Search results for: '1550)'

Length, mm: 18 (±0.1)
Transmitted wavefront distortion, PV: <λ/2 @ 632.8 nm
Surface quality, S-D: 20-10
Material: Calcite
Mount: Black anodized aluminum
Wavelength, nm: 350-3000
Extinction Ratio: <5 x 10⁻⁵
Coatings: Single layer MgF2
Clear Aperture: >90
C.A., mm: Ø10
Beam deviation: <3 arcmin
Angular field, °: 19.0 @ 980 nm
LIDT: >100 MW/cm²
O.D., mm: Ø25.4

LIDT: >100 MW/cm²
Wavelength, nm: 200-2300
Transmitted wavefront distortion, PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 20-10
O.D., mm: Ø25.4
Mount: Black anodized aluminum
Length, mm: 28 (±0.1)
Extinction Ratio: <5 x 10⁻⁴
Coatings: Single layer MgF2
Clear Aperture: >90
C.A., mm: Ø10
Beam deviation: <3 arcmin
Angular field, °: 2.0 @ 1064 nm
Material: Quartz

Angular field, °: >6.0
Beam deviation: <3 arcmin
Clear Aperture: 8
Coatings: Single layer MgF2
Extinction Ratio: <5 x 10⁻⁶
LIDT: >200 MW/cm²
Length, mm: 17
Material: a-BBO
Mount: Black anodized aluminum
Outer diameter, mm: 25.4
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/4 @ 632.8 nm
Wavelength, nm: 220-350

Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Surface quality, S-D: 20-10
Retardation order: Zero order
Retardation tolerance: λ/300 @ 20 °C
Wavelength, nm: 1030
Mount: Ø25.4 x 6 mm black anodized metal mount
Material: Crystalline Quartz
LIDT: >10 J/cm² for 10 ns pulses @ 1064 nm
Clear Aperture: >8
AR coatings: (R<0.2%) on each surface
Retardation: λ/4
Parallelism error: <3 arcsec

Surface quality, S-D: 20-10
Wavelength, nm: 800
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Retardation tolerance: +/- λ/300@ 20 °C
Retardation order: Low order
Mount: 25mm +0/-0.1 mm x 4 +/- 0.1
AR coatings: AR/AR (R<0.25 %) @ 800 nm
LIDT: >5J/cm2
Material: Crystalline Quartz
Clear Aperture: >18
Retardation: λ/2

Retardation order: Zero order
Wavelength, nm: 1064
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Surface quality, S-D: 20-10
Retardation tolerance: λ/300 @ 20 °C
Clear Aperture: >18
AR coatings: R<0.2% @ 1064 nm + R<5% @ 633nm on each surface
Retardation: λ/2
AR coatings: R<0.2% @ 1064 nm on each surface
Configuration: Air spaced
LIDT: >10 J/cm² for 10 ns pulses @ 1064 nm
Material: Crystalline Quartz
Mount: Ø25.4 x 6 mm black anodized metal mount
Parallelism error: <3 arcsec

LIDT: >10 J/cm² for 10 ns pulses @ 1064 nm
Wavelength, nm: 800
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Surface quality, S-D: 20-10
Retardation: λ/4
Retardation tolerance: λ/300 @ 20 °C
Retardation order: Zero order
Parallelism error: <3 arcsec
Material: Crystalline Quartz
Configuration: Air spaced
Clear Aperture: >18
AR coatings: R<0.2% @ 800 nm on each surface
Mount: Ø25.4 x 6 mm black anodized metal mount

Surface quality, S-D: 20-10
Wedge / Parallelism error: <3 arcsec
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Retardation: λ/2
Retardation tolerance: ±λ/300 @ 20 °C
Retardation order: Low order
Material: Crystalline Quartz
LIDT: >500 MW/cm2
Configuration: Air spaced
Clear Aperture: 12.7
AR coatings: AR(R<0.25%)@1030
Mount: unmounted
Wavelength, nm: 1030

AR coatings: R<0.2% @ 1030 nm on each surface
Clear Aperture: >90
Diameter, mm: 12.7
LIDT: >10 J/cm² for 10 ns pulses @ 1064 nm
Material: Crystalline Quartz
Mount: unmounted
Parallelism error: <3 arcsec
Retardation order: Zero order
Retardation tolerance: λ/300 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1030

AR coatings: (R<0.2%) on each surface
Clear Aperture: >10
LIDT: >10 J/cm² for 10 ns pulses @ 1064 nm
Material: Crystalline Quartz
Mount: Ø25.4 x 6 mm black anodized metal mount
Parallelism error: <30 arcsec
Retardation order: Low order
Retardation tolerance: λ/150 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 421.6

AR coatings: (R<0.2%) on each surface
Clear Aperture: >8
LIDT: >10 J/cm² for 10 ns pulses @ 1064 nm
Material: Crystalline Quartz
Mount: Ø12.7 x 6 mm black anodized metal mount
Parallelism error: <3 arcsec
Retardation order: Zero order
Retardation tolerance: λ/300 @ 20 °C
Retardation: λ/4
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1064

AR coatings: (R<0.2%) on each surface
Clear Aperture: >8
LIDT: >10 J/cm² for 10 ns pulses @ 1064 nm
Material: Crystalline Quartz
Mount: Ø25.4 x 6 mm black anodized metal mount
Parallelism error: <3 arcsec
Retardation order: Zero order
Retardation tolerance: λ/300 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1064

AR coatings: (R<0.2%) on each surface
Clear Aperture: >8
LIDT: >10 J/cm² for 10 ns pulses @ 1064 nm
Material: Crystalline Quartz
Mount: Ø25.4 x 6 mm black anodized metal mount
Parallelism error: <3 arcsec
Retardation order: Zero order
Retardation tolerance: λ/300 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1030

AR coatings: (R<0.2%) on each surface
Clear Aperture: >18
LIDT: >10 J/cm² for 10 ns pulses @ 1064 nm
Material: Crystalline Quartz
Mount: Ø25.4 x 6 mm black anodized metal mount
Parallelism error: <3 arcsec
Retardation order: Zero order
Retardation tolerance: λ/300 @ 20 °C
Retardation: λ/4
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 980

AR coatings: (R<0.2%) on each surface
Clear Aperture: >18
LIDT: >10 J/cm² for 10 ns pulses @ 1064 nm
Material: Crystalline Quartz
Mount: Ø25.4 x 6 mm black anodized metal mount
Parallelism error: <30 arcsec
Retardation order: Low order
Retardation tolerance: λ/300 @ 20 °C
Retardation: λ/4
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1030

AR coatings: (R<0.2%) on each surface
Clear Aperture: >18
LIDT: >10 J/cm² for 10 ns pulses @ 1064 nm
Material: Crystalline Quartz
Mount: Ø25.4 x 6 mm black anodized metal mount
Parallelism error: <3 arcsec
Retardation order: Low order
Retardation tolerance: λ/300 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 343

AR coatings: (R<0.2%) on each surface
Clear Aperture: >18
LIDT: >10 J/cm² for 10 ns pulses @ 1064 nm
Material: Crystalline Quartz
Mount: Ø25.4 x 6 mm black anodized metal mount
Parallelism error: <3 arcsec
Retardation order: Zero order
Retardation tolerance: λ/300 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 980

Angle of Incidence (AOI), °: diverging beam (NA=0.10), plate tilted @ 9.5°
AR coatings: AR Ravg < 0.7%@1542.9nm on both sides, T95% @ 1542.9nm
Clear Aperture: 8
Acceptance angle, °: refer to AOI : 9.5° +/-Na of PM fiber (0.10)
LIDT:
Material: crystal quartz
Mount: in dia 12.7 mm anodized ring
Parallelism error: <3 arcsec
Required documentation: transmission curve
Retardation order: Low order
Retardation tolerance: λ/100 @ 1542.9 nm
Retardation: λ/4 @1550 nm
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: λ/10 @1542.9mm
Wavelength, nm: 1540-1550

AR coatings: AR(R<0.1%) on each surface
Clear Aperture: 13
LIDT: >5J/cm² @ 1064 nm, 10 ns, 10 Hz
Material: Crystalline Quartz
Mount: unmounted
Retardation order: Low order
Retardation tolerance: ±λ/400
Retardation: λ/2
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1028
Wedge / Parallelism error: <3 arcsec

AR coatings: AR (R<0.15%) on each surface
Clear Aperture: >8
Configuration: Air spaced
LIDT: >5 J/cm² for 10 ns pulses @ 1064 nm
Material: Crystalline Quartz
Mount: Mounted in 15 mm diameter mount
Retardation order: Zero order
Retardation tolerance: ±λ/300 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1064
Wedge / Parallelism error: <3 arcsec

