??POL

Material: Corning 7980 UVFS
Wavelength, nm: 355

Clear Aperture: >90
Dimensions, mm: 20.0 × 12.7 (+0/-0.1)
LIDT: >4 J/cm² @ 355 nm;
Angle of Incidence (AOI), °: Brewster angle
Parallelism error: <30 arcsec
Surface quality, S-D: 20-10
Thickness, mm: 2 (±0.1)
Transmission p-pol: >95%
Transmission s-pol: <0.5%
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Extinction Ratio: >200:1

Parallelism error: <30arcsec
Thickness, mm: 3 (+/-0.1 mm)

Surface quality, S1/S2: 20-10 S-D
S1 Flatness, PV IR S2 Flatness, PV: λ/8@633nm
S2: uncoated
Protective chamfers: 0.25 mm x 45°
Material: UVFS (Corning 7980 0F)
Diameter, mm: 25.4 (+0/-0.1 mm)
Coatings:
Clear aperture: >90%
S1: HRs(R>99.98%)@1030nm, HTp(T>99%)@1030nm, Contrast Tp/Ts>3000@1025-1035nm, AOI=55.4°

Extinction Ratio: >1000:1
Wavelength, nm: 1064

Typical LIDT: 7.1 J/cm² (s-pol); 3.2 J/cm² (p-pol) @ 1064 nm, 12 ns, 100 Hz
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Transmission s-pol: <0.1%
Transmission p-pol: >99%
Thickness, mm: 5
Surface quality, S-D: 20-10
Material: UVFS
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Coating transmitted GDD (p-pol), fs²: <500
Coating reflected GDD (s-pol), fs²: <200
Clear Aperture: >90
Angle of Incidence (AOI), °: Brewster angle
Parallelism error: <30 arcsec

Material: UVFS
Wavelength, nm: 355

Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Transmission s-pol: <0.3%
Transmission p-pol: >97%
Surface quality, S-D: 20-10
Parallelism error: <30 arcsec
Extinction Ratio: >300:1
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Coating transmitted GDD (p-pol), fs²: <100
Coating reflected GDD (s-pol), fs²: <50
Clear Aperture: >90
Angle of Incidence (AOI), °: Brewster angle
LIDT: 2 J/cm² (s-pol); 3 J/cm² (p-pol) @ 355 nm, 7.8 ns, 100 Hz

Transmission s-pol: <0.1%
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm

Transmission p-pol: >99%
Surface quality, S-D: 20-10
Parallelism error: <30 arcsec
Material: UVFS
Dimensions, mm: 20 (+0/-0.1) x 40 (+0/-0.1) x 5 (±0.1)
Coating transmitted GDD (p-pol), fs²: <300
Coating reflected GDD (s-pol), fs²: <100
Clear aperture: 15 x 26.8 mm elliptical centered
Angle of Incidence (AOI), °: Brewster angle
Wavelength, nm: 532
Extinction Ratio: >1000:1

Surface quality, S-D: 20-10
Coating reflected GDD (s-pol), fs²: <200

Wavelength, nm: 1064
Typical LIDT: 7.1 J/cm² (s-pol); 3.2 J/cm² (p-pol) @ 1064 nm, 12 ns, 100 Hz
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Transmission s-pol: <0.1%
Transmission p-pol: >99%
Material: UVFS
Extinction Ratio: >1000:1
Angle of Incidence (AOI), °: Brewster angle
Coating transmitted GDD (p-pol), fs²: <500
Dimensions, mm: 10 (+0/-0.1) x 20 (+0/-0.1) x 5 (±0.1)
Clear Aperture: >90
Parallelism error: <30 arcsec

Dimensions, mm: 20 x 60
S2: AR (Rp<0.8%) @ 980-1080 nm

Wedge (marked with an arrow): 1° (±5 acmin)
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Thickness, mm: 5
Thickness tolerance, mm: ±0.1
Surface quality, S-D: 20-10
Clear aperture: >90
Material: UVFS
Dimensions tolerance, mm: (+0/-0.1)
Coatings:
S1: Pol (Rs>90%, Tp>94%) @ 980-1080 nm (centered at 1030 nm)
Protective chamfers: 0.25 mm x 45°

