Product ID Specifications Price Qty In Stock Qty Buy
9317861
Coatings:
Diameter, mm: 25.4 +0/-0.1 mm
S1: [email protected] (R>99.5%) 694.3 + (R>80%)633nm AOI=45deg
S2: polished, uncoated
Surface quality: 20-10 S-D
Thickness, mm: 3 +/- 0.1 mm
Comment: Lambda/8
Comment: Material BK7
85.00
1
9301300
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25.4
Material: BK7
Reflectivity, %: >99.5
S1 Surface quality, S-D: 20-10
S1 Flatness, PV IR S2 Flatness, PV: <λ/8
Thickness tolerance, mm: ±0.1
Thickness, mm: 6
Wavelength, nm: 532 + 1064
Wedge / Parallelism error: <1 arcmin
83.00
29
9301280
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions, mm: 12.7
Material: UVFS
Reflectivity, %: >99.5
S1 Surface quality, S-D: 20-10
S1 Flatness, PV IR S2 Flatness, PV: <λ/8
Thickness, mm: 6
Wavelength, nm: 515 + 1030
Wedge / Parallelism error: <1 arcmin
98.00
7
9301260
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions, mm: 12.7
Material: UVFS
Reflectivity, %: >99.5
S1 Surface quality, S-D: 20-10
S1 Flatness, PV IR S2 Flatness, PV: <λ/8
Thickness, mm: 6
Wavelength, nm: 258+343
Wedge / Parallelism error: <1 arcmin
78.00
3
9301220
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions, mm: 25.4
Material: UVFS
Reflectivity, %: >99.5
S1 Surface quality, S-D: 20-10
S1 Flatness, PV IR S2 Flatness, PV: <λ/8
Thickness, mm: 6
Wavelength, nm: 258+343
Wedge / Parallelism error: <1 arcmin
82.00
3
9301180
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions, mm: 25
Material: BK7
S1 Surface quality, S-D: 40-20
S1 Flatness, PV IR S2 Flatness, PV: <λ/8
Thickness, mm: 3
Wavelength, nm: 532 + 1064
Wedge / Parallelism error: <1 arcmin
64.00
2
9301040
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions, mm: 25.4
Material: BK7
Reflectivity, %: >80/>99.5
S1 Surface quality, S-D: 20-10
S1 Flatness, PV IR S2 Flatness, PV: <λ/4
Thickness, mm: 5
Wavelength, nm: 633 + 1064
Wedge / Parallelism error: <1 arcmin
49.00
11
9301030
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25.4
Material: IRFS
Reflectivity, %: >99.8
S1 Flatness, PV: <λ/10 @ 632.8 nm
S1 Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Wavelength, nm: 1940 + 2064
120.00
1
9300990
Angle of Incidence (AOI), °: 0
Clear Aperture: >90
Dimensions, mm: Ø12.7 (+0/-0.1) x 5 (±0.1)
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflectivity, %: >99.5
Surface quality, S-D: 20-10
Wavelength, nm: 266+532
Wedge / Parallelism error: <1 arcmin
104.00
4
9319861
Angle of Incidence (AOI), °: 45
Dimensions, mm: 25.4
Dimensions A x B x C, mm:
Material: BK7
Reflectivity, %: 98-99
S1 Surface quality, S-D: 20-10
Shape: Round
Material: UVFS
Thickness, mm: 6
Wavelength, nm: 1064+532+355+266
127.00
1
9322412
Angle of Incidence (AOI), °: 42.5-47.5
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 7 x 10
Material: UVFS
Reflectivity, %: >85/>99.4
S1 Surface quality, S-D: 60-40
S1 Flatness, PV IR S2 Flatness, PV: <λ
Thickness tolerance, mm: ±0.1
Thickness, mm: 1
Wavelength, nm: 635 + 1550
Wedge / Parallelism error: <1 arcmin
59.00
1
9323982
Angle of Incidence (AOI), °: 0-10
Clear aperture: >90
Dimensions, mm: 12.7
Material: BK7
ROC S1, mm: -300
Reflectivity, %: >99
S1 Surface quality, S-D: 40-20
S1 Flatness, PV IR S2 Flatness, PV: <λ/4
Thickness, mm: 6
Wavelength, nm: 258+343
Wedge / Parallelism error: <1 arcmin
78.00
2
9324782
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions, mm: 12.7
Material: BK7
Reflectivity, %: >99