AR coatings: AR (R<0.1%) on each surface
Clear Aperture: >18
LIDT: >5 J/cm2 for 10 ns pulses @1064 nm
Material: Crystalline Quartz
Mount: Mounted in Ø25.4 mm black anodized metal mount
Retardation order: 0
Retardation tolerance: ±λ/300 @ 20 °C
Retardation: λ/4
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1064
Wedge / Parallelism error: <3 arcsec

AR coatings: AR (R<0.25%) on each surface
Clear Aperture: >10
LIDT: >500 MW/cm2
Material: Crystalline Quartz
Retardation order: Low order
Retardation tolerance: ±λ/300 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 800
Wedge / Parallelism error: <3 arcsec

AR coatings: Yes
Clear Aperture: Ø8
LIDT: >500 MW/cm2
Material: MgF2
Retardation order: Low order
Retardation tolerance: ±λ/500 @ 20 °C
Retardation: λ/4
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1550
Wedge / Parallelism error: <3 arcsec

AR coatings: (R<0.2%) on each surface
Clear Aperture: >18
LIDT: >10 J/cm² for 10 ns pulses @ 1064 nm
Material: Crystalline Quartz
Mount: Ø25.4 x 6 mm black anodized metal mount
Parallelism error: <3 arcsec
Retardation order: Low order
Retardation tolerance: λ/300 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 633

AR coatings: AR (R<0.2%) on each surface
Clear Aperture: 12.7
LIDT: >500 MW/cm2
Material: Crystalline Quartz
Mount: unmounted
Retardation order: Low order
Retardation tolerance: ±λ/300 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 515
Wedge / Parallelism error: <3 arcsec

AR coatings: AR (R<0.2%) on each surface
Clear Aperture: >18
LIDT: >10J/cm² @ 1064 nm, 10 ns, 10Hz
Material: Crystalline Quartz
Mount: Mounted in Ø25.4 mm black anodized metal mount
Retardation order: Zero order
Retardation tolerance: ±λ/300 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1053
Wedge / Parallelism error: <3 arcsec

AR coatings: AR(R<0.2%) on each surface
Clear Aperture: >18
LIDT: >10J/cm² @ 1064 nm, 10 ns, 10Hz
Material: Crystalline Quartz
Mount: Mounted in Ø25.4 mm black anodized metal mount
Retardation order: Low order
Retardation tolerance: ±λ/150 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 40-20
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 343
Wedge / Parallelism error: <3 arcsec

AR coatings: Yes
Clear Aperture: 18
Material: Crystalline Quartz
Mount: 25.4mm
Retardation order: Zero order
Retardation tolerance: ±λ/500 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV:
Wavelength, nm: 1040

AR coatings: Yes
Clear Aperture: >18
Configuration: Optically contacted
LIDT: >5 J/cm2 for 10 ns pulses @1064 nm
Material: Crystalline Quartz
Mount: Mounted in Ø25.4 mm black anodized metal mount
Retardation order: Zero order
Retardation tolerance: ±λ/300 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 740
Wedge / Parallelism error: <3 arcsec

AR coatings: Yes
Clear Aperture: >18
Configuration: Optically contacted
LIDT: >5 J/cm2 for 10 ns pulses @1064 nm
Material: Crystalline Quartz
Mount: Mounted in Ø25.4 mm black anodized metal mount
Retardation order: Zero order
Retardation tolerance: ±λ/300 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 370
Wedge / Parallelism error: <3 arcsec

AR coatings: AR/AR(R<0.2%)@1064nm +/-1nm, AOI=0deg
Clear Aperture: Ø15
LIDT: >5J/cm2, 10ns, 200Hz @ 1064 nm
Material: Crystalline Quartz
Mount: Unmounted
Retardation order: Multiple order
Retardation tolerance: ±λ/300 @ 20 °C
Retardation: λ/4
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1064
Wedge / Parallelism error: < 10 arcsec

AR coatings: (R<0.2%) on each surface
Clear Aperture: >18
LIDT: >10 J/cm² for 10 ns pulses @ 1064 nm
Material: Crystalline Quartz
Mount: Ø25.4 x 6 mm black anodized metal mount
Parallelism error: <30 arcsec
Retardation order: Low order
Retardation tolerance: λ/300 @ 20 °C
Retardation: λ/4
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 473

AR coatings: AR (R<0.2%) on each surface
Clear Aperture: >18
Configuration: Air spaced
LIDT: >10 J/cm² @ 1064 nm, 10 ns, 10 Hz
Material: Crystalline Quartz
Mount: Mounted in Ø25.4 mm black anodized metal mount
Parallelism error: <3 arcsec
Retardation order: Zero order
Retardation tolerance: ±λ/300 @ 20 °C
Retardation: λ/4
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 729

AR coatings: AR (R<0.2%) on each surface
Clear Aperture: 12.7
LIDT: >500 MW/cm2
Material: Crystalline Quartz
Mount: unmounted
Retardation order: Low order
Retardation tolerance: ±λ/500 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 343
Wedge / Parallelism error: <3 arcsec

AR coatings: AR (R<0.2%) on each surface
Clear Aperture: 11.5
LIDT: >500 MW/cm2
Material: Crystalline Quartz
Retardation order: Low order
Retardation tolerance: ±λ/300 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 515
Wedge / Parallelism error: <3 arcsec

AR coatings: AR (R<0.1%) on each surface
Clear Aperture: Ø12.7
Configuration: Air spaced
LIDT: >500 MW/cm2
Material: Crystalline quartz or MgF2
Mount: unmounted
Retardation order: Zero order
Retardation tolerance: ±λ/200
Retardation: λ/2
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/4 @ 632.8 nm
Wavelength, nm: 1028
Wedge / Parallelism error: <3 arcsec

AR coatings: AR (R<0.2%) on each surface
Clear Aperture: >18
Configuration: Air spaced
LIDT: >5J/cm² @ 1064 nm, 10 ns, 10 Hz
Material: Crystalline Quartz
Mount: Mounted in Ø25.4 mm black anodized metal mount
Retardation order: 0
Retardation tolerance: ±λ/300 @ 20 °C
Retardation: λ/4
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1122
Wedge / Parallelism error: <3 arcsec

AR coatings: AR/AR @ 815 nm
Clear Aperture: 25.4
Configuration: Optically contacted
LIDT:
Material: Crystalline Quartz
Mount: Unmounted
Retardation order: Zero order
Retardation tolerance: ±λ/500 @ 20 °C
Retardation: λ/4
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 815
Wedge / Parallelism error: < 10 arcsec

AR coatings: AR/AR @ 815 nm
Clear Aperture: 25.4
Configuration: Optically contacted
Material: Crystalline Quartz
Mount: Unmounted
Retardation order: Zero order
Retardation tolerance: ±λ/500 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 20-10
Wavelength, nm: 815
Wedge / Parallelism error: < 10 arcsec

AR coatings: AR/AR @ 854 nm
Clear Aperture: 18
Configuration: Air spaced
LIDT: 5 J/cm² for 10 ns pulses @ 1064 nm
Material: Crystalline Quartz
Mount: 25.4mm
Retardation order: Zero order
Retardation tolerance: ±λ/500 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 854
Wedge / Parallelism error: < 3 arcsec

AR coatings: R<0.2% each surface
Clear Aperture: 18
LIDT: 5 J/cm² for 10 ns pulses @ 1064 nm
Material: Crystalline Quartz
Mount: 25.4mm
Retardation order: Zero order
Retardation tolerance: ±λ/500 @ 20 °C
Retardation: λ/4
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 854
Wedge / Parallelism error: < 3 arcsec

AR coatings: R<0.2% each surface
Clear Aperture: 18
LIDT: 5 J/cm² for 10 ns pulses @ 1064 nm
Material: Crystalline Quartz
Mount: 25.4mm
Retardation order: Zero order
Retardation tolerance: ±λ/500 @ 20 °C
Retardation: λ/4
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 810
Wedge / Parallelism error: < 3 arcsec

AR coatings: R<0.2% each surface
Clear Aperture: 18
LIDT: 5 J/cm² for 10 ns pulses @ 1064 nm
Material: Crystalline Quartz
Mount: 25.4mm
Retardation order: Zero order
Retardation tolerance: ±λ/500 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 810
Wedge / Parallelism error: < 3 arcsec