Coatings:
S1(^): Pol (Rs>99.9%, Tp>98%) @ 1030 nm, AOI = 45° ±3°

S1 Flatness, PV IR S2 Flatness, PV: λ/10 @ 633 nm
Thickness, mm: 6.0 (±0.1)
S2: ARp<0.1% @ 1030 nm, AOI = 45°
S1/S2 Surface quality, S-D: 20-10
Parallelism error: <30 arcsec
Material: FS (Suprasil 300)
Dimensions, mm: Ø12.7 (+0/-0.1)
Protective chamfers: <0.3 mm x 45°
LIDT: >5 J/cm² @1064 nm, 10 ns

Surface quality, S-D: 20-10
Wedge / Parallelism error: <30 arcsec

Wavelength, nm: 532
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Transmission s-pol, %: <0.1
Transmission p-pol, %: >97
Extinction Ratio: >1000:1
LIDT: >5 J/cm² @ 532 nm; 10 ns; 10 Hz for s-pol & >2 J/cm² @ 532 nm; 10 ns; 10 Hz for p-pol;
Material: UVFS
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Clear Aperture: >90
Angle of Incidence (AOI), °: 45 (angle tunning ±1.5)
Protective chamfers: 0.2-0.3 mm x 45°

Reflectivity on S pol, S1: Rs > 99.5% @ AOI=56deg @532nm
Wavelength, nm: 527-532

Thickness, mm: 3 (±0.1)
Surface quality, S-D: 20-10
S1 Flatness, PV IR S2 Flatness, PV: λ/10 @ 632.8 nm
Required documents: Reflectivity curve @ 532nm
Reflectivity on P pol, S1: Tp > 95% @ AOI=56deg @532nm
Parallelism error: <30 arcsec
Material: BK7
Diameter, mm: Ø25.4 (+0/-0.6)
Damage threshold: >10 J/cm2 @ 10 ns, 10Hz
Clear Aperture: >85% of area, centered
Coating on S2: uncoated

Material: UVFS
Wavelength, nm: 1064

Transmission s-pol, %: <0.1
LIDT: 7.1 J/cm² (s-pol); 3.2 J/cm² (p-pol) @ 1064 nm, 12 ns, 100 Hz
Extinction Ratio: >1000:1
Dimensions, mm: 10 (+0/-0.1) x 20(+0/-0.1) x 5 (±0.1)
Angle of Incidence (AOI), °: 45 (angle tunning ±1.5)
Transmission p-pol, %: >99

Extinction ratio Tp/Ts: >200:1
Angle of Incidence (AOI), °: 55.4° (±1°)

Typical transmission: Tp > 95%
Typical reflection: Rs > 99.5%
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Thickness, mm: 5.0 mm (+/-0.1 mm)
Surface quality: 20-10
Material: UVFS
Dimensions, mm: 10.0 mm x 20.0 mm (+0/-0.1 mm)
Wavelength, nm: 1064 nm
Clear aperture: >90 %
Parallelism error: <30 arcsec

Dimensions, mm: Ø50.8 (+0/-0.1) x 10 (±0.1)
Wavelength, nm: 343

Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Transmission s-pol: <0.3%
Transmission p-pol: >97%
Surface quality, S-D: 20-10
Parallelism error: <30 arcsec
Angle of Incidence (AOI), °: Brewster angle
Extinction Ratio: >1000:1
Coating transmitted GDD (p-pol), fs²: <100
Coating reflected GDD (s-pol), fs²: <100
Clear Aperture: >90
Material: UVFS Corning 7980 0F

Surface quality: 20-10 S-D (before coating)
Wavelength, nm: 1975

Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm (before coating)
Transmission p-pol: >98%
Material: UVFS
Laser damage threshold reports: >10 J/cm² @ 1064 nm, 10 ns, 10 Hz
Extinction ratio: Tp/Ts > 1000:1
Dimensions, mm: ø25.4 (+0/-0.1) × 5 (±0.1)
Clear aperture: >90%
Transmission s-pol: <0.1%
Angle of Incidence (AOI), °: 45°
Parallelism error: <30 arcsec

Material: UVFS
Typical transmission: Tp > 95%

Typical reflection: Rs > 99.5%
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Thickness, mm: 2.0 mm (+/-0.1 mm)
Parallelism error: <30 arcsec
Extinction ratio Tp/Ts: >200:1
Dimensions, mm: 9.0 mm x 10.0 mm (+0/-0.1 mm)
Wavelength, nm: 1064 nm
Clear aperture: >90 %
Angle of Incidence (AOI), °: 55.4° (±1°)
Surface quality: 20-10