S1 Surface quality, S-D: 20-10
S1 Flatness, PV IR S2 Flatness, PV: <λ/8
Thickness, mm: 3
Wavelength, nm: 515 + 1030
Wedge / Parallelism error: <1 arcmin
81.00
2
9326592
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25.4
Material: BK7
Protective chamfers: <0.25 mm x 45°
Reflectivity, %: >99.5/>99.0
S1 Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 6
Wavelength, nm: 532 + 1064
Wedge / Parallelism error: <1 arcmin
104.00
2
9326792
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions, mm: 25.4
Material: UVFS
Reflectivity, %: >99.5
S1 Surface quality, S-D: 20-10
S1 Flatness, PV IR S2 Flatness, PV: <λ/8
Thickness, mm: 5
Wavelength, nm: 343+515+1030
Wedge / Parallelism error: <1 arcmin
138.00
2
9326812
Angle of Incidence (AOI), °: 0-4
Clear aperture: >90
Dimensions tolerance, mm: +0.0/-1.25
Dimensions, mm: 250
Material: Pyrex
ROC S1, mm: +2200
Reflectivity, %: >90/>99
S1 Surface quality, S-D: 60-40
S1 Flatness, PV IR S2 Flatness, PV: <λ
Thickness tolerance, mm: ±0.1
Thickness, mm: 30
Wavelength, nm: 380-550 + 1064
1,460.00
1
9326822
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions, mm: 38.1
Material: BK7
Reflectivity, %: >80/>99.5
S1 Surface quality, S-D: 20-10
S1 Flatness, PV IR S2 Flatness, PV: <λ/4
Thickness, mm: 6
Wavelength, nm: 632 + 1064
Wedge / Parallelism error: <1 arcmin
70.00
1
9327312
Angle of Incidence (AOI), °: 44-46
Clear aperture: >90
Dimensions, mm: 10 x 15
Material: UVFS
Reflectivity, %: >99.5
S1 Surface quality, S-D: 20-5
S1 Flatness, PV IR S2 Flatness, PV: <λ/10
Thickness, mm: 5
Wavelength, nm: 509-517 + 1015-1040
Wedge / Parallelism error: <1 arcmin
80.00
1
9327372
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions, mm: 19.05
Material: BK7
Reflectivity, %: >99.5
S1 Surface quality, S-D: 20-10
S1 Flatness, PV IR S2 Flatness, PV: <λ/8
Thickness, mm: 3
Wavelength, nm: 532 + 1064
Wedge / Parallelism error: <1 arcmin
78.00
1
9327502
Angle of Incidence (AOI), °: 15
Clear aperture: >90
Dimensions, mm: 25.4
Material: UVFS
ROC S1, mm: -500
Reflectivity, %: >99.5
S1 Surface quality, S-D: 20-10
S1 Flatness, PV IR S2 Flatness, PV: <λ/8
Wavelength, nm: 633 + 1064
78.00
2
9328282
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25.4
Material: BK7
Reflectivity, %: >80/>99.5
S1 Surface quality, S-D: 20-10
S1 Flatness, PV IR S2 Flatness, PV: <λ/8
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Wavelength, nm: 633 + 694.3
Wedge / Parallelism error: <1 arcmin
72.00
4
9333003
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions, mm: 25.4
Material: UVFS
Reflectivity, %: >98
S1 Surface quality, S-D: 20-10
S1 Flatness, PV IR S2 Flatness, PV: <λ/8
Thickness, mm: 5
Wavelength, nm: 355+532+1064
Wedge / Parallelism error: <1 arcmin
130.00
1
9334153
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions, mm: 25.4
Material: UVFS
Reflectivity, %: >99
S1 Surface quality, S-D: 20-10
S1 Flatness, PV IR S2 Flatness, PV: <λ/10
Thickness, mm: 3
Wavelength, nm: 257-266 + 515-532
Wedge / Parallelism error: <1 arcmin
105.00
5
9334163
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions, mm: 25.4
Material: UVFS
Reflectivity, %: >99.5
S1 Surface quality, S-D: 40-20
S1 Flatness, PV IR S2 Flatness, PV: <λ/8
Thickness, mm: 3
Wavelength, nm: 355+532+1064
Wedge / Parallelism error: <1 arcmin
39.00
1
9334363
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions, mm: 25.4
Material: UVFS
Reflectivity, %: >99
S1 Surface quality, S-D: 20-10