AR coatings: R<0.2% each surface
Clear Aperture: 12.7
LIDT: 5 J/cm² for 10 ns pulses @ 1064 nm
Material: Crystalline Quartz
Mount: Unmounted
Retardation order: Low order
Retardation tolerance: ±λ/500 @ 20 °C
Retardation: λ/4
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 606
Wedge / Parallelism error: < 10 arcsec

Clear Aperture: Ø8
LIDT: >500 MW/cm2
Material: Crystalline Quartz
Mount: 12.7mm
Retardation order: Low order
Retardation tolerance: ±λ/500 @ 20 °C
Retardation: λ/4
Surface quality, S-D: 20-10
Wavelength, nm: 1550
Wedge / Parallelism error: < 10 arcsec

AR coatings: AR (R<0.2%) on each surface
Clear Aperture: >18
Configuration: Air spaced
LIDT: >5 J/cm²@ 1064 nm; 10 ns; 10 Hz
Material: Crystalline Quartz
Mount: Mounted in Ø25.4 mm black anodized metal mount
Retardation order: 0
Retardation tolerance: ±λ/300 @ 20 °C
Retardation: λ/4
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 589
Wedge / Parallelism error: <30 arcsec

AR coatings: AR (R<0.2%) on each surface
Clear Aperture: >18
LIDT: >5J/cm² @ 1064 nm, 10 ns, 10 Hz
Material: Crystalline Quartz
Mount: Mounted in Ø25.4 mm black anodized metal mount
Retardation order: 0
Retardation tolerance: ±λ/500 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 589
Wedge / Parallelism error: <3 arcsec

Clear Aperture: Ø8
LIDT: 5 J/cm² for 10 ns pulses @ 1064 nm
Material: Crystalline Quartz
Mount: 12.7mm
Retardation order: Low order
Retardation tolerance: ±λ/500 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 426
Wedge / Parallelism error: < 3 arcsec

Clear Aperture: 18
LIDT: 5 J/cm² for 10 ns pulses @ 1064 nm
Material: Crystalline Quartz
Mount: 25.4mm
Retardation order: Low order
Retardation tolerance: ±λ/500 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 760
Wedge / Parallelism error: < 10 arcsec

Clear Aperture: 8
LIDT: >500 MW/cm2
Mount: Ø12.7 x 6 mm black anodized metal mount
Retardation order: Low order
Retardation tolerance: λ/500 @ 20 °C
Retardation: λ/4
Surface quality, S-D: 20-10 after coating
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1550
Wedge / Parallelism error: < 3 arcsec

Wavelength, nm: 1030
Clear aperture: 30 mm
Coatings: AR (R<0.2 %) on each surface
Diameter tolerance, mm: +0/-0.2 mm
LIDT: >10 J/cm^2 for 10 ns pulses @ 1064 nm
Material: Crystalline Quartz
Mount: Mounted in Ø50.8x6 mm black anodized metal mount
Parallelism error: <3 arcsec
Retardation order: LO
Retardation: λ/2 @ 1030 nm +/- λ/300 @ 20 °C
Surface quality: haze
Thickness tolerance, mm: ±0.2 mm
Transmitted wavefront distortion, PV: <λ/8@ 632.8 nm

AR coatings: AR (R<0.2%) on each surface
Clear Aperture: >18
Configuration: Air spaced
LIDT: >10 J/cm² for 10 ns pulses @ 1064 nm
Material: Crystalline Quartz
Mount: Mounted in Ø25.4 mm black anodized metal mount
Retardation order: 0
Retardation tolerance: ±λ/300 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 266
Wedge / Parallelism error: <3 arcsec

Wavelength, nm: 1064
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm

Transmission p-pol: >95%
Surface quality, S-D: 20-20
Parallelism error: <30 arcsec
Reflection s-pol, %: >99.5%
Material: UVFS
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Extinction Ratio: >200:1
Dimensions, mm: 20 (+0/-0.1) x 40 (+0/-0.1) x 5 (±0.1)
Protective chamfers: <0.25 mm x 45°
Clear aperture: 15 x 26.8 mm elliptical centered
Angle of Incidence (AOI), °: Brewster angle

Angle of Incidence (AOI), °: Brewster angle
Reflection s-pol, %: >99.5%

Wavelength, nm: 515
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Transmission p-pol: >95%
Surface quality, S-D: 20-20
Protective chamfers: <0.25 mm x 45°
Parallelism error: < 30 arcsec
Material: UVFS
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Extinction Ratio: >200:1
Clear aperture: 15 x 26.8 mm elliptical centered
Dimensions, mm: 20 (+0/-0.1) x 40 (+0/-0.1) x 5 (±0.1)

Protective chamfers: <0.25 mm x 45°
Wavelength, nm: 1020-1040 (centered @ 1030 nm)

Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Transmission p-pol: >95%
Reflection s-pol, %: >99.5%
Parallelism error: <30 arcsec
Material: UVFS
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Extinction Ratio: >200:1
Dimensions, mm: 20 (+0/-0.1) x 40 (+0/-0.1) x 5 (±0.1)
Clear aperture: 15 x 26.8 mm elliptical centered
Angle of Incidence (AOI), °: Brewster angle
Surface quality, S-D: 20-20

Reflection s-pol, %: >99.5%
Angle of Incidence (AOI), °: Brewster angle

Wavelength, nm: 355
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Transmission p-pol: >95%
Surface quality, S-D: 20-20
Parallelism error: < 30 arcsec
Material: UVFS
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Clear aperture: 15 x 26.8 mm elliptical centered
Protective chamfers: <0.25 mm x 45°
Extinction Ratio: >200:1
Dimensions, mm: 20 x 40 ( +0/-0.1) x 5 (±0.1)

Surface quality, S-D: 20-20
Wavelength, nm: 343

Transmission p-pol: >95%
Reflection s-pol, %: >99.5%
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Angle of Incidence (AOI), °: Brewster angle
CleClear aperture: 15 x 26.8 mm elliptical centered
Dimensions, mm: 20 x 40 ( +0/-0.1) x 5 (±0.1)
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Extinction Ratio: >200:1
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Parallelism error: < 30 arcsec

Surface quality, S-D: 20-20
Extinction Ratio: >200:1

Wavelength, nm: 532
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Transmission p-pol: >95%
Protective chamfers: <0.25 mm x 45°
Parallelism error: < 30 arcsec
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Angle of Incidence (AOI), °: Brewster angle
Clear aperture: 15 x 26.8 mm elliptical centered
Dimensions, mm: 20 (+0/-0.1) x 40 (+0/-0.1) x 5 (±0.1)
Material: UVFS
Reflection s-pol, %: >99.5%

Protective chamfers: <0.25 mm x 45°
Wavelength, nm: 1020-1040 (centered @ 1030 nm)

Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Transmission p-pol: >95%
Reflection s-pol, %: >99.5%
Parallelism error: <30 arcsec
Material: UVFS
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Komentarai:
Extinction Ratio: >200:1
Dimensions, mm: 20 (+0/-0.1) x 40 (+0/-0.1) x 5 (±0.1)
Clear Aperture: >90
Angle of Incidence (AOI), °: Brewster angle
Surface quality, S-D: 20-20

Parallelism error: < 30 arcsec
Surface quality, S-D: 20-10

Wavelength, nm: 266
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Transmission p-pol: >95%
Angle of Incidence (AOI), °: 54,9
Clear Aperture: >90
Material: UVFS
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Extinction Ratio: >200:1
Protective chamfers: <0.25 mm x 45°
Dimensions, mm: 20 (+0/-0.1) x 40 (+0/-0.1) x 3 (±0.1)
Reflection s-pol, %: < 99.5%

Dimensions, mm: ∅25.4 (+0/-0.1) x 3 (±0.1)
Protective chamfers: <0.25 mm x 45°

Wavelength, nm: 532
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Transmission p-pol: >95%
Surface quality, S-D: 20-10
Reflection s-pol, %: >99.5%
Parallelism error: < 30 arcsec
Material: UVFS
Angle of Incidence (AOI), °: Brewster angle
Extinction Ratio: >200:1
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Clear Aperture: >90

Parallelism error: < 30 arcsec
Wavelength, nm: 515

Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Transmission p-pol: >95%
Surface quality, S-D: 20-10
Reflection s-pol, %: >99.5%
Material: UVFS
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Extinction Ratio: >200:1
Dimensions, mm: ∅25.4 (+0/-0.1) x 3 (±0.1)
Clear Aperture: >90
Angle of Incidence (AOI), °: Brewster angle
Protective chamfers: <0.25 mm x 45°