Surface quality, S-D: 20-10
Typical LIDT: 20 J/cm² (s-pol); 10 J/cm² (p-pol) @ 1064 nm, 12 ns, 100 Hz

Typical LIDT: >10 J/cm² @ 1064 nm, 10 ns, 10 Hz
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Transmission s-pol, %: <0.1
Transmission p-pol, %: >97
Wavelength, nm: 1064
Protective chamfers: 0.1-0.3 mm x 45°
Parallelism error: <30 arcsec
Material: UVFS
Extinction Ratio: 500:1 (with angular adjustment of ±1.5°)
Extinction Ratio: ~ 1000:1 (with angular adjustment of ±1.5°)
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Angle of Incidence (AOI), °: 45 (angle tunning ±1.5)
Clear Aperture: >90

Diameter/dimensional tolerances: +0/-0.2 mm
Thickness tolerance, mm: ±0.1 mm

Surface quality: 20-10 S-D
STANDARD SPECIFICATIONS (substrate):
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
S2: AR (Rp<1%) @ 500-600nm, AOI=72°
Dimensions, mm: 20x20x5mm
Coatings:
Clear aperture: >90 %
Angle of Incidence (AOI), °: 72°
Parallelism error: <30 arcsec
S1: Pol (Tp optimized) (Tp > 94%; Ts<11%) @ 500-600nm, AOI=72°

Protective chamfers: 0.1-0.3 mm x 45°
Parallelism error: <30 arcsec

Wavelength, nm: 532
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Transmission s-pol, %: <0.2
Transmission p-pol, %: >98
Material: UVFS
Angle of Incidence (AOI), °: 55.6 (±1°)
LIDT: >20 J/cm2, 10 ns, 10 Hz, 532 nm for Rs-pol; >5 J/cm2, 10 ns, 10 Hz, 532 nm for Tp-pol
Extinction Ratio: >1000:1
Dimensions, mm: Ø25.4 (+0/-0.1) × 5 (±0.1)
Clear Aperture: >90
Surface quality, S-D: 20-10

S1, S2 (entrance and exit faces): AR(<0.25%)@1054-1074nm AOI0-6deg
Protective chamfers: 0.1-0.2mm @ 45deg;

Thermal choc: 5 cycles between -35°C and +63°C at 1°C/min
Tests included:
Tests included in the quote:
Humidity Damp heat: 16 hours at 55°C and 90%-95% humidity
Beam deviation (CD, DF, FE, EC): +/-30arcsec
Coating:
Mechanical resistance standard: Rubber and adhesive tape resistance.
Environmental test:

Clear aperture: >90%
Surface quality, S1/S2: 10/5 S/D (after coating 20/10 S/D)

Typical LIDT: >7.1 J/cm² (s-pol); 3.2 J/cm² (p-pol) @ 1064 nm, 12 ns, 100 Hz
Transmitted WFD, P-V: <λ/8@633 nm
Transmission s-pol: <0.1%
Transmission p-pol: >97%
Thickness, mm: 5.0 mm (+/-0.1 mm)
Protective chamfers: <0.25 mm x 45°
Parallelism error: <30 arcsec
Material: UVFS (Corning 7980 0F)
Dimensions, mm: 20.0 x 10.0 mm (+0.0/-0.1 mm)
Coatings: IBS
Angle of Incidence (AOI), °: 45° (angle tunning ±1.5°)
Wavelength, nm: 1030 nm

Material: UVFS (Corning 7980 0F)
Typical reflection: >99.5%

Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Thickness, mm: 3.0 mm (+/- 0.1 mm)
Surface quality: 20/10 S/D
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm (per 18.0 x 11.0 elliptical aperture)
Parallelism error: <30 arcsec
Extinction ratio Tp/Ts: >1:100 @1042 nm
Dimensions, mm: 12.5 mm x 20.0 mm (+0.0/-0.1 mm)
Wavelength, nm: 1042 nm
Clear Aperture: >90%
Angle of Incidence (AOI), °: 56.4° (+/-1°)
Typical transmission: >94%
Protective chamfers: <0.25 mm x 45°

Transmission p-pol, %: >97
Material: UVFS

Wedge / Parallelism error: <30 arcsec
Wavelength, nm: 515
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Transmission s-pol, %: <0.1
Angle of Incidence (AOI), °: 45 (angle tunning ±1.5)
Surface quality, S-D: 20-10
LIDT: >5 J/cm² @ 532 nm; 10 ns; 10 Hz for s-pol & >2 J/cm² @ 532 nm; 10 ns; 10 Hz for p-pol;
Extinction Ratio: >1000:1
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Clear Aperture: >90
Protective chamfers: 0.2-0.3 mm x 45°

