%)
Dimensions, mm: Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Coatings: e-Beam
Centration error: <3 arcmin
Clear Aperture: >90

S2: AR (R<0.2%) @ 343 nm, AOI 0 deg
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm

S1: AR (R<0.2%) @ 343 nm, AOI 0 deg
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Edge thickness, mm: 4 (±0.1)
Dimensions, mm: Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Clear Aperture: >90
Centration error: <3 arcmin
Center thickness, mm: 3.1 (±0.1)
Focal length, mm: -200 (±3%)
Surface quality, S-D: 40-20

Focal length, mm: +150
Surface quality, S-D: 40-20

Surface irregularity (spherical surface), PV: <λ/4 @ 632.8 nm
Surface flatness (flat surface), PV: <λ/4 @ 632.8 nm
S2: AR(R<0.2%)@800nm
S1: AR(R<0.2%)@800nm
ROC S1, mm: +68.55 ±0.2%
Material: UVFS (Corning 7980 0F)
Edge thickness, mm: 2,0 (±0.1)
Dimensions, mm:   Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Coatings:
Clear Aperture: >90
Centration error: <3 arcmin
Center thickness, mm: 3,19 (±0.1)
Protective chamfers: <0.25 mm x 45°

Protective chamfers: 0.1-0.2 mm x 45°
Surface quality, S-D: 40-20

Surface irregularity (spherical surface), PV: <λ/4 @ 632.8 nm
Surface flatness (flat surface), PV: <λ/4 @ 632.8 nm
S2: AR(R<0.2%)@800nm
S1: AR(R<0.2%)@800nm
Material: UVFS (Corning 7980 0F)
Centration error: <3 arcmin
Center thickness, mm: 3.8 (±0.1)
Clear Aperture: >90
Coatings:
Wavelength, nm: 632.8
Dimensions, mm:   Ø25.4 (+0/-0.1)
Edge thickness, mm: 2.0 (±0.1)
Focal length, mm: +100
ROC S1, mm: +45.7 ±0.2%

Protective chamfers: <0.25 mm x 45°
Material: UVFS (C 7980 0F)

Surface quality, S-D: 40-20
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
S2: AR (R<0.3%) @ 343-355 nm, AOI=0°
S1: AR (R<0.3%) @ 343-355 nm, AOI=0°
ROC S1, mm: +91.4
Focal length, mm: +200
Center Thickness, mm: 3.76 (±0.1)
Edge thickness, mm: (2)
Dimensions, mm: Ø25.4 (+0/-0.1)
Coatings:
Clear aperture: >90%
Centration error: <3 arcmin
ROC tolerance: 3 fringes

ROC tolerance: 3 fringes
ROC S1, mm: +228.51

S1: AR(R<0.2%)@800nm
S2: AR(R<0.2%)@800nm
Surface flatness (flat surface), PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 40-20 (both faces)
Focal length, mm: +500
Surface irregularity (spherical surface), PV: <λ/4 @ 632.8 nm
Material: UVFS (Corning 7980 0F)
Edge thickness, mm: (2.0)
Dimensions, mm:   Ø25.4 (+0/-0.02)
Wavelength, nm: 632.8
Coatings:
Clear Aperture: >90
Centration error: <3 arcmin
Center thickness, mm: 2.3 (±0.1)
Protective chamfers: 0.1-0.25 mm x 45°

Material: UVFS
S2: AR(R<0.5%)@ 793 nm, AOI=0°

S2 Surface flatness, PV: <λ/4 per CA @ 633 nm
S1: AR(R<0.5%)@ 793 nm, AOI=0°
S1 Surface figure, PV: <λ/4 per CA @ 633 nm
ROC S1, mm: +23.8
Protective chamfers: <0.25 mm x 45°
Center thickness, mm: (6)
Focal length, mm: +50 (±2%)
Centration error: <3 arcmin
Clear Aperture: >90
Coatings:
Wavelength, nm: 632.8
Dimensions, mm: Ø25.4 (+0/-0.12)
Edge thickness, mm: 2.3 (±0.2)
Surface quality, S-D: 40-20

Coatings:
ROC tolerance: 3 fringes

Surface quality, S-D: 40-20 (both faces)
Surface irregularity (spherical surface), PV: <λ/4 @ 632.8 nm
Surface flatness (flat surface), PV: <λ/4 @ 632.8 nm
S2: AR(R<0.2%)@980 nm
S1: AR(R<0.2%)@980 nm
ROC S1, mm: +228.51
Protective chamfers: 0.1-0.25 mm x 45°
Material: UVFS (Corning 7980 0F)
Focal length, mm: +500
Dimensions, mm:   Ø25.4 (+0/-0.02)
Clear Aperture: >90
Centration error: <3 arcmin
Center thickness, mm: 2.3 (±0.1)
Edge thickness, mm: (2.0)