Protective chamfers: <0.25 mm x 45°
Dimensions, mm: ∅25.4 (+0/-0.1) x 3 (±0.1)

Wavelength, nm: 400
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Transmission p-pol: >95%
Surface quality, S-D: 20-10
Reflection s-pol, %: >99.5%
Parallelism error: < 30 arcsec
Material: UVFS
Angle of Incidence (AOI), °: Brewster angle
Extinction Ratio: >200:1
Clear Aperture: >90
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz

Transmission p-pol: >95%
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm

Surface quality, S-D: 20-10
Reflection s-pol, %: >99.5%
Protective chamfers: <0.25 mm x 45°
Material: UVFS
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Extinction Ratio: >200:1
Dimensions, mm: ∅25.4 (+0/-0.1) x 3 (±0.1)
Clear Aperture: >90
Angle of Incidence (AOI), °: Brewster angle
Wavelength, nm: 266
Parallelism error: < 30 arcsec

Angle of Incidence (AOI), °: 56 +/-5
Clear Aperture: >90

Comments: -
Comments: Tp>95%. Rs>99.5%
Dimensions tolerance, mm: +0/-0.1
Dimensions, mm: 20 x 40
Dimensions A x B x C, mm: 20x40
Extinction Ratio: >200:1
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Material: UVFS
Optical material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflection s-pol, %: >99.5
Shape: Rectangular
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Transmission p-pol, %: >95
Transmission s-pol, %:
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1064
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: 55 +/-5
Clear Aperture: >90

Comments: -
Comments: Tp>95%. Rs>99.5%
Dimensions tolerance, mm: +0/-0.1
Dimensions, mm: 20 x 40
Dimensions A x B x C, mm: 20x40
Extinction Ratio: >200:1
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Material: UVFS
Optical material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflection s-pol, %: >99.5
Shape: Rectangular
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Transmission p-pol, %: >95
Transmission s-pol, %:
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1064
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: Brewster angle
Clear Aperture: >90

Dimensions tolerance, mm: +0.0/-0.1
Dimensions, mm: Ø20x40x3
Extinction Ratio: Tp/Ts >100:1
Material: UVFS
Reflection s-pol, %: >99
Surface quality, S-D: 20-10 after coating
Thickness tolerance, mm: ±0.1
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 254
Wedge / Parallelism error: < 30 arcsec

Angle of Incidence (AOI), °: Brewster angle
Clear aperture: 15 x 26.8 mm elliptical centered

Dimensions, mm: 20 (+0/-0.1) x 40 (+0/-0.1) x 3 (±0.1)
Extinction Ratio: >200:1
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Material: BK7
Parallelism error: <30 arcsec
Protective chamfers: <0.25 mm x 45°
Reflection s-pol, %: >99.5%
Surface quality, S-D: 20-10
Transmission p-pol: >95%
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1550

Angle of Incidence (AOI), °: Brewster angle
Clear Aperture: >90

Dimensions, mm: ∅25.4 (+0/-0.1) x 3 (±0.1)
Extinction Ratio: >200:1
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Material: UVFS
Parallelism error: <30 arcsec
Protective chamfers: <0.25 mm x 45°
Reflection s-pol, %: >99.5%
Surface quality, S-D: 20-10
Transmission p-pol: >95%
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 780-820 (centered @ 800 nm)

Angle of Incidence (AOI), °: Brewster angle
Clear Aperture: >90

Dimensions, mm: ∅25.4 (+0/-0.1) x 3 (±0.1)
Extinction Ratio: >200:1
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Material: UVFS
Parallelism error: <30 arcsec
Protective chamfers: <0.25 mm x 45°
Reflection s-pol, %: >99.5%
Surface quality, S-D: 20-10
Transmission p-pol: >95%
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 780

Angle of Incidence (AOI), °: Brewster angle
Clear Aperture: >90

Dimensions, mm: ∅25.4 (+0/-0.1) x 3 (±0.1)
Extinction Ratio: >200:1
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Material: UVFS
Parallelism error: < 30 arcsec
Protective chamfers: <0.25 mm x 45°
Reflection s-pol, %: >99.5%
Surface quality, S-D: 20-10
Transmission p-pol: >95%
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 355

Angle of Incidence (AOI), °: Brewster angle
Clear aperture: >90

Dimensions, mm: 20 x 40
Extinction Ratio: >200:1
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-20
Thickness, mm: 5
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1020-1040
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: 55.6
Clear aperture: >90

Dimensions, mm: 28.6x14.3
Extinction Ratio: >200:1
LIDT: >5 J/cm2 for 10 ns pulses @ 1064 nm
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness, mm: 3
Transmission p-pol, %: >95
Wavelength, nm: 532

Angle of Incidence (AOI), °: 56
Dimensions tolerance, mm: +0/-0.25

Dimensions, mm: 10 x 20
Extinction Ratio: >1000:1
Material: UVFS
Reflection s-pol, %: >99.9
Surface quality, S-D: 40-20
Thickness, mm: 5
Transmission p-pol, %: >99
Wavelength, nm: 1053-1064

Angle of Incidence (AOI), °: 56
Dimensions, mm: 10 x 20

Extinction Ratio: >1000:1
Material: UVFS
Reflection s-pol, %: >99.9
Surface quality, S-D: 20-10
Thickness, mm: 5
Transmission p-pol, %: >99
Wavelength, nm: 1053-1064

Angle of Incidence (AOI), °: 56 ±2
Clear aperture: >90

Dimensions tolerance, mm: +0/-0.12
Dimensions, mm: 20 x 40
Extinction Ratio: >200:1
LIDT: >5 J/cm2 for 10 ns pulses at 1064 nm
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.2
Thickness, mm: 5
Transmission p-pol, %: >95
Wavelength, nm: 1020-1040
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: 55.4
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25 x 50
Extinction Ratio: >200:1
LIDT: >7 J/cm2 for 10 ns pulses @ 1064 nm
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1020-1040
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: 56
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 12.5 x 20
Extinction Ratio: >100:1
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Transmission p-pol, %: >94
Wavelength, nm: 1030
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: 56
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 12.5 x 20
Extinction Ratio: >100:1
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Transmission p-pol, %: >94
Wavelength, nm: 1030
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: 58
Clear aperture: 83

Dimensions, mm: 40 x 70
Extinction Ratio: >200:1
LIDT: >5 J/cm2 for 10 ns pulses at 1064 nm
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 40-10
Thickness, mm: 12
Transmission p-pol, %: >95
Wavelength, nm: 532
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: 58
Clear aperture: >90

Dimensions, mm: 40 x 70
Extinction Ratio: >200:1
LIDT: >5 J/cm2 for 10 ns pulses at 1064 nm
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness, mm: 12
Transmission p-pol, %: >95
Wavelength, nm: 532
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: 56.4
Dimensions tolerance, mm: (+0/-0.1)

Dimensions, mm: 25.4
Extinction Ratio: >100:1
Material: UVFS
Reflection s-pol, %: >99
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 254
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: Brewster angle
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 12.5 x 20.0
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Transmission p-pol, %: >94
Wavelength, nm: 1030

Angle of Incidence (AOI), °: Brewster angle
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 12.5 x 20.0
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Transmission p-pol, %: >94
Wavelength, nm: 1030

Angle of Incidence (AOI), °: 56
Dimensions tolerance, mm: (+0/-0.1)

Dimensions, mm: 50.8
Extinction Ratio: >200:1
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.2
Thickness, mm: 3.35
Transmission p-pol, %: >95
Wavelength, nm: 527-532
Wedge / Parallelism error: < 10 arcsec

Angle of Incidence (AOI), °: 56 ±2
Clear aperture: >90

Dimensions tolerance, mm: +0/-0.12
Dimensions, mm: 25.4
Extinction Ratio: >200:1
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.2
Thickness, mm: 3
Transmission p-pol, %: >95
Wavelength, nm: 1054
Wedge / Parallelism error: < 10 arcsec

Angle of Incidence (AOI), °: 45
Clear aperture: >85

Dimensions, mm: 25.4
Extinction Ratio: >100:1
LIDT: >10 J/cm2 for 20 ns pulses @ 532 nm
Material: UVFS
Reflection s-pol, %: >99
Surface quality, S-D: 20-20
Thickness, mm: 3
Transmission p-pol, %: >95
Wavelength, nm: 532
Wedge / Parallelism error: < 30 arcsec