S1 Flatness, PV IR S2 Flatness, PV: <λ/8
Thickness, mm: 6
Wavelength, nm: 355+1064
Wedge / Parallelism error: <1 arcmin
89.00
1
9334483
Angle of Incidence (AOI), °: 0
Clear aperture: >90
Dimensions, mm: 25.4
Material: UVFS
Reflectivity, %: >99.5
S1 Surface quality, S-D: 20-10
S1 Flatness, PV IR S2 Flatness, PV: <λ/6
Thickness, mm: 6
Wavelength, nm: 515 + 1030
Wedge / Parallelism error: <1 arcmin
154.00
3
9334493
Angle of Incidence (AOI), °: 0
Clear aperture: >90
Dimensions, mm: 25.4
Material: UVFS
ROC S1, mm: -400
Reflectivity, %: >99.5
S1 Surface quality, S-D: 20-10
S1 Flatness, PV IR S2 Flatness, PV: <λ/8
Thickness, mm: 6
Wavelength, nm: 355+532+1064
238.00
1
9336793
Angle of Incidence (AOI), °: 45
Clear Aperture: 85
Dimensions, mm: Ø50.8
Material: UVFS
Reflectivity, %: 97%
S1 Surface quality, S-D: 20-10
Surface quality, S-D: 20-10
Thickness, mm: 6.35
Wavelength, nm: 1064+532+355+266
Wedge / Parallelism error: <10 arcsec
419.00
1
9337673
Angle of Incidence (AOI), °: 0
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25.4
Material: UVFS
Reflectivity, %: >99.6
S1 Flatness, PV: <λ/8 @ 632.8 nm
S1 Surface quality, S-D: 20-10
Thickness, mm: 5
Wavelength, nm: 532 + 561
Wedge / Parallelism error: <1 arcmin
175.00
1
9339473
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions, mm: 25.4
Material: UVFS
Reflectivity, %: >98
S1 Surface quality, S-D: 20-10
S1 Flatness, PV IR S2 Flatness, PV: <λ/8
Thickness, mm: 5
Wavelength, nm: 400-415+765-785+1530-1570
Wedge / Parallelism error: <1 arcmin
278.00
5
9344274
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 12.7
Material: UVFS
Reflectivity, %: >97
S1 Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Wavelength, nm: 266+355+532+1064
Wedge / Parallelism error: <10 arcsec
111.00
2
9344464
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25.4
Material: BK7
Reflectivity, %: >80/>99.5
S1 Surface quality, S-D: 20-10
S1 Flatness, PV IR S2 Flatness, PV: <λ/8
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Wavelength, nm: 633 + 694.3
Wedge / Parallelism error: <1 arcmin
58.00
3
9344624
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions, mm: 25.4
Material: BK7
Reflectivity, %: >80/>99.5
S1 Surface quality, S-D: 40-20
S1 Flatness, PV IR S2 Flatness, PV: <λ/8
Thickness, mm: 3
Wavelength, nm: 633 + 694.3
Wedge / Parallelism error: <1 arcmin
46.00
9
9344764
Angle of Incidence (AOI), °: 45
Clear aperture: 83
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 38.1
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflectivity, %: >99.5
S1 Flatness, PV: <λ/8 @ 632.8 nm
S1 Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 8
Wavelength, nm: 532 + 1064
Wedge / Parallelism error: <1 arcmin
45.00
1
9345254
Angle of Incidence (AOI), °: 0
Clear aperture: >90
Dimensions, mm: 12.7
Material: UVFS
ROC S1, mm: -100
Reflectivity, %: >99.5
S1 Surface quality, S-D: 40-20
Thickness, mm: 3
Wavelength, nm: 780 + 1560
145.00
1
9345264
Angle of Incidence (AOI), °: 0
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 21
Material: UVFS
ROC S1, mm: -100
Reflectivity, %: >99.5
S1 Surface quality, S-D: 40-20
Thickness, mm: 3
Wavelength, nm: 425 + 461
145.00
1
9346684
Clear Aperture: >90
Coatings:
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Material: UVFS
Parallelism error: <1 arcmin
Protective chamfers: <0.25 mm x 45°
S1: HR(R>99.5%)@1030 + 515 nm, AOI = 45°
S2: uncoated