S1: AR(R<0.2%)@1030 nm, 0°
S2: AR(R<0.2%)@1030 nm, 0°

Substrate ID: 1-PCX-2-G254
Surface flatness (flat surface), PV: <λ/4 @ 632.8 nm
Surface irregularity (spherical surface), PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 40-20
Protective chamfers: 0.1-0.2 mm x 45°
Dimensions, mm: Ø25.4 (+0/-0.1)
Centration error: <3 arcmin
Center thickness, mm: 3.8 (±0.1)
Edge thickness, mm: 2.0 (±0.1)
Focal length, mm: +150 (±3%)
Wavelength, nm: 632.8
Coatings: e-Beam
Clear Aperture: >90
Material: UVFS (Corning 7980 0F)

Material: UVFS (Corning 7980 0F)
S2: AR<0.2% @ 1030 nm, AOI = 0°

S2 Surface irregularity (PL face): <λ/4 @ 632.8nm
S1: AR<0.2% @ 1030 nm, AOI = 0°
S1/S2 Surface quality, S-D: 20-10
S1 Surface irregularity (CV face): <λ/4 @ 632.8nm
Protective chamfers: 0.1-03 mm x 45°
Focal length, mm: F=-100
Dimensions, mm: Ø25.4 (+0.0/-0.1)
Coatings:
Centration error: <2 arcmin
Center thickness, mm: 2 (±0.1)
S1 Radius of curvature, mm: ROC=-42.781 (±6.5%)

Focal length, mm: +75
ROC S1, mm: +34.28 ±0.2%

Surface quality, S-D: 40-20
Surface irregularity (spherical surface), PV: <λ/4 @ 632.8 nm
Surface flatness (flat surface), PV: <λ/4 @ 632.8 nm
S2: AR (R<0.5%) @ 793 nm, AOI 0°
S1: AR (R<0.5%) @ 793 nm, AOI 0°
Material: UVFS (Corning 7980 0F)
Edge thickness, mm: 2 (±0.1)
Dimensions, mm: Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Coatings:
Clear Aperture: >90
Centration error: <3 arcmin
Protective chamfers: <0.25 mm x 45°

Dimensions, mm: Ø25.4 (+0/-0.1)
Surface irregularity (spherical surface), PV: <λ/4 @ 632.8 nm

Surface flatness (flat surface), PV: <λ/4 @ 632.8 nm
S2: AR (R<0.25%) @ 1064 nm
S1: AR (R<0.25%) @ 1064 nm
ROC S1, mm: -34.28
Protective chamfers: <0.25 mm x 45°
Surface quality, S-D: 40-20
Focal length, mm: -75 (±3%)
Material: UVFS
Angle of Incidence (AOI), °: 0
Center thickness, mm: 3.1 (±0.1)
Centration error: <3 arcmin
Clear Aperture: >90
Coating technology: E-beam
Coatings:
Wavelength, nm: 632.8

Dimensions, mm: Ø25.4 (+0/-0.02)
Material: UVFS (Corning 7980 0F)

Protective chamfers: 0.1-0.25 mm x 45°
ROC tolerance: 3 fringes
ROC S1, mm: +228.51
Surface flatness (flat surface), PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 40-20 (both faces)
Surface irregularity (spherical surface), PV: <λ/4 @ 632.8 nm
Focal length, mm: +500
Wavelength, nm: 632.8
Coatings: S1/S2: AR(R<0.5%) @ 400-700 nm, AOI=0°
Clear Aperture: >90
Centration error: <3 arcmin
Center thickness, mm: 2.3 (±0.1)
Edge thickness, mm: (2.0)

Centration error: <1 arcmin
Surface irregularity (spherical surface), PV: <λ/4 @ 632.8 nm

Material: UVFS (Corning 7980 0F)
Surface flatness (flat surface), PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 40-20 (both faces)
ROC S1, mm: +68.55
ROC tolerance: 3 fringes
Protective chamfers: 0.1-0.25 mm x 45°
Edge thickness, mm: (2.0)
Dimensions, mm: Ø25.4 (+0/-0.02)
Wavelength, nm: 632.8
Clear Aperture: >90
Center thickness, mm: 3.19 (±0.1)
Focal length, mm: +150
Coatings: AR/AR<0.3% @ 515-532 nm, AOI=0 deg

Material: UVFS (Corning 7980 0F)
Surface quality, S-D: 40-20

Surface irregularity S2, PV: <λ/4 @ 632.8 nm
Surface irregularity S1, PV: <λ/4 @ 632.8 nm
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Protective chamfers: <0.25 mm x 45°
Clear Aperture: >90
Edge thickness, mm: 2 (±0.1)
Dimensions, mm: Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Coatings: AR/AR<0.3% @ 515-532 nm, AOI=0 deg
Focal length, mm: +125
ROC S1, mm: +57.13 (±0.5%)
Centration error: <3 arcmin

Protective chamfers: 0.1-0.2 mm x 45°
ROC S1, mm: +91.4

S2: AR(R<0.2%)@515 nm, 0°
Surface flatness (flat surface), PV: <λ/4 @ 632.8 nm
Material: UVFS (Corning 7980 0F)
Surface quality, S-D: 40-20
S1: AR(R<0.2%)@515 nm, 0°
Surface irregularity (spherical surface), PV: <λ/4 @ 632.8 nm
Edge thickness, mm: 2.0 (±0.1)
Dimensions, mm: Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Coatings: e-Beam
Clear Aperture: >90
Centration error: <3 arcmin
Center thickness, mm: 3.8 (±0.1)
Focal length, mm: +200 (±3%)
Substrate ID: 1-PCX-2-G254