Protective chamfers: 0.1-0.3 mm x 45°
Typical LIDT: 20 J/cm² (s-pol); 10 J/cm² (p-pol) @ 1064 nm, 12 ns, 100 Hz

Typical LIDT: >10 J/cm² @ 1064 nm, 10 ns, 10 Hz
Transmission p-pol, %: >97
Transmission s-pol, %: <0.1
Wavelength, nm: 1064
Surface quality, S-D: 20-10
Material: UVFS
Extinction Ratio: 500:1 (with angular adjustment of ±1.5°)
Extinction Ratio: ~ 1000:1 (with angular adjustment of ±1.5°)
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Clear Aperture: >90
Angle of Incidence (AOI), °: 45 (angle tunning ±1.5)
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Parallelism error: <30 arcsec

Surface quality, S-D: 20-10
Wedge / Parallelism error: <30 arcsec

Wavelength, nm: 1064
Typical LIDT: 7.1 J/cm² (s-pol); 3.2 J/cm² (p-pol) @ 1064 nm, 12 ns, 100 Hz;
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Transmission p-pol, %: >97
Protective chamfers: 0.1-0.3 mm x 45°
Material: UVFS
Extinction Ratio: >1000:1
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Clear Aperture: >90
Angle of Incidence (AOI), °: 45 (angle tunning ±1.5)
Transmission s-pol, %: <0.1

Protective chamfers: 0.1-0.3 mm x 45°
Thickness, mm: 3.2 (±0.1)

S2: AR (R<0.2%) @ 1064 nm
S1 Flatness, PV IR S2 Flatness, PV: <λ/10 @ 632.8 nm
Wedge / Parallelism error: < 1 arcmin
S1: Pol(Tp>95%, Ts <0.5%) @ 1064 nm
LIDT: 200 mJ @ 1064 nm; 10 ns; 60 Hz, Beam Ø 5 mm
Dimensions, mm: 14.3 x 9.4 (+0/-0.1)
Coatings:
Clear Aperture: >90
Angle of Incidence, °: 56 ± 2
Surface quality, S-D: 20/10
Material: UVFS

Material: UVFS
Wedge / Parallelism error: <30 arcsec

Wavelength, nm: 355
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Transmission p-pol, %: >95
Surface quality, S-D: 20-10
Protective chamfers: 0.2-0.3 mm x 45°
LIDT: >4 J/cm² @ 355 nm; 10 ns; 10 Hz for s-pol & >1 J/cm² @ 355 nm; 10 ns; 10 Hz for p-pol;
Extinction Ratio: >500:1
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Clear Aperture: >90
Angle of Incidence (AOI), °: 45 (angle tunning ±1.5)
Reflection s-pol, %: >99.8

Reflection p-pol: <3%
Wedge / Parallelism error: 1° (±5 arcmin)

Wavelength, nm: 1213-1327 (centered @ 1270 nm)
Configuration: Max R contrast
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Surface quality, S-D: 20-10
Reflection s-pol, %: >84%
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Extinction Ratio: >30:1
Dimensions, mm: 20 (+0/-0.1) x 60 (+0/-0.1) x 5 (±0.1)
Clear Aperture: >90
Angle of Incidence (AOI), °: 72
S1 Flatness, PV IR S2 Flatness, PV: <λ/5 @ 632.8 nm

Revision: A
Thickness, mm: 2 (±0.1)

S2: ARp<0.1% @ 1030 nm, AOI = 45°
S1/S2 Surface quality, S-D: 20-10
S1/S2 Surface flatness before coating: <λ/10 @ 633 nm
Transmitted wavefront distortion, PV: <λ/10 @ 633 nm
S1(^): Pol (Rs>99.9%, Tp>98%) @ 1030 nm, AOI = 45° ±3°
Parallelism error: <30 arcsec
Material: FS (Suprasil 300)
LIDT: >5 J/cm² @1064 nm, 10 ns
Dimensions, mm: Ø12.7 (+0/-0.1)
Coatings:
S1/S2 Surface flatness after coating: <λ @ 633 nm over CA
Protective chamfers: <0.3 mm x 45°