Angle of Incidence (AOI), °: 45
Clear aperture: >85

Dimensions, mm: 25.4
Extinction Ratio: >100:1
LIDT: >10 J/cm2 for 20 ns pulses @ 532 nm
Material: UVFS
Reflection s-pol, %: >99
Surface quality, S-D: 20-10
Thickness, mm: 3
Transmission p-pol, %: >95
Wavelength, nm: 532
Wedge / Parallelism error: < 30 arcsec

Angle of Incidence (AOI), °: 45
Clear aperture: >85

Dimensions, mm: 25.4
Extinction Ratio: >100:1
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflection s-pol, %: >99
Surface quality, S-D: 20-20
Thickness, mm: 6.35
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/4 @ 632.8 nm
Wavelength, nm: 532
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: 45
Clear aperture: >85

Dimensions, mm: 25.4
Extinction Ratio: >100:1
Material: UVFS
Reflection s-pol, %: >99
Surface quality, S-D: 20-10
Thickness, mm: 6.35
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/4 @ 632.8 nm
Wavelength, nm: 532
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: 56
Dimensions tolerance, mm: (+0/-0.1)

Dimensions, mm: 25.4
Material: UVFS
Reflection s-pol, %: 55-80
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Transmission p-pol, %: <95
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 527-535
Wedge / Parallelism error: < 10 arcsec

Angle of Incidence (AOI), °: 55.6
Dimensions tolerance, mm: (+0/-0.1)

Dimensions, mm: 25.4
Material: UVFS
Reflection s-pol, %: >99.3
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Transmission p-pol, %: >95
Wavelength, nm: 527-532

Angle of Incidence (AOI), °: 56
Clear aperture: 86

Dimensions tolerance, mm: +0/-0.2
Dimensions, mm: 25.4
Extinction Ratio: >200:1
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness, mm: 3
Transmission p-pol, %: >95
Wavelength, nm: 1054
Wedge / Parallelism error: 1°

Angle of Incidence (AOI), °: 56
Clear aperture: >90

Dimensions tolerance, mm: +0/-0.12
Dimensions, mm: 25.4
Extinction Ratio: >200:1
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 80-50
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Transmission p-pol, %: >95
Wavelength, nm: 1054

Angle of Incidence (AOI), °: 56
Clear aperture: >90

Dimensions tolerance, mm: +0/-0.2
Dimensions, mm: 25.4
Extinction Ratio: >200:1
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-40
Thickness tolerance, mm: ±0.2
Thickness, mm: 3
Transmission p-pol, %: >95
Wavelength, nm: 1054
Wedge / Parallelism error: 1°

Angle of Incidence (AOI), °: 56
Dimensions tolerance, mm: (+0/-0.1)

Dimensions, mm: 50.8
Extinction Ratio: >200:1
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 6
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/4 @ 632.8 nm
Wavelength, nm: 323
Wedge / Parallelism error: < 10 arcsec

Angle of Incidence (AOI), °: 55.4
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 20 x 40
Extinction Ratio: >200:1
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 40-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1020-1040
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: 55.4
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 20 x 40
Extinction Ratio: >200:1
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Transmission p-pol, %: >95
Wavelength, nm: 1020-1040
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: 56
Clear aperture: >90

Dimensions tolerance, mm: +0/-0.12
Dimensions, mm: 30
Extinction Ratio: 200:1
Material: BK7
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.2
Thickness, mm: 3
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Wavelength, nm: 1064
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: Brewster angle
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 12.5 x 20.0
Extinction Ratio: >200:1
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1020 - 1040
Wedge / Parallelism error: < 30 arcsec

Angle of Incidence (AOI), °: 45
Dimensions, mm: 25.4

Material: UVFS
Reflection s-pol, %: >99
Surface quality, S-D: 60-20
Thickness, mm: 5
Transmission p-pol, %: >90
Wavelength, nm: 694

Angle of Incidence (AOI), °: 45±3
Dimensions, mm: 50.8

Material: UVFS
Reflection s-pol, %: >99.9
Surface quality, S-D: 20-10
Thickness, mm: 6
Transmission p-pol, %: >97
Wavelength, nm: 532

Angle of Incidence (AOI), °: Brewster angle
Dimensions, mm: 50.8

Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness, mm: 6.35
Transmission p-pol, %: <90
Wavelength, nm: 1053

Angle of Incidence (AOI), °: 72
Dimensions, mm: 20 x 40

Material: UVFS
Reflection s-pol, %: >80
Surface quality, S-D: 60-40
Thickness, mm: 3
Transmission p-pol, %: >90
Wavelength, nm: 1390-1490+720

Angle of Incidence (AOI), °: 56 ±2
Dimensions, mm: 38.1

LIDT: >100 mJ @ 800 nm for 50 fs pulses
Material: UVFS
Reflection s-pol, %: >99
Surface quality, S-D: 40-20
Thickness, mm: 3
Transmission p-pol, %: >92
Wavelength, nm: 780-820

Angle of Incidence (AOI), °: Brewster angle
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25.4
Extinction Ratio: >200:1
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Transmission p-pol, %: >95
Wavelength, nm: 515

Angle of Incidence (AOI), °: 55.5
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 12.7
LIDT: >5 J/cm2 for 10 ns pulses @ 1064 nm
Material: UVFS
Reflection s-pol, %: >95
Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Transmission p-pol, %: >98
Wavelength, nm: 1530-1570

Angle of Incidence (AOI), °: 45
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25.4
Material: BK7
Reflection s-pol, %: >99
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 6
Transmission p-pol, %: >95
Wavelength, nm: 633

Angle of Incidence (AOI), °: 55.88
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25.4
Extinction Ratio: >200:1
LIDT: >7 J/cm2 for 10 ns pulses @ 1064 nm
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Transmission p-pol, %: >95
Wavelength, nm: 355
Wedge / Parallelism error: < 30 arcsec

Angle of Incidence (AOI), °: 45
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25.4
Material: UVFS
Reflection s-pol, %: >99
Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Transmission p-pol, %: >90
Wavelength, nm: 694

Angle of Incidence (AOI), °: 56 ±1
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 30 x 12
LIDT: >5 J/cm2 for 10 ns pulses @ 1064 nm
Material: BK7
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 2
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 694
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: 45
Clear aperture: >90

Dimensions, mm: 100 x 30
Material: UVFS
Reflection s-pol, %: >98
Surface quality, S-D: 40-20
Thickness, mm: 5
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/4 @ 632.8 nm
Wavelength, nm: 405
Wedge / Parallelism error: <1 arcmin

Angle of Incidence (AOI), °: Brewster angle
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 50.8
Extinction Ratio: >200:1
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 6
Transmission p-pol, %: >95
Wavelength, nm: 578
Wedge / Parallelism error: < 10 arcsec

Angle of Incidence (AOI), °: Brewster angle
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25.4
Extinction Ratio: >200:1
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Transmission p-pol, %: >95
Wavelength, nm: 532

Angle of Incidence (AOI), °: 56
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 12.7 x 10
Extinction Ratio: >200:1
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 60-40
Thickness tolerance, mm: ±0.2
Thickness, mm: 5
Transmission p-pol, %: >95
Wavelength, nm: 527-532
Wedge / Parallelism error: 1 deg +/- 5arcmin along longer side;

Angle of Incidence (AOI), °: 56
Dimensions tolerance, mm: (+0/-0.1)

Dimensions, mm: 12.7 x 10
Extinction Ratio: >200:1
LIDT: >5 J/cm2 for 10 ns pulses at 1064 nm
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.2
Thickness, mm: 5
Transmission p-pol, %: >95
Wavelength, nm: 527-532
Wedge / Parallelism error: 1 deg +/- 5arcmin along longer side;

Angle of Incidence (AOI), °: 56
Clear aperture: 85

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 30 x 20
LIDT:
Material: UVFS
Reflection s-pol, %: >99.9
Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 6.35
Transmission p-pol, %: >98
Wavelength, nm: 1030

Angle of Incidence (AOI), °: 56
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25.4
Extinction Ratio: >200:1
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.2
Thickness, mm: 5
Transmission p-pol, %: >95
Wavelength, nm: 527-532

Angle of Incidence (AOI), °: 55.5
Dimensions tolerance, mm: (+0/-0.1)

Dimensions, mm: 12.7
LIDT: >5 J/cm2 for 10 ns pulses @ 1064 nm
Material: UVFS
Reflection s-pol, %: >95
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Transmission p-pol, %: >98
Wavelength, nm: 1530-1570

Angle of Incidence (AOI), °: 55.5
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 12.7
LIDT: >5 J/cm2 for 10 ns pulses @ 1064 nm
Material: UVFS
Reflection s-pol, %: >95
Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Transmission p-pol, %: >98
Wavelength, nm: 1530-1570