Protective chamfers: 0.1-0.2 mm x 45°
Surface quality, S-D: 40-20

Surface flatness (flat surface), PV: <λ/4 @ 632.8 nm
Substrate ID: 1-PCX-2-E254
S2: AR(R<0.2%)@515 nm, 0°
S1: AR(R<0.2%)@515 nm, 0°
ROC S1, mm: +45.7
Surface irregularity (spherical surface), PV: <λ/4 @ 632.8 nm
Center thickness, mm: 3.8 (±0.1)
Focal length, mm: +100 (±3%)
Edge thickness, mm: 2.0 (±0.1)
Dimensions, mm: Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Coatings: e-Beam
Clear Aperture: >90
Material: UVFS (Corning 7980 0F)
Centration error: <3 arcmin

Focal length, mm: +100 (±3%)
Material: UVFS (Corning 7980 0F)

Surface flatness (flat surface), PV: <λ/4 @ 632.8 nm
Substrate ID: 1-PCX-2-E254
S2: AR(R<0.2%)@1030 nm, 0°
S1: AR(R<0.2%)@1030 nm, 0°
ROC S1, mm: +45.7
Surface irregularity (spherical surface), PV: <λ/4 @ 632.8 nm
Centration error: <3 arcmin
Protective chamfers: 0.1-0.2 mm x 45°
Center thickness, mm: 3.8 (±0.1)
Surface quality, S-D: 40-20
Clear Aperture: >90
Coatings: e-Beam
Wavelength, nm: 632.8
Dimensions, mm: Ø25.4 (+0/-0.1)
Edge thickness, mm: 2.0 (±0.1)

Material: UVFS (Corning 7980 0F)
Surface flatness (flat surface), PV: <λ/4 @ 632.8 nm

Surface irregularity (spherical surface), PV: <λ/4 @ 632.8 nm
S2: AR (R<0.5%) @ 793 nm, AOI 0°
S1: AR (R<0.5%) @ 793 nm, AOI 0°
ROC S1, mm: +45.7 ±0.2%
Protective chamfers: 0.1-0.2 mm x 45°
Edge thickness, mm: 2.0 (±0.1)
Dimensions, mm: Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Coatings:
Center thickness, mm: 3.8 (±0.1)
Clear Aperture: >90
Centration error: <3 arcmin
Surface quality, S-D: 40-20
Focal length, mm: +100

Angle of Incidence (AOI), °: 0
Surface irregularity (spherical surface), PV: <λ/4 @ 632.8 nm

Material: UVFS
Surface flatness (flat surface), PV: <λ/4 @ 632.8 nm
S2: AR (R<0.25%) @ 1064 nm
S1: AR (R<0.25%) @ 1064 nm
ROC S1, mm: +68.55
Protective chamfers: <0.25 mm x 45°
Surface quality, S-D: 40-20
Center thickness, mm: 3.19 (±0.1)
Edge thickness, mm: 2 (±0.1)
Dimensions, mm: Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Coatings:
Coating technology: E-beam
Clear Aperture: >90
Centration error: <3 arcmin
Focal length, mm: +150 (±3%)

Surface irregularity (spherical surface), PV: <λ/4 @ 632.8 nm
Focal length, mm: +125 (±3%)

Surface flatness (flat surface), PV: <λ/4 @ 632.8 nm
S2: AR (R<0.25%) @ 1064 nm
S1: AR (R<0.25%) @ 1064 nm
ROC S1, mm: +57.13
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Surface quality, S-D: 40-20
Center thickness, mm: 3.43 (±0.1)
Edge thickness, mm: 2 (±0.1)
Angle of Incidence (AOI), °: 0
Centration error: <3 arcmin
Clear Aperture: >90
Coating technology: E-beam
Coatings:
Wavelength, nm: 632.8
Dimensions, mm: Ø25.4 (+0/-0.1)

Edge thickness, mm: 2 (±0.1)
Focal length, mm: +100 (±3%)

Surface irregularity (spherical surface), PV: <λ/4 @ 632.8 nm
Surface flatness (flat surface), PV: <λ/4 @ 632.8 nm
S2: AR (R<0.25%) @ 1064 nm
S1: AR (R<0.25%) @ 1064 nm
ROC S1, mm: +45.7
Protective chamfers: <0.25 mm x 45°
Surface quality, S-D: 40-20
Center thickness, mm: 3.8 (±0.1)
Material: UVFS
Angle of Incidence (AOI), °: 0
Centration error: <3 arcmin
Clear Aperture: >90
Coating technology: E-beam
Coatings:
Wavelength, nm: 632.8
Dimensions, mm: Ø25.4 (+0/-0.1)

S1/S2 Surface quality, S-D: 10-5
S1: AR(R<0.25%) @ 1064 nm + AR(R<0.5%) @ 532 nm, AOI = 0°