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Surface quality, S-D: 20-10
111.00
4
9346704
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25.4
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflectivity, %: >99.5
S1 Flatness, PV: <λ/8 @ 632.8 nm
S1 Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Wavelength, nm: 515+1030
Wedge / Parallelism error: <1 arcmin
89.00
2
9346844
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 12.7
Material: UVFS
Reflectivity, %: >99.5
S1 Surface quality, S-D: 40-20
Thickness, mm: 5
Wavelength, nm: 515 + 1030
Wedge / Parallelism error: <1 arcmin
75.00
3
9353235
Angle of Incidence (AOI), °: -
Central wavelength, nm: -
Clear aperture:
Comments: -
Dimensions tolerance, mm:
Dimensions, mm: Ø10
Dimensions, mm: 25.4x2
Material: MgF2
Protective chamfers:
ROC S1, mm: -
Reflectivity, %: >99.5/>99.0
S1 Flatness, PV:
S1 Surface quality, S-D:
Shape: -
Material: -
S1 Flatness, PV IR S2 Flatness, PV: -
Surface quality, S-D: -
Thickness tolerance, mm:
Thickness, mm: -
Configuration: -
Wavelength, nm: 3300
Wedge / Parallelism error: <0.5 deg
Wedge / Parallelism error: -
104.00
8
9354925
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions, mm: 25.4
Material: UVFS
Reflectivity, %: >99.5
S1 Surface quality, S-D: 40-20
S1 Flatness, PV IR S2 Flatness, PV: <λ/8
Thickness, mm: 5
Wavelength, nm: 515 + 1030
59.00
2
9360596
Angle of Incidence (AOI), °: 0
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.15)
Dimensions, mm: 12.7
Material: BK7
ROC S1, mm: -500
Reflectivity, %: >99
S1 Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.3
Thickness, mm: 6
Wavelength, nm: 355 + 1064
90.00
15
9372267
Angle of Incidence (AOI), °: 0
Clear aperture: >90
Dimensions, mm: 25.4
Material: UVFS
Reflectivity, %: >99
S1 Surface quality, S-D: 20-10
S1 Flatness, PV IR S2 Flatness, PV: <λ/10
Thickness, mm: 6
Wavelength, nm: 532 + 1064
Wedge / Parallelism error: <1 arcmin
120.00
5
9377327
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions, mm: 12.7
Material: UVFS
Reflectivity, %: >99.5
S1 Surface quality, S-D: 40-20
Thickness, mm: 5
Wavelength, nm: 507-520+1015-1040
Wedge / Parallelism error: 0.5 deg (+/-5arcmin)
30.00
12
9377367
Angle of Incidence (AOI), °: 45
Clear aperture: >85
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 12.7
Material: UVFS
Reflectivity, %: >97
S1 Flatness, PV: <λ/8 @ 632.8 nm
S1 Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Wavelength, nm: 266+355+532+1064
Wedge / Parallelism error: <10 arcsec
87.00
22
9377797
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions, mm: 12.7
Material: UVFS
Reflectivity, %: >99.5
S1 Surface quality, S-D: 40-20
Thickness, mm: 5
Wavelength, nm: 507-520+1015-1040
Wedge / Parallelism error: 0.5 deg (+/-5arcmin)
30.00
14
9379027
Angle of Incidence (AOI), °: 45
Clear aperture: 85
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25.4
Material: IRFS
Reflectivity, %: >99.8
S1 Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Wavelength, nm: 1940 + 2064
Wedge / Parallelism error: <0.5 deg
102.00
1
9390399
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 10 x 15
Material: UVFS
Protective chamfers: 0.1-0.3 mm x 45°
Reflectivity, %: Rp>99,5%
S1 Flatness, PV: <λ/6 @ 632.8 nm
S1 Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Wavelength, nm: 509-517+1015-1040
Wedge / Parallelism error: <1 arcmin
50.00
6
9390419
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions, mm: 12.7