Angle of Incidence (AOI), °: Brewster angle
Dimensions tolerance, mm: (+0/-0.1)

Dimensions, mm: 25.4
Extinction Ratio: >200:1
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Transmission p-pol, %: >95
Wavelength, nm: 515

Angle of Incidence (AOI), °: Brewster angle
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 50.8
Extinction Ratio: >200:1
LIDT: >5 J/cm2 for 10 ns pulses @ 1064 nm
Material: BK7
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 8
Transmission p-pol, %: >95
Wavelength, nm: 1064
Wedge / Parallelism error: < 30 arcsec

Angle of Incidence (AOI), °: Brewster angle
Dimensions tolerance, mm: (+0/-0.1)

Dimensions, mm: 50.8
Extinction Ratio: >200:1
LIDT: >5 J/cm2 for 10 ns pulses @ 1064 nm
Material: BK7
Reflection s-pol, %: >99.5
Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 8
Transmission p-pol, %: >95
Wavelength, nm: 532
Wedge / Parallelism error: < 30 arcsec

Angle of Incidence (AOI), °: 45
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25.4
Material: UVFS
Reflection s-pol, %: >99
Surface quality, S-D: 60-40
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Transmission p-pol, %: >87
Wavelength, nm: 694

Angle of Incidence (AOI), °: 45
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25.4
Material: UVFS
Reflection s-pol, %: >99
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Transmission p-pol, %: >87
Wavelength, nm: 694

Angle of Incidence (AOI), °: Brewster angle
Dimensions tolerance, mm: (+0/-0.1)

Dimensions, mm: 25.4
Extinction Ratio: >200:1
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1040-1060
Wedge / Parallelism error: < 10 arcsec

Angle of Incidence (AOI), °: 56
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25.4
Material: UVFS
Reflection s-pol, %: >99.9
Surface quality, S-D: 60-40
Thickness tolerance, mm: ±0.1
Thickness, mm: 6.45
Transmission p-pol, %: >98
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 527-532
Wedge / Parallelism error: < 10 arcsec

Angle of Incidence (AOI), °: 56
Clear aperture: >90 %

Dimensions tolerance, mm: +0.0/-0.1
Dimensions, mm: 30 x 20
Material: UVFS Corning 7980 0F
Protective chamfers: 0.2-0.3 mm x 45 deg
Reflection s-pol, %: >99.9
Surface quality, S-D: 40-20
Thickness tolerance, mm: +/-0.1
Thickness, mm: 6.35
Transmission p-pol, %: >98
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1030
Wedge / Parallelism error: < 1 arcmin

Angle of Incidence (AOI), °: 58
Clear aperture: >90

Dimensions, mm: 50
Extinction Ratio: >200:1
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness, mm: 5
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 355
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: 56 ±3
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25.4
Extinction Ratio: >200:1
LIDT: >5 J/cm2 for 10 ns pulses at 1064 nm
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Transmission p-pol, %: >95
Wavelength, nm: 1020-1040
Wedge / Parallelism error: < 30 arcsec

Angle of Incidence (AOI), °: 56
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 12.7 x 10
Extinction Ratio: >200:1
LIDT: >5 J/cm2 for 10 ns pulses at 1064 nm
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.2
Thickness, mm: 5
Transmission p-pol, %: >95
Wavelength, nm: 527-532
Wedge / Parallelism error: 1 deg +/- 5arcmin along longer side;

Angle of Incidence (AOI), °: 45
Dimensions tolerance, mm: (+0/-0.1)

Dimensions, mm: 38.1
Material: UVFS
Reflection s-pol, %: >99.6
Surface quality, S-D: 20-10 after coating
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Transmission p-pol, %: >97
Wavelength, nm: 532
Wedge / Parallelism error: < 30 arcsec

Angle of Incidence (AOI), °: 55.5
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 12.7
LIDT: >5 J/cm2 for 10 ns pulses @ 1064 nm
Material: UVFS
Reflection s-pol, %: >95
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Transmission p-pol, %: >98
Wavelength, nm: 1530-1570

Angle of Incidence (AOI), °: 56
Clear aperture: >90

Dimensions, mm: 50.8
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness, mm: 6
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV:
Wavelength, nm: 800
Wedge / Parallelism error: < 10 arcsec

Angle of Incidence (AOI), °: 45
Clear aperture: 85

Dimensions, mm: 25.4
Extinction Ratio: 100:1
LIDT: >5 J/cm2 for 10 ns pulses at 1064 nm
Material: BK7
Reflection s-pol, %: >99
Surface quality, S-D: 20-10
Thickness, mm: 6
Transmission p-pol, %: >95
Wavelength, nm: 635
Wedge / Parallelism error: < 30 arcsec

Angle of Incidence (AOI), °: 45
Clear aperture: >90

Dimensions tolerance, mm: +0/-0.12
Dimensions, mm: 10 x 15
Extinction Ratio: 100:1
LIDT: 5 J/cm² for 10 ns pulses @ 1064 nm
Material: UVFS
Reflection s-pol, %: >99
Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 878-880
Wedge / Parallelism error: < 10 arcsec

Angle of Incidence (AOI), °: 45
Clear aperture: >90

Dimensions tolerance, mm: +0/-0.12
Dimensions, mm: 10 x 15
Extinction Ratio: 100:1
LIDT: >5 J/cm2 for 10 ns pulses at 1064 nm
Material: UVFS
Reflection s-pol, %: >99
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.2
Thickness, mm: 3
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 878-880
Wedge / Parallelism error: < 10 arcsec

Angle of Incidence (AOI), °: 55.4
Clear aperture: 85

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25.4
Extinction Ratio: 3000:1
Material: UVFS
Reflection s-pol, %: >99.98
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Transmission p-pol, %: >99.5
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1030
Wedge / Parallelism error: < 10 arcsec

Angle of Incidence (AOI), °: 55.4
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25.4
Extinction Ratio: 3000:1
Material: UVFS
Reflection s-pol, %: >99.98
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Transmission p-pol, %: >99.5
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1030
Wedge / Parallelism error: < 30 arcsec

Angle of Incidence (AOI), °: 55.4
Dimensions tolerance, mm: (+0/-0.1)

Dimensions, mm: 20 x 40
Material: UVFS
Reflection s-pol, %: >99.98
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Transmission p-pol, %: >99.5
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1030
Wedge / Parallelism error: < 30 arcsec

Angle of Incidence (AOI), °: Brewster angle
Clear aperture: >90

Dimensions tolerance, mm: +0/-0.12
Dimensions, mm: 25
Extinction Ratio: >200:1
LIDT: >5 J/cm2 for 10 ns pulses at 1064 nm
Material: BK7
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.2
Thickness, mm: 3
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 527-532
Wedge / Parallelism error: < 10 arcsec

Angle of Incidence (AOI), °: 38-40
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflection s-pol, %: >99
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Transmission p-pol, %: >98
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1030

Angle of Incidence (AOI), °: 56
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 50.8
Extinction Ratio: >200:1
LIDT: >5 J/cm2 for 10 ns pulses @ 1064 nm
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 6
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1064
Wedge / Parallelism error: < 10 arcsec

Dimensions, mm: 20 x 40
Extinction Ratio: >200:1

LIDT: >5 J/cm2 for 10 ns pulses at 1064 nm
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness, mm: 5
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 633

Angle of Incidence (AOI), °: 56
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 40 x 90
Extinction Ratio: >200:1
Material: BK7
Protective chamfers: <0.25 mm x 45°
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 12
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Wavelength, nm: 800
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: 56
Clear aperture: >95

Dimensions tolerance, mm: +0/-0.12
Dimensions, mm: 50 x 90
Extinction Ratio: >500:1
Material: BK7
Reflection s-pol, %: >99.5
Surface quality, S-D: 10-5
Thickness tolerance, mm: ±0.2
Thickness, mm: 12
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Wavelength, nm: 1053

Angle of Incidence (AOI), °: Brewster angle
Dimensions tolerance, mm: (+0/-0.1)

Dimensions, mm: 16.5 x 8
Extinction Ratio: >200:1
LIDT: >5 J/cm2 for 10 ns pulses at 1064 nm
Material: BK7
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 3.2
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1053
Wedge / Parallelism error: < 10 arcsec

Angle of Incidence (AOI), °: Brewster angle
Clear aperture: >90

Dimensions tolerance, mm: +0/-0.6
Dimensions, mm: 25.4
Extinction Ratio: >200:1
LIDT: >10 J/cm2 for 10 ns pulses at 1064 nm
Material: BK7
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.2
Thickness, mm: 3
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 527-532
Wedge / Parallelism error: < 10 arcsec