S1 Surface irregularity, PV: <λ/8 @ 632.8 nm
S1 Surface flatness, PV: <λ/8 @ 632.8 nm
Protective chamfers: <0.2 (±0.05) mm x 45° (±5°)
Material: BK7
Focal length, mm: -880 (±5) @ 1064 nm
Edge thickness, mm: 6.35 (±0.2)
Diameter, mm: Ø25.4 (+0/-0.2)
Centration error: <3 arcmin
Coatings:
Clear Aperture: >90
LIDT:
S2: AR(R<0.25%) @ 1064 nm + AR(R<0.5%) @ 532 nm, AOI = 0°

Dimensions, mm: Ø25.4+0/-0.6
Surface quality, S-D: 40-20

S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Required documents: -
Material: BK7
Edge thickness, mm: >4
Coatings: AR(R<0.3%)@700-900 nm
Clear Aperture: >90
Focal length, mm: -100±3%

Material: BK7
Clear Aperture: >90

Surface quality, S-D: 40-20
S1 Flatness, PV IR S2 Flatness, PV: <λ/2 @ 632.8 nm
Required documents: -
Edge thickness, mm: >4
Focal length, mm: +500±3%
Coatings: AR(R<0.3%)@700-900 nm
Dimensions, mm: Ø25.4+0/-0.6

Wavelength, nm: 632.8
Focal length tolerance, %: ±3

Thickness tolerance, mm: ±0.1
Surface quality, S-D: 40-20
Protective chamfers: <0.25 mm x 45°
Material: BK7
Focal length, mm: -250
Centration error: <3 arcmin
Dimensions tolerance, mm: +0/-0.1
Dimensions, mm: Ø25.4
Coatings: AR/AR(R<0.25%)@1064nm, AOI=0°
Clear aperture: >90
Edge thickness, mm: >4

Dimensions, mm: Ø25.4+0/-0.6
Configuration: Spherical plano-concave

Transmitted wavefront: λ/2 @ 632.8 nm PV
Surface quality, S-D: 40-20
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Required documents: Reflectivity curve of both faces
Focal length, mm: -200±1%
Coatings: AR(R<0.3%)@1064nm. AOI=0deg.
Clear Aperture: >90
Adhesion and durability: Per MIL-C-675A
Material: BK7

Focal length, mm: -150 (±3%)
Surface quality, S-D: 40-20

S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
S2: AR(R<0.2%)@800nm
S1: AR(R<0.2%)@800nm
ROC S1, mm: -68.55
Center thickness, mm: 2 (±0.1)
Material: UVFS
Dimensions, mm:   Ø25.4  (+0/-0.1)
Wavelength, nm: 632.8
Coatings:
Clear Aperture: >90
Centration error: <3 arcmin
Protective chamfers: <0.25 mm x 45°

Edge thickness, mm: >4
Configuration: Spherical plano convex

Transmitted wavefront: better than λ/2 PV
Surface quality, S-D: 40-20
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Required documents: Reflectivity curve
Focal length, mm: +333±1%
Dimensions, mm: Ø25.4+0/-0.6
Dimensions tolerance, mm: +0/-0.6
Coatings: AR(R<0.3%)@700-900 nm
Clear Aperture: >90
Adhesion and durability: Per MIL-C-675A
Material: BK7

Surface quality, S-D: 40-20
Thickness tolerance, mm: +2/-0

S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Protective chamfers: <0.25 mm x 45°
Material: BK7
Focal length, mm: +200
Focal length tolerance, %: ±3
Dimensions, mm: Ø25.4
Dimensions tolerance, mm: +0/-0.6
Wavelength, nm: 632.8
Coatings: AR(R<0,3%)@527-532nm, AOI=0deg
Clear aperture: >90
Centration error: <3 arcmin
Edge thickness, mm: 1.8

Focal length tolerance, %: ±1
Centration error: < 3 arcmin

Required documents: Reflectivity curve
Surface quality, S-D: 40-20
Protective chamfers: 0.25x45 deg
Material: BK7
Focal length, mm: +444
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Transmitted wavefront: better than λ/2 PV, l/10 RMS at 633 nm
Dimensions, mm: Ø25.4
Dimensions tolerance, mm: +0.0/-0.6
Wavelength, nm: 633
Damage threshold: 5J/cm2 for 10 ns pulse @ 532 nm
Clear Aperture: >90
Adhesion and durability: Per MIL-C-675A
Edge thickness, mm: > 4 mm
Coatings: AR/AR(R<0.3%)@527-532 nm

Dimensions, mm: Ø25.4 (+0/-0.1)
Wavelength, nm: 1020-1070

Thickness, mm: 5 (±0.1)
Surface quality, S-D: 20-10
Material: UVFS
Coatings: both sides
Clear Aperture: >90
Angle of Incidence (AOI), °: 0°
Reflectivity, %: <0.7

Angle of Incidence (AOI), °: 0
Clear Aperture: 90

Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflectivity, %: <0.5
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Wavelength, nm: 600-1100
Wedge / Parallelism error: <1 arcmin