Material: UVFS
Reflectivity, %: >99.5
S1 Surface quality, S-D: 40-20
Thickness, mm: 5
Wavelength, nm: 507-520+1015-1040
Wedge / Parallelism error: 0.5 deg (+/-5arcmin)
30.00
10
9390519
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 12 x 15
Material: UVFS
Reflectivity, %: >99.5
S1 Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Wavelength, nm: 509-517 + 1015-1040
Wedge / Parallelism error: <1 arcmin
40.00
12
9390529
Angle of Incidence (AOI), °: 43-47
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 12 x 15
Material: UVFS
Protective chamfers: 0.1-0.3 mm x 45°
Reflectivity, %: Rp>99.5
S1 Flatness, PV: <λ/6 @ 632.8 nm
S1 Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Wavelength, nm: 507-520+1015-1040
Wedge / Parallelism error: <1 arcmin
40.00
28
9390549
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 15
Material: UVFS
Reflectivity, %: >99
S1 Flatness, PV: <λ/8 @ 632.8 nm
S1 Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Wavelength, nm: 266+532
Wedge / Parallelism error: <1 arcmin
55.00
10
9390909
S1: [email protected][email protected], HRp>99,5%, i=43-47deg, L/6 on CA10mm, 20/5 S/D, high demage threshold;
S2: uncoated
Comment: S2 facets 0,1-0,3mm
Comment: TO-M15W05I45D25
Comment: UVFS plane mirror, D12.7(+0,0/-0,1mm)x5mm (IBS)
Comment: wedge 0.5deg(+/-5arcmin),
61.00
27
9390939
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 12 x 15
Material: UVFS
Reflectivity, %: >99.5
S1 Surface quality, S-D: 60-40
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Wavelength, nm: 509-517 + 1015-1040
Wedge / Parallelism error: <1 arcmin
32.00
8
9390949
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 12 x 15
Material: UVFS
Reflectivity, %: >99.5
S1 Surface quality, S-D: 80-50
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Wavelength, nm: 509-517 + 1015-1040
Wedge / Parallelism error: <1 arcmin
26.00
4
9390959
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 12 x 15
Material: UVFS
Reflectivity, %: >99.5
S1 Surface quality, S-D: 120-80
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Wavelength, nm: 509-517 + 1015-1040
Wedge / Parallelism error: <1 arcmin
21.00
1
9391059
Dimensions, mm: 12.7
S1: [email protected][email protected], HRp>99,5%, i=43-47deg, L/6 on CA10mm, 20/5 S/D, high demage threshold;
S2: uncoated
Material: UVFS
Comment: S2 facets 0,1-0,3mm
Comment: wedge 0.5deg(+/-5arcmin),
43.00
1
9391859
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions, mm: 30
Material: BK7
Reflectivity, %: >80/>99.5
S1 Surface quality, S-D: 20-10
Thickness, mm: 6
Wavelength, nm: 632 + 1064
Wedge / Parallelism error: <1 arcmin
53.00
45
9392699
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25.4
Material: UVFS
Reflectivity, %: >99.8
S1 Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Wavelength, nm: 633 + 1064
Wedge / Parallelism error: <1 arcmin
111.00
1
9392709
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25.4
Material: UVFS
Reflectivity, %: >99.8
S1 Surface quality, S-D: 60-40
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Wavelength, nm: 633 + 1064
Wedge / Parallelism error: <1 arcmin
111.00
1
9392719
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25.4
Material: UVFS
Reflectivity, %: >99.8
S1 Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Wavelength, nm: 633 + 1064
Wedge / Parallelism error: <1 arcmin
111.00
3
9394139
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 50.8