Angle of Incidence (AOI), °: Brewster angle
Clear aperture: >90

Dimensions tolerance, mm: +0/-0.12
Dimensions, mm: 25.4
Extinction Ratio: >200:1
LIDT: >5 J/cm2 for 10 ns pulses at 1064 nm
Material: BK7
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.2
Thickness, mm: 3
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 633
Wedge / Parallelism error: < 10 arcsec

Angle of Incidence (AOI), °: 56 ±1
Dimensions, mm: 27 x 16

Extinction Ratio: >1000:1
Material: BK7
Protective chamfers: <0.2 mm x 45°
Reflection s-pol, %: >99.9
Surface quality, S-D: 20-10
Thickness, mm: 2
Transmission p-pol, %: >97
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Wavelength, nm: 532
Wedge / Parallelism error: <20 arcsec

Angle of Incidence (AOI), °: 55.5
Dimensions, mm: 30 x 40

Extinction Ratio: >200:1
Material: BK7
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness, mm: 5
Transmission p-pol, %: >98
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1064
Wedge / Parallelism error: < 10 arcsec

Angle of Incidence (AOI), °: 45
Dimensions tolerance, mm: (+0/-0.1)

Dimensions, mm: 25.4
Material: BK7
Reflection s-pol, %: >99
Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 6
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 633
Wedge / Parallelism error: < 10 arcsec

Angle of Incidence (AOI), °: Brewster angle
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 20 x 40
Extinction Ratio: >200:1
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Transmission p-pol, %: >92
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 343
Wedge / Parallelism error: < 10 arcsec

Angle of Incidence (AOI), °: 56 ±3
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25.4
Extinction Ratio: >1000:1
Material: UVFS
Reflection s-pol, %: >99.9
Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 6.35
Transmission p-pol, %: >98
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Wavelength, nm: 527
Wedge / Parallelism error: <1 arcmin

Angle of Incidence (AOI), °: Brewster angle
Clear aperture: >90

Dimensions tolerance, mm: +0/-0.12
Dimensions, mm: 20 x 40
LIDT: >5 J/cm2 for 10 ns pulses at 1064 nm
Material: IRFS
Reflection s-pol, %: >99.7
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.2
Thickness, mm: 10
Transmission p-pol, %: >98
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1020-1040
Wedge / Parallelism error: < 30 arcsec

Angle of Incidence (AOI), °: 45
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25.4
Material: UVFS
Reflection s-pol, %: >99
Surface quality, S-D: 10-5
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Transmission p-pol, %: >90
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 694
Wedge / Parallelism error: < 10 arcsec

Angle of Incidence (AOI), °: Brewster angle
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 20 x 40
Material: BK7
Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Transmission p-pol, %: <80
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 532

Angle of Incidence (AOI), °: Brewster angle
Dimensions tolerance, mm: +0/-0.12

Dimensions, mm: 20 x 40
Extinction Ratio: 3000:1
Material: UVFS
Reflection s-pol, %: >99.9
Surface quality, S-D: 20-10 after coating
Thickness tolerance, mm: ±0.3
Thickness, mm: 3
Transmission p-pol, %: >98
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1015-1045
Wedge / Parallelism error: < 10 arcsec

Angle of Incidence (AOI), °: Brewster angle
Dimensions, mm: 20 x 40

Extinction Ratio: >200:1
LIDT: >5 J/cm2 for 10 ns pulses at 1064 nm
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness, mm: 3
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1645
Wedge / Parallelism error: < 10 arcsec

Angle of Incidence (AOI), °: 56
Dimensions tolerance, mm: (+0/-0.1)

Dimensions, mm: 40 x 20
LIDT: >10 J/cm² @ 1064 nm, 10 ns, 10 Hz
Material: BK7
Surface quality, S-D: 20-10
Thickness tolerance, mm: +0/-0.1
Thickness, mm: 3
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Wavelength, nm: 589
Wedge / Parallelism error: < 10 arcsec

Retardation tolerance: λ/20 @ 20 °C
Wedge / Parallelism error: <30 arcec
Wavelength, nm: 335-535
Transmitted wavefront distortion, PV: <λ/4 @ 632.8 nm
Retardation: λ/2
Mount: unmounted
Material: Crystalline quartz and MgF2
LIDT: >5 J/cm² @ 1064 nm, 10 ns
Configuration: Optically contacted
Coatings: AR (R<0.5%) on each surface
Clear Aperture: >12
Surface quality, S-D: 40-20

Wavelength, nm: 1100
Mount:
S1: BBAR(R<1%)@1100 nm - 2200 nm, AOI=0°
Transmitted wavefront distortion, PV: <λ/8@633 nm
Thickness tolerance, mm: +0.0/-0.1 mm
Surface quality, S1/S2: 40/20 S/D
S2: BBAR(R<1%)@1100 nm - 2200 nm, AOI=0°
Retardation: λ/2 @1100 nm – 2200 nm
Retardation tolerance: +/- λ/50 @20°C
Parallelism error: <30 arcsec
Material: Crystalline Quartz + MgF₂
LIDT: >5J/cm² for 10 ns pulses @1064 nm
Diameter tolerance, mm: +0.0/-0.1 mm
Coatings:
Clear aperture: >20.0 mm diameter of the center

Wedge / Parallelism error: <10 arcsec
Wavelength, nm: 900-2100
Transmitted wavefront distortion, PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 40-20
Retardation: λ/4
Retardation tolerance: λ/100 @ 20 °C
Material: Crystalline Quartz and MgF2
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Configuration: Air spaced
AR Coatings: Rabs<1% & Rave<0.75% @ 900-2100 on each surface
Mount: Ø25.4 x 6 mm black anodized metal mount
Clear Aperture: >12

Clear Aperture: >18
Coatings: BBAR on each surface
Material: Quartz + MgF2
Mount: Mounted in 25.4mm diameter mount
Retardation tolerance: ±λ/100 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 40-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 340-560
Wedge / Parallelism error: <30 arcsec

AR coatings: BBAR coated on each surface
Clear Aperture: >6.5
Configuration: Optically contacted
LIDT: >5 J/cm² @ 1064 nm, 10 ns
Material: Crystalline quartz and MgF2
Mount: unmounted
Retardation tolerance: ±λ/100 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 40-20
Transmitted wavefront distortion, PV: <λ/4 @ 632.8 nm
Wavelength, nm: 532-790
Wedge / Parallelism error: <30 arcec

AR coatings: BBAR coated on each surface
Clear Aperture: >8
LIDT: >5 J/cm² @ 1064 nm, 10 ns
Material: Crystalline quartz and MgF2
Mount: Mounted in Ø12.7 x 6 mm black anodized metal mount
Retardation tolerance: ±λ/100 @ 20 °C
Retardation: λ/4
Surface quality, S-D: 40-20
Transmitted wavefront distortion, PV: <λ/4 @ 632.8 nm
Wavelength, nm: 900-2100
Wedge / Parallelism error: <30 arcsec

AR coatings: Yes
Clear Aperture: >14
Coatings: AR (R<0.5%) on each surface
LIDT: 5 J/cm² for 10 ns pulses @ 1064 nm
Material: Quartz + MgF2
Mount: Mounted in 20 mm diameter mount
Retardation tolerance: ±λ/100 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 60-20
Transmitted wavefront distortion, PV: <λ/4 @ 632.8 nm
Wavelength, nm: 1100-1600
Wedge / Parallelism error: <30 arcsec

AR Coatings: R<0.75% @ 550-750 on each surface
Clear Aperture: >12
Configuration: Air spaced
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Material: Crystalline Quartz and MgF2
Mount: Ø25.4 x 6 mm black anodized metal mount
Retardation tolerance: λ/100 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 40-20
Transmitted wavefront distortion, PV: <λ/4 @ 632.8 nm
Wavelength, nm: 550-750
Wedge / Parallelism error: <10 arcsec

Clear Aperture: >10
Coatings: AR (R<0.5%) on each surface
LIDT: >5 J/cm² @ 1064 nm, 10 ns
Material: Crystalline quartz and MgF2
Mount: Mounted in 15 mm diameter mount
Retardation tolerance: ±λ/30 @ 20°C
Retardation: λ/2
Surface quality, S-D: 40-20
Transmitted wavefront distortion, PV: <λ/4 @ 632.8 nm
Wavelength, nm: 620-1300
Wedge / Parallelism error: <30 arcsec