Angle of Incidence (AOI), °: >99.5
Clear Aperture: >90

Dimensions, mm: Ø25.4 (+0/-0.1)
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflectivity, %: <0.5
Surface quality, S-D: 20-10
Thickness, mm: 5 (±0.1)
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Wavelength, nm: 425-675
Wedge / Parallelism error: <1 arcmin

Clear aperture: >90 %
Diameter tolerance, mm: +0/-0.5 mm

Dimensions, mm: Ø25.4 x 3
Material: UVFS
S1: uncoated
S2: AR(Rs<0,5%)@750-850nm
STANDARD SPECIFICATIONS (substrate):
Surface quality: 20-10 S-D
Thickness tolerance, mm: ±1 mm

Angle of Incidence (AOI), °: 45 deg
Clear Aperture: >90% of diameter

Coatings:
LIDT: >5-6 J/cm2 for 10 ns pulses @1064nm
Side1: PR(Rs=50+/-2%)@750-850 nm
Side2: AR@750-850 nm
STANDARD SPECIFICATIONS (substrate):
Substrate dimension tolerance: +0/-0,1 mm
Material: UVFS
Substrate size: Ø25.4 x 5 mm
Substrate surface quality: 20-10 SD
Substrate wavefront distortion: < λ/8

S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Coatings:

Surface quality, S-D: 20-10
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
S1: PR(Rp = 25% ± 3%) @ 400 nm, AOI = 0-15°
Parallelism error: <1 arcmin
Clear Aperture: >90
Material: UVFS
S2: ARp<0.25% @ 400 nm, AOI = 0-15°

Clear aperture: 84%
Coating adhesion and durability: Per MIL-C-675A

Diameter tolerance, mm: +0/-0.5 mm
Material: UVFS
Protective chamfers: <0.25 mm x 45°
S1: PR(Rs=50+/-2%)@532 nm
S2: AR(Rs<0.25%)@532 nm
STANDARD SPECIFICATIONS (substrate):
Size, mm: Ø25.4 x 3
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Surface quality: 20-10 S-D
Thickness tolerance, mm: ±1 mm

Clear aperture: >90 %
Coating adhesion and durability: Per MIL-C-675A

Diameter tolerance, mm: +0/-0.5 mm
Material: UVFS
Protective chamfers: <0.25 mm x 45°
S1: PR(Rs=50+/-2%)@532nm
S2: AR(Rs<0.25%)@532nm
STANDARD SPECIFICATIONS (substrate):
Size, mm: Ø25.4 x 3
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Surface quality: 20-10 S-D
Thickness tolerance, mm: ±1 mm

STANDARD SPECIFICATIONS (substrate):
Substrate wavefront distortion: < λ/8

Substrate surface quality: 20-10 SD
Substrate size: Ø25.4 x 5 mm
Material: UVFS
Substrate dimension tolerance: +0/-0,1 mm
Side1: PR(Rs=50+/-2%)@750-850 nm
LIDT: >5-6 J/cm2 for 10 ns pulses @1064nm
Coatings:
Side2(kartu su 5 pos): AR@750-850 nm
Angle of Incidence (AOI), °: 45 deg
Clear Aperture: >90% of diameter

Coating:
Dimensions, mm: Ø25.4 (+0/-0.1)

Material: UVFS (Viosil SQ)
Parallelism error: <1 arcmin
Protective chamfers: <0.3 mm x 45°
Reflection tolerance: +/-(0.5-1%) (Possible variations between elements from the same Item track +/-0.3 %)
S1 (arrow marks): PR(R=70%+/-0.3 %)@976nm, AOI=45°
S2: AR(R<0.65%)@976nm, AOI=45°
S1 Flatness, PV IR S2 Flatness, PV: λ/8@633 nm
Surface quality S1/S2, S-D: 20-10
Thickness, mm: 2 (+/-0.1)

Coatings:
Dimensions, mm: Ø25.4 (+0/-0.1)

Material: UVFS (Viosil SQ)
Parallelism error: <30 arcsec
Protective chamfers: <0.3 mm x 45°
Reflection tolerance: +/-(0.5-1%) (Possible variations between elements from the same Item track +/-0.3%)
S1(mark with an arrow): PR(R=80+0.5%/-1%)@976nm, AOI=45°
S2: AR(R<0.65%)@976nm, AOI=45°
S1 Flatness, PV IR S2 Flatness, PV: λ/8 @6 33 nm
Surface quality, S-D: 20-10
Thickness, mm: 2 (+/-0.1)

Angle of Incidence (AOI), °: 45
Dimensions, mm: Ø25.4 (+0/-0.5)

Thickness, mm: 3 (±0.2)
Surface quality, S-D: 20-10
Wedge / Parallelism error: <3arcmin
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8nm
Material: BK7
Damage threshold: > 2.5J/cm2 @ 300 ps 10Hz 800 nm
Coatings on S2: AR(Rs<0.3%)@750-850 nm
Coatings on S1: PR(Rs=50±2%)@750-850 nm
Circumference finish: fine grounding
Adhesion and durability: Per MIL-C-675A
Clear Aperture: >90