Material: UVFS
Reflectivity, %: >98.7
S1 Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 6
Wavelength, nm: 480-515 + 920-1050
Wedge / Parallelism error: <30 arcsec
90.00
2
9394889
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions, mm: 50.8
Material: UVFS
Reflectivity, %: >97.5/>95
S1 Surface quality, S-D: 60-40
Thickness, mm: 9
Wavelength, nm: 266+543
Wedge / Parallelism error: <1 arcmin
217.00
4
9395629
Angle of Incidence (AOI), °: 43-47
Clear aperture: >90
Dimensions, mm: 12.7
Material: UVFS
Reflectivity, %: >99.5
S1 Surface quality, S-D: 20-10
Thickness, mm: 5
Wavelength, nm: 507-520+1015-1040
Wedge / Parallelism error: 0.5 deg (+/-5arcmin)
55.00
1
9395639
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions, mm: 12.7
Material: UVFS
Reflectivity, %: >99.5
S1 Surface quality, S-D: 40-20
Thickness, mm: 5
Wavelength, nm: 507-520+1015-1040
Wedge / Parallelism error: 0.5 deg (+/-5arcmin)
31.00
31
9395649
Angle of Incidence (AOI), °: 43-47
Clear aperture: >90
Dimensions, mm: 12.7
Material: UVFS
Reflectivity, %: >99.5
S1 Surface quality, S-D: 60-40
Thickness, mm: 5
Wavelength, nm: 507-520+1015-1040
Wedge / Parallelism error: 0.5 deg (+/-5arcmin)
30.00
2
9396999
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 12 x 15
Material: UVFS
Reflectivity, %: >99.5/>99.0
S1 Surface quality, S-D: 60-40
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Wavelength, nm: 509-517 + 1015-1040
Wedge / Parallelism error: <1 arcmin
32.00
3
9397009
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 12 x 15
Material: UVFS
Reflectivity, %: >99.5
S1 Surface quality, S-D: 80-50
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Wavelength, nm: 509-517 + 1015-1040
Wedge / Parallelism error: <1 arcmin
22.00
3
9398269
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25.4
Material: BK7
Reflectivity, %: >99
S1 Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 6
Wavelength, nm: 1100 + 1550
Wedge / Parallelism error: <1 arcmin
84.00
1
9399089
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions tolerance, mm: +0/-0.2
Dimensions, mm: 12.5
Material: UVFS
Reflectivity, %: >97
S1 Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Wavelength, nm: 500-530 + 780-820
Wedge / Parallelism error: <30 arcsec
116.00
3
9402640
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions, mm: 25.4
Material: BK7
ROC S1, mm: -10000
Reflectivity, %: >80/>99.5
Thickness, mm: 6.35
Wavelength, nm: 633 + 694.3
84.00
1
9404830
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 15
Material: UVFS
Reflectivity, %: >99
S1 Flatness, PV: <λ/8 @ 632.8 nm
S1 Surface quality, S-D: 20-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Wavelength, nm: 266+532
Wedge / Parallelism error: <1 arcmin
57.00
3
9405830
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25.4
Material: UVFS
Reflectivity, %: >99/>99.5
S1 Flatness, PV: <λ/8 @ 632.8 nm
S1 Surface quality, S-D: 20-40
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Wavelength, nm: 355 + 1064
Wedge / Parallelism error: <1 arcmin
69.00
2
9406100
Angle of Incidence (AOI), °: 0
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 12.7
Material: UVFS
Reflectivity, %: >99.8
S1 Flatness, PV: <λ/8 @ 632.8 nm
S1 Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Wavelength, nm: 610-630 + 1220-1260
Wedge / Parallelism error: 30 arcmin
88.00
5
9410411
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 12.7
Material: UVFS