AR coatings: both sides
Clear Aperture: 11.5
LIDT: >500 MW/cm2
Material: Crystalline Quartz
Retardation tolerance: ±λ/300 @ 20 °C
Retardation: λ/4
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 515
Wedge / Parallelism error: <3 arcsec

AR coatings: both sides
Clear Aperture: 12.7
LIDT: >500 MW/cm2
Material: Crystalline Quartz
Retardation tolerance: ±λ/300 @ 20 °C
Retardation: λ/4
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 515
Wedge / Parallelism error: <3 arcsec

Clear Aperture: >18
Coatings: AR (R<0.5%) on each surface
Configuration: Air spaced
LIDT: 5 J/cm² for 10 ns pulses @ 1064 nm
Material: Quartz + MgF2
Mount: Mounted in 25.4mm diameter mount
Retardation tolerance: ±λ/200
Retardation: λ/4
Surface quality, S-D: 40-20
Transmitted wavefront distortion, PV: <λ/4 @ 632.8 nm
Wavelength, nm: 750-850
Wedge / Parallelism error: <30 arcsec

AR coatings: BBAR coated
Clear Aperture: >12
LIDT: >5J/cm² @ 1064 nm, 10 ns, 10 Hz
Material: Crystalline quartz and MgF2
Mount: Mounted in Ø25.4 mm black anodized metal mount
Retardation tolerance: ±λ/100 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 40-20
Transmitted wavefront distortion, PV: <λ/4 @ 632.8 nm
Wavelength, nm: 700-1000
Wedge / Parallelism error: <30 arcsec

AR coatings: BBAR coated on each surface
Clear Aperture: >12.7
LIDT: >5 J/cm² @ 1064 nm, 10 ns
Material: Crystalline quartz and MgF2
Mount: Mounted in Ø25.4 mm black anodized metal mount
Retardation tolerance: ±λ/30 @ 20°C
Retardation: λ/2
Surface quality, S-D: 40-20
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Wavelength, nm: 630-1300
Wedge / Parallelism error: <30 arcsec

Clear Aperture: >90
Surface quality, S-D: 20-20
Wedge / Parallelism error: 1° (±5 arcmin)
Wavelength, nm: 750-850 (centered @ 800 nm)
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Configuration: Max Rs
S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm
Reflection s-pol, %: >98%
Reflection p-pol: <20%
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Dimensions, mm: 20 (+0/-0.1) x 60 (+0/-0.1) x 5 (±0.1)
Angle of Incidence (AOI), °: 72 (±2)
Extinction Ratio: >5:1

Wedge / Parallelism error: 1° (±5 arcmin)
Wavelength, nm: 750-850 (centered @ 800 nm)
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm
Surface quality, S-D: 20-10
Reflection p-pol: <1%
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Extinction Ratio: >60:1
Dimensions, mm: 25 (+0/-0.1) x 75 (+0/-0.1) x 7 (±0.1)
Configuration: Max R contrast
Reflection s-pol, %: >85%
Clear Aperture: >90
Angle of Incidence (AOI), °: 72 (±2)

Angle of Incidence (AOI), °: 72 (±2)
Clear Aperture: >90
Dimensions, mm: 50 (+0/-0.1) x 160 (+0/-0.1) x 10 (±0.1)
Extinction Ratio: >5:1
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflection p-pol: <20%
Reflection s-pol, %: >98%
S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm
Surface quality, S-D: 20-10
Configuration: Max Rs
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Wavelength, nm: 750-850 (centered @ 800 nm)
Wedge / Parallelism error: 1° (±5 arcmin)

Angle of Incidence (AOI), °: 72 (±2)
Clear Aperture: >90
Dimensions, mm: 20 (+0/-0.1) x 60 (+0/-0.1) x 5 (±0.1)
Extinction Ratio: >20:1
Material: UVFS
Parallelism error: <30 arcsec
Protective chamfers: <0.25 mm x 45°
S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm
Surface quality, S-D: 20-10
Configuration: Max T contrast
Transmission p-pol: >85%
Transmission s-pol: <4%
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Wavelength, nm: 750-850 (centered @ 800 nm)

Angle of Incidence (AOI), °: 72 (±2)
Clear Aperture: >90
Dimensions, mm: 20 (+0/-0.1) x 60 (+0/-0.1) x 5 (±0.1)
Extinction Ratio: >5:1
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflection p-pol: <20%
Reflection s-pol, %: >98%
S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm
Surface quality, S-D: 20-10
Configuration: Max Rs
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Wavelength, nm: 980-1090 (centered @ 1030 nm)
Wedge / Parallelism error: 1° (±5 arcmin)

Angle of Incidence (AOI), °: 72 (±2)
Clear Aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.1) x 3 (±0.1)
Extinction Ratio: >5:1
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflection p-pol: <20%
Reflection s-pol, %: >98%
S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm
Surface quality, S-D: 20-10
Configuration: Max Rs
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Wavelength, nm: 980-1090 (centered @ 1030 nm)
Wedge / Parallelism error: 1° (±5 arcmin)

Angle of Incidence (AOI), °: 72 (±2)
Clear Aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.1) x 3 (±0.1)
Extinction Ratio: >5:1
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflection p-pol: <20%
Reflection s-pol, %: >98%
S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm
Surface quality, S-D: 20-10
Configuration: Max Rs
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Wavelength, nm: 750-850 (centered @ 800 nm)
Wedge / Parallelism error: 1° (±5 arcmin)

Angle of Incidence (AOI), °: 72 (±2)
Clear Aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.1) x 3 (±0.1)
Extinction Ratio: >60:1
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflection p-pol: <1%
Reflection s-pol, %: >85%
S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm
Surface quality, S-D: 20-10
Configuration: Max R contrast
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Wavelength, nm: 980-1090 (centered @ 1030 nm)
Wedge / Parallelism error: 1° (±5 arcmin)

Angle of Incidence (AOI), °: 72 (±2)
Clear Aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.1) x 3 (±0.1)
Extinction Ratio: >20:1
Material: UVFS
Parallelism error: <30 arcsec
Protective chamfers: <0.25 mm x 45°
S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm
Surface quality, S-D: 20-10
Configuration: Max T contrast
Transmission p-pol: >85%
Transmission s-pol: <4%
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Wavelength, nm: 980-1090 (centered @ 1030 nm)

Angle of Incidence (AOI), °: 72 (±2)
Clear Aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.1) x 3 (±0.1)
Extinction Ratio: >20:1
Material: UVFS
Parallelism error: <1 arcmin
Protective chamfers: <0.25 mm x 45°
S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm
Surface quality, S-D: 20-10
Configuration: Max T contrast
Transmission p-pol: >85%
Transmission s-pol: <4%
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Wavelength, nm: 750-850 (centered @ 800 nm)

Angle of Incidence (AOI), °: 72
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25.4
Extinction Ratio: >9:1
Material: UVFS
Surface quality, S-D: 20-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Configuration: T1 Transmission Tp optimized
Transmission p-pol, %: >92
Transmission s-pol, %: <10
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Wavelength, nm: 750-850
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: 72
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 20 x 60
Material: UVFS
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 2
Configuration: R2 Reflection Contrast optimized
Transmission p-pol, %: 96-98
Transmission s-pol, %: <15
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Wavelength, nm: 750-850

Angle of Incidence (AOI), °: 72
Clear aperture: >90
Dimensions, mm: 20 x 60
Extinction Ratio: >20:1
Material: UVFS
Surface quality, S-D: 60-40
Thickness, mm: 2
Configuration: T2 Transmission Contrast optimized
Transmission p-pol, %: >85
Transmission s-pol, %: <4
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Wavelength, nm: 750-850
Wedge / Parallelism error: 1° (±5 acmin)

Angle of Incidence (AOI), °: 72
Clear aperture: >90
Dimensions, mm: 20 x 60
Extinction Ratio: >20:1
Material: UVFS
Surface quality, S-D: 40-20
Thickness, mm: 2
Configuration: T2 Transmission Contrast optimized
Transmission p-pol, %: >85
Transmission s-pol, %: <4
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Wavelength, nm: 750-850
Wedge / Parallelism error: 1° (±5 acmin)

Angle of Incidence (AOI), °: 72
Clear aperture: >90
Dimensions, mm: 20 x 60
Extinction Ratio: >20:1
Material: UVFS
Surface quality, S-D: 40-20
Thickness, mm: 2
Configuration: T2 Transmission Contrast optimized
Transmission p-pol, %: >85
Transmission s-pol, %: <4
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Wavelength, nm: 750-850
Wedge / Parallelism error: 1° (±5 acmin)