Edge thickness, mm: 3.5 (±0.1)
Surface quality, S-D: 40-20

Material: UVFS
Dimensions, mm: Ø25.4 (+0/-0.15)
Clear Aperture: >90
AR coatings: AR/AR (Ravg<0.8%) @ 600-1100 nm
Apex angle, °: 160 (±0.5)
Protective chamfers: <0.25 mm x 45°

Dimensions, mm: Ø25.4 (+0/-0.15)
Surface quality, S-D: 40-20

Protective chamfers: <0.25 mm x 45°
Edge thickness, mm: 3.5 (±0.1)
Clear Aperture: >90
AR coatings: AR/AR (Ravg≤0.4%) @ 425 - 675 nm
Apex angle, °: 140 (±0.5)
Material: UVFS

AR coatings: AR/AR (Ravg≤0.4%) @ 425 - 675 nm
Protective chamfers: <0.25 mm x 45°

Surface quality, S-D: 40-20
Material: UVFS
Clear Aperture: >90
Apex angle, °: 90 (±0.5)
Dimensions, mm: Ø25.4 (+0/-0.15)
Edge thickness, mm: 3.5 (±0.1)

Clear Aperture: >90
Protective chamfers: <0.25 mm x 45°

Material: UVFS
Dimensions, mm: Ø25.4 (+0/-0.15)
AR coatings: AR/AR (R<0.75%) @250-425 nm + (R<0.5%) @ 370-420 nm
Apex angle, °: 130 (±0.5)
Surface quality, S-D: 40-20
Edge thickness, mm: 3.5 (±0.1)

Protective chamfers: <0.25 mm x 45°
Edge thickness, mm: 3.5 (±0.1)

Surface quality, S-D: 40-20
Material: UVFS
Clear Aperture: >90
Apex angle, °: 90 (±0.5)
AR coatings: AR/AR (R<0.75%) @250-425 nm + (R<0.5%) @ 370-420 nm
Dimensions, mm: Ø25.4 (+0/-0.15)

Focal length, mm: +200 (±3%) @800nm
Surface quality, S-D: 40-20

Material: BK7
Edge thickness, mm: >4
Dimensions, mm: Ø25.4 (+0/-0.6)
Clear Aperture: >90
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm

Edge thickness, mm: 1.8 (+2/-0)
Material: BK7

Surface quality, S-D: 40-20
Required documents: -
Focal length, mm: +800 (±3%)
Coatings: AR/AR(R<0.3%)@527-532nm
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Clear Aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.6)

Focal length, mm: +800 (±3)%
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm

Material: BK7
LIDT: >7 J/cm² @ 1064nm; 10ns; 10 Hz
Edge thickness, mm: 1.8 (+2/-0)
Dimensions, mm: Ø25.4 (+0/-0.6)
Coatings: AR/AR(R<0.3%)@527-532. AOI=0deg
Centration error: <3 arcmin
Surface quality, S-D: 40-20
Clear Aperture: >90

Wavelength, nm: 632.8
Protective chamfers: <0.25 mm x 45°

Surface quality, S-D: 40-20
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
ROC S1, mm: +22.85
Material: UVFS
Focal length, mm: +50 (±3%)
Dimensions, mm: Ø25.4 (+0/-0.1)
Clear Aperture: >90
Centration error: <3 arcmin
Edge thickness, mm: 2 (±0.1)

Material: UVFS
Wavelength, nm: 632.8

ROC S1, mm: +16
Protective chamfers: <0.25 mm x 45°
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 40-20
Dimensions, mm: Ø25.4 (+0/-0.1)
Clear Aperture: >90
Centration error: <3 arcmin
Edge thickness, mm: 2 (±0.1)
Focal length, mm: +35 (±3%)

Focal length, mm: +400 (±3%)
ROC S1, mm: +182.8

Protective chamfers: <0.25 mm x 45°
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Material: UVFS
Edge thickness, mm: 2 (±0.1)
Dimensions, mm: Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Centration error: <3 arcmin
Surface quality, S-D: 40-20
Clear Aperture: >90

Centration error: <3 arcmin
Clear Aperture: >90

Wavelength, nm: 632.8
Dimensions, mm: Ø25.4 (+0/-0.1)
Edge thickness, mm: 2.0 (±0.1)
Focal length, mm: +3000 (±3%)
Material: BK7
Protective chamfers: <0.25 mm x 45°
ROC S1, mm: +1545.27
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 40-20

Centration error: <3 arcmin
Clear Aperture: >90

Wavelength, nm: 632.8
Dimensions, mm: Ø25.4 (+0/-0.1)
Edge thickness, mm: 2.0 (±0.1)
Focal length, mm: +2500 (±3%)
Material: BK7
Protective chamfers: <0.25 mm x 45°
ROC S1, mm: +1287.73
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 40-20

Centration error: <3 arcmin
Clear Aperture: >90

Wavelength, nm: 632.8
Dimensions, mm: Ø25.4 (+0/-0.1)
Edge thickness, mm: 2.0 (±0.1)
Focal length, mm: +60 (±3%)
Material: UVFS
Protective chamfers: <0.25 mm x 45°
ROC S1, mm: +27.42
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 40-20