Material: UVFS
Wedge / Parallelism error: 0.5 deg ±5arcmin

Wavelength, nm: 532
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Transmission s-pol, %: <0.1
Transmission p-pol, %: >97
Protective chamfers: 0.2-0.3 mm x 45°
LIDT: >5 J/cm² @ 532 nm; 10 ns; 10 Hz for s-pol & >2 J/cm² @ 532 nm; 10 ns; 10 Hz for p-pol;
Extinction Ratio: >1000:1
Dimensions, mm: Ø25.4 (+0/-0.1) x 6 (±0.1)
Clear Aperture: >90
Angle of Incidence (AOI), °: 45 (angle tunning ±1.5)
Surface quality, S-D: 20-10

S1 Flatness, PV IR S2 Flatness, PV: <λ/2 @ 632.8 nm
Material: UVFS

Wedge / Parallelism error: 1° (±5 arcmin)
Wavelength, nm: 720-820 (centered @ 800 nm)
Configuration: Max Rs
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Surface quality, S-D: 20-10
Angle of Incidence (AOI), °: 72 (±2)
Protective chamfers: <0.25 mm x 45°
Extinction Ratio: >5:1
Dimensions, mm: 20 (+0/-0.1) x 60 (+0/-0.1) x 5 (±0.1)
Clear Aperture: >90
Reflection s-pol, %: >98%
Reflection p-pol: <20%

S2: AR(Rp<0.1%)@ 1025-1035 nm, AOI=43-47 deg
Transmitted wavefront distortion, PV:

Diameter, mm: 12.7 mm (+0/-0.1 mm)
S1: Pol(Rs>99.8%,Tp>97% @ 1030 nm), AOI=44-46 deg

Transmitted wavefront distortion, PV: Thickness, mm: 3 mm (+/-0.1 mm)
Surface quality, S1/S2: 20-20 S-D
S1 Flatness, PV IR S2 Flatness, PV: S2: AR(Rp<0.1%)@ 1025-1035 nm, AOI=43-47 deg
Material: UVFS (Corning 7980)
Coatings:
Clear aperture: >11.4 mm diameter, central area
Chips: <0.2 mm
Chamfer: 0.1-0.25 mm x 45 deg
Parallelism error: <1 arcmin

Chamfer: 0.1-0.25 mm x 45 deg
S1: Pol(Rs>99.8%,Tp>97% @ 1029-1031 nm, Rs>99.6%, Tp>95% @ 1025-1028 nm and 1032-1035 nm), AOI=44-46 deg

Transmitted wavefront distortion, PV: Thickness, mm: 4 mm (+/-0.1 mm)
Surface roughness (RMS), S1/S2: <10 angstrom
Surface quality, S1/S2: 20-20 S-D
S1 Flatness, PV IR S2 Flatness, PV: S2: AR(Rp<0.1%)@ 1025-1035 nm, AOI=43-47 deg
Part Number: M0226-1141-03 revA
Parallelism error: <1 arcmin
Material: UVFS (Corning 7980 0A)
LIDT: 6 mJ/cm^2, 1030 nm, 500 fs
Diameter, mm: 16 mm (+0/-0.1 mm)
Coatings:
Chips: <0.2 mm
Clear aperture: >14.4 mm diameter, central area

S1: POL(Rs>99.8%, Tp>99.0%)@1030 nm, AOI=55° (+/- 1°)
Thickness, mm: 8.0 mm (+/-0.1 mm)

Surface quality, S1/S2: 20/10 S/D (after coating 20/10 S/D)
Your part: #00007154
S2: uncoated
Parallelism error: <1 arcmin
Material: UVFS (Corning 7980 0F)
Diameter, mm: 38.1 mm (+0.0/-0.1 mm)
Coatings: IBS
Clear aperture: >85%
Protective chamfers: <0.25 mm x 45°
S1 Flatness, PV IR S2 Flatness, PV: <λ/10@633 nm (after coating λ/8@633 nm, stress compensation applied)

Material: UVFS
Wavelength, nm: 515

Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Transmission p-pol: >95%
Surface quality, S-D: 20-10
Reflection s-pol, %: >99.5%
Angle of Incidence (AOI), °: Brewster angle
Parallelism error: < 30 arcsec
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Extinction Ratio: >200:1
Dimensions, mm: 10 (+0/-0.1) x 20 (+0/-0.1) x 5 (±0.1)
Clear Aperture: 90
Protective chamfers: <0.25 mm x 45°