Centration error: <3 arcmin
Clear Aperture: >90

Wavelength, nm: 632.8
Dimensions, mm: Ø25.4 (+0/-0.1)
Edge thickness, mm: 2 (±0.1)
Focal length, mm: +1200 (±3%)
Material: UVFS
Protective chamfers: <0.25 mm x 45°
ROC S1, mm: +548.41
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 40-20

Centration error: <3 arcmin
Clear Aperture: >90

Wavelength, nm: 632.8
Dimensions, mm: Ø25.4 (+0/-0.1)
Edge thickness, mm: 2.0 (±0.1)
Focal length, mm: +5000 (±3%)
Material: UVFS
Protective chamfers: <0.25 mm x 45°
ROC S1, mm: +2285.06
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 40-20

Centration error: <3 arcmin
Clear Aperture: >90

Wavelength, nm: 632.8
Dimensions, mm: Ø25.4 (+0/-0.1)
Edge thickness, mm: 2.0 (±0.1)
Focal length, mm: +150 (±3%)
Material: BK7
Protective chamfers: <0.25 mm x 45°
ROC S1, mm: +77.36
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 40-20

Protective chamfers: <0,25mm@45deg
Coatings:

Diameter, mm: Ø25.4 mm (+0/-0.1 mm)
Focal length, mm: 180 mm (±3%)
Material: IRFS
S1: AR(R<0.15%) @ 2090.9, AOI=0°
S2: AR(R<0.15%) @ 2090.9, AOI=0°
S1 Flatness, PV IR S2 Flatness, PV: λ/4 @ 632.8 nm
Surface quality: 20-10 S-D
Thickness, mm: 3 mm (±0.1 mm)

Centration error: <3 arcmin
Clear Aperture: >90

Coating S1/S2: AR (R<0.5%) @ 532 nm, AOI=0°
Dimensions, mm: Ø25.4 (+0/-0.1)
Edge thickness, mm: 2 (±0.1)
Focal length, mm: +150 (±3%)
Material: UVFS
Protective chamfers: <0.25 mm x 45°
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 40-20

Material: UVFS (Corning 7980 0F)
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm

ROC S1, mm: +228.51
Surface quality, S-D: 40-20
Protective chamfers: <0.25 mm x 45°
Focal length, mm: +500 (±3%)
Edge thickness, mm: 2 (±0.1)
Dimensions, mm: Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Centration error: <3 arcmin
Clear Aperture: >90

Centration error: <3 arcmin
Clear Aperture: >90

Coatings: AR/AR (R<0.25%)@343-355 nm
Wavelength, nm: 632.8
Dimensions, mm: Ø25.4 (+0/-0.1)
Edge thickness, mm: 2 (±0.1)
Focal length, mm: +75 (±3%)
Material: UVFS
Protective chamfers: <0.25 mm x 45°
ROC S1, mm: +34.28
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 40-20

Protective chamfers: 0.1-0.3 mm x 45°
Surface quality, S-D: 40-20

ROC S1, mm: +38.69
Material: UVFS (Corning 7980 0F)
Focal length, mm: +84.66 ( ±1%)
Edge thickness, mm: 2 (±0.1)
Dimensions, mm: Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Clear Aperture: >90
Centration error: <3 arcmin
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm

Adhesion and durability: Per MIL-C-675A
Clear Aperture: >90

Coatings: AR/AR(R<0.3%)@700-900nm + AR@532nm
Damage threshold: 2.5J/cm2 @ 800nm; 300 ps
Dimensions, mm: Ø25.4 (±0.5)
Edge thickness, mm: 2.3
Focal length, mm: +100 (±3%)
Material: Fused Silica
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 40-20
Transmitted wavefront: <λ/3 @ 632.8 nm

Centration error: <3 arcmin
Clear Aperture: >90

Coatings: AR/AR<1%@ 515-532+AR<0,5%@ 1020-1070, AOI=0
Wavelength, nm: 632.8
Dimensions, mm: Ø25.4 (+0/-0.1)
Edge thickness, mm: 2 (±0.1)
Focal length, mm: +75 (±3%)
Material: UVFS
Protective chamfers: <0.25 mm x 45°
ROC S1, mm: +34.28
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 40-20

ROC S1, mm: +57.13
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm

Protective chamfers: <0.25 mm x 45°
Focal length, mm: +125 (±3%)
Edge thickness, mm: 2 (±0.1)
Centration error: <3 arcmin
Dimensions, mm: Ø25.4 (+0/-0.1)
Clear Aperture: >90
Coatings: S1/S2: AR (R<0.3%) @ 343-355 nm, AOI=0°
Wavelength, nm: 632.8
Surface quality, S-D: 40-20
Material: UVFS

Centration error: <3 arcmin
Clear Aperture: >90

Coatings: AR/AR(R<0.2%) @ 266 nm, AOI=0 deg
Wavelength, nm: 632.8
Dimensions, mm: Ø25.4 (+0/-0.1)
Edge thickness, mm: 2.0 (±0.1)
Focal length, mm: +100 (±3%)
Material: UVFS
Protective chamfers: <0.25 mm x 45°
ROC S1, mm: +45.7
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 40-20

Centration error: <3 arcmin
Clear Aperture: >90

Coatings: AR/AR(R<0.2%) @ 355 nm, AOI=0 deg
Wavelength, nm: 632.8
Dimensions, mm: Ø25.4 (+0/-0.1)
Edge thickness, mm: 2.0 (±0.1)
Focal length, mm: +100 (±3%)
Material: UVFS
Protective chamfers: <0.25 mm x 45°
ROC S1, mm: +45.7
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 40-20

Centration error: <3 arcmin
Clear Aperture: >90

Coatings: AR/AR (R<0. 7%) @ 300-500 nm, aoi0
Wavelength, nm: 632.8
Dimensions, mm: Ø25.4 (+0/-0.1)
Edge thickness, mm: 2 (±0.1)
Focal length, mm: +75 (±3%)
Material: UVFS
Protective chamfers: <0.25 mm x 45°
ROC S1, mm: +34.28
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 40-20

Centration error: <3 arcmin
Clear Aperture: >90

Coatings: AR/AR (R<0.5%) @ 532 nm, AOI=0°
Wavelength, nm: 632.8
Dimensions, mm: Ø25.4 (+0/-0.1)
Edge thickness, mm: 2 (±0.1)
Focal length, mm: +150 (±3%)
Material: UVFS
Protective chamfers: <0.25 mm x 45°
ROC S1, mm: +68.55
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 40-20

Surface quality, S-D: 40-20
LIDT: >5 J/cm² for 10 ns pulse @ 532 nm

TWD,PV: better than λ/3 @ 632.8 nm
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Required documents: Reflectivity curve
Material: BK7
Edge thickness, mm: 4 (+2/-0)
Dimensions, mm: Ø25.4 (+0.0/-0.1)
Coatings: AR/AR(R<0.3%)@527-532nm, AOI=0deg.
Focal length, mm: +1333
Clear Aperture: >90

Dimensions, mm: Ø25.4 (+0/-0.6)
Transmitted wavefront, PV: <λ/3 @ 632.8 nm

Surface quality, S-D: 40-20
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Material: BK7
Edge thickness, mm: >4
Damage threshold: 2.5J/cm2 for 300 ps pulse @ 800 nm
Coatings: AR/AR(R<0.3%)@700-900 nm, AOI=0deg
Clear Aperture: >90
Adhesion and durability: Per MIL-C-675A
Focal length, mm: +1333 (±1%)

Clear Aperture: >90
Surface quality, S-D: 40-20

S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
ROC S1, mm: +45.7
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Focal length, mm: +100 (±3%)
Edge thickness, mm: 2.0 (±0.1)
Wavelength, nm: 632.8
Centration error: <3 arcmin
AR Coating on S2: AR(R<0.2%)@1342nm, AOI=0°
AR Coating on S1: AR(R<0.2%)@1342nm, AOI=0°
Dimensions, mm: Ø25.4 (+0/-0.1)

Centration error: <3 arcmin
Clear Aperture: >90

Coatings:
Wavelength, nm: 632.8
Dimensions, mm: Ø25.4 (+0/-0.1)
Edge thickness, mm: 2.0 (±0.1)
Focal length, mm: +100 (±3%)
Material: UVFS (C7980)
Protective chamfers: <0.25 mm x 45°
ROC S1, mm: +45.7
S1: AR(R<0.2%)@355 nm, AOI=0 deg
S2: AR(R<0.2%)@355 nm, AOI=0 deg
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 40-20

LIDT: >5 J/cm² @ 532 nm; 10 ns; 10 Hz
Surface quality, S-D: 40-20

Transmitted wavefront distortion, PV: better than λ/3 (PV), λ/15 (RMS) @ 632.8 nm
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Required documents: Reflectivity curve
Material: BK7
Edge thickness, mm: 4
Dimensions, mm: Ø25.4 (+0.0/-0.6)
Coatings: AR/AR(R<0.25%)@527-532nm, AOI=0deg
Clear Aperture: >90
Focal length, mm: +500 (±1%)

Focal length, mm: +75 (±3%)
Surface quality, S-D: 40-20 (before coating)

S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm (before coating)
S1/S2: AR (R<0.3%) @ 343-355 nm, AOI=0°
ROC S1, mm: +34.28
Protective chamfers: <0.25 mm x 45°
LIDT: >4-5 J/cm2, 10 ns, 10 Hz, 355 nm
Edge thickness, mm: 2 (±0.1)
Dimensions, mm: Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Coatings:
Clear Aperture: >90
Centration error: <3 arcmin
Material: UVFS

Adhesion and Stability: Insoluble in the laboratory solvents
Center thickness, mm: 2 (+2/-0.15)

Centration error: <3 arcmin
Clear Aperture: >90
Coatings: AR/AR(0.25%)@532nm, AOI 0 deg
Dimensions, mm: Ø25.4 (+0/-0.15)
Focal length, mm: +400 (±2%) @ 532nm
LIDT: > 5 J/cm² @ 532 nm, 10 ns pulses
Material: BK7
Protective chamfers: <0.5 mm x 45°
Standard: MIL-C-675A
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 10-5 (before coating)