Protective chamfers: <0.25 mm x 45°
Surface quality, S-D: 20-10

Wedge / Parallelism error: <5 arcsec
Wavelength, nm: 515
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Transmission s-pol, %: <0.1
Angle of Incidence (AOI), °: 45 (angle tunning ±1.5)
Material: UVFS
LIDT: >5 J/cm² @ 532 nm; 10 ns; 10 Hz for s-pol & >2 J/cm² @ 532 nm; 10 ns; 10 Hz for p-pol;
Extinction Ratio: >1000:1
Dimensions, mm: Ø25.4 (+0/-0.1) x 6 (±0.1)
Transmission p-pol, %: >97
Clear Aperture: >90

LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Wavelength, nm: 1020-1040 (centered @ 1030 nm)

Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Transmission p-pol: >95%
Surface quality, S-D: 20-10
Reflection s-pol, %: >99.5%
Protective chamfers: <0.25 mm x 45°
Angle of Incidence (AOI), °: Brewster angle
Material: UVFS
Extinction Ratio: >200:1
Dimensions, mm: 10 (+0/-0.1) x 20 (+0/-0.1) x 5 (±0.1)
Clear aperture %: >90
Parallelism error: <30 arcsec

Clear Aperture: >90
Surface quality, S-D: 20-10

Typical LIDT: 2 J/cm² (s-pol); 3 J/cm² (p-pol) @ 355 nm, 7.8 ns, 100 Hz
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Transmission s-pol: <0.3%
Transmission p-pol: >97%
Parallelism error: <30 arcsec
Material: UVFS
Extinction Ratio: >300:1
Dimensions, mm: 10 (+0/-0.1) x 20 (+0/-0.1) x 5 (±0.1)
Coating reflected GDD (s-pol), fs²: <50
Angle of Incidence (AOI), °: Brewster angle
Wavelength, nm: 405
Coating transmitted GDD (p-pol), fs²: <110

S2(e-beam): ARp<0.1% @ 1030 nm, AOI = 45° ±3°
S1 Surface flatness: λ/8 @ 632.8 nm

Thickness, mm: 6.0 (±0.1)
S2 Surface quality, S-D: 80-50
S1(IBS, ^): Pol (Rs>99.9%, Tp>98%) @ 1030 nm, AOI = 45° ±3°
S1 Surface quality, S-D: 10-5 in Ø5 mm CA, 20-10
Protective chamfers: <0.3 mm x 45°
Parallelism error: <1 arcmin
Material: FS (Corning 7980 0F)
LIDT: >5 J/cm² @ 1064 nm, 10 ns
Dimensions, mm: Ø12.7 (+0/-0.1)
Coatings:
Clear Aperture: >90
Revision: A

Protective chamfers: <0.25 mm x 45°
Wavelength, nm: 258

Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Transmission p-pol: >95%
Surface quality, S-D: 20-10
Reflection s-pol, %: >99.5%
Parallelism error: < 30 arcsec
Material: UVFS
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Extinction Ratio: >200:1
Dimensions, mm: 20 x 40 ( +0/-0.1) x 5 (±0.1)
Angle of Incidence (AOI), °: Brewster angle
Clear aperture: 15 x 26.8 mm elliptical centered

Reflection s-pol, %: >99.5%
Wavelength, nm: 387

Angle of Incidence (AOI), °: Brewster angle
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Transmission p-pol: >95%
Surface quality, S-D: 20-10
Parallelism error: < 30 arcsec
Material: UVFS
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Extinction Ratio: >200:1
Clear aperture: 15 x 26.8 mm elliptical centered
Protective chamfers: <0.25 mm x 45°
Dimensions, mm: 20 x 40 ( +0/-0.1) x 5 (±0.1)

Material: UVFS
Wedge / Parallelism error: <1arcmin

Surface quality, S-D: 20-10
Surface flatness, P-V: <λ/12 @ 632.8nm per elliptical CA before coating
Surface flatness, P-V: <λ/10 @ 632.8nm per elliptical CA after coating
S2: -
Protective chamfers: 0.1-0.25 mm x 45°
LIDT: >4 J/cm2 @ 355 nm, 10 ns, 100 Hz
Extinction ratio (Tp/Ts): >200:1
Dimensions, mm: 20x40(+0/-0.1) x 12 (±0.1)
Coatings:
Clear Aperture: >90
Angle of Incidence (AOI), °: 55.9° (Brewster)
S1: Pol (Tp>95%, Rs>99.5%) @ 355 nm