Reflectivity, %: >97
S1 Flatness, PV: <λ/8 @ 632.8 nm
S1 Surface quality, S-D: 20-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Wavelength, nm: 266+355+532+1064
Wedge / Parallelism error: <10 arcsec
75.00
9
9410421
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 12.7
Material: UVFS
Reflectivity, %: >97
S1 Flatness, PV: <λ/8 @ 632.8 nm
S1 Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Wavelength, nm: 266+355+532+1064
Wedge / Parallelism error: <10 arcsec
94.00
9
9410431
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 12.7
Material: UVFS
Reflectivity, %: >97
S1 Flatness, PV: <λ/8 @ 632.8 nm
S1 Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Wavelength, nm: 266+355+532+1064
Wedge / Parallelism error: <10 arcsec
94.00
20
9413931
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions, mm: 25
Material: BK7
Reflectivity, %: >99
S1 Surface quality, S-D: 40-40
Thickness, mm: 3
Wavelength, nm: 532 + 1064
Wedge / Parallelism error: <1 arcmin
71.00
2
9414551
Angle of Incidence (AOI), °: 22.5 deg
Clear aperture: >90
Dimensions, mm: 12.7
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflectivity, %: >99.5
S1 Flatness, PV: <λ/8 @ 632.8 nm
S1 Surface quality, S-D: 20-10
Thickness, mm: 5
Wavelength, nm: 775+1550
94.00
5
9414611
Angle of Incidence (AOI), °: 0
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25.4
Material: BK7
Protective chamfers: <0.25 mm x 45°
Reflectivity, %: >99.5
S1 Flatness, PV: <λ/8 @ 632.8 nm
S1 Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 6
Wavelength, nm: 515 + 1030
Wedge / Parallelism error: <1 arcmin
104.00
2
9415691
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflectivity, %: >99.5
S1 Flatness, PV: <λ/8 @ 632.8 nm
S1 Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 3.5
Wavelength, nm: 355+532
Wedge / Parallelism error: <1 arcmin
131.00
2
9416441
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions, mm: 25.4
Material: UVFS
Reflectivity, %: >99
S1 Flatness, PV: <λ/2 @ 632.8 nm
S1 Surface quality, S-D: 40-20
Thickness, mm: 5
Wavelength, nm: 660 + 1560
Wedge / Parallelism error: <30 arcsec
345.00
1
9426622
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25.4
Material: UVFS
Reflectivity, %: >99.5/>99.0
S1 Surface quality, S-D: 20-40
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Wavelength, nm: 266+532
Wedge / Parallelism error: <1 arcmin
83.00
6
9426632
Angle of Incidence (AOI), °: 45
Clear aperture: 82
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25.4
Material: UVFS
Reflectivity, %: >98.5
S1 Flatness, PV: <λ/8 @ 632.8 nm
S1 Surface quality, S-D: 20-40
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Wavelength, nm: 266+532
Wedge / Parallelism error: <1 arcmin
83.00
2
9435883
Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions, mm: 30
Material: BK7
Reflectivity, %: >80/>99.5
S1 Surface quality, S-D: 20-10
Thickness, mm: 6
Wavelength, nm: 632 + 1064
Wedge / Parallelism error: <1 arcmin
44.00
44
9525342
Angle of Incidence (AOI), °: 45
Clear Aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Material: UVFS
Parallelism error: <1 arcmin
Protective chamfers: <0.25 mm x 45°
Reflectivity, %: Rs>99.3; Rp>98.5
Surface quality, S-D: 20-10
Wavelength, nm: 355+1064
125.00
20
9525362
Angle of Incidence (AOI), °: 45
Clear Aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Material: UVFS
Parallelism error: <1 arcmin
Protective chamfers: <0.25 mm x 45°
Reflectivity, %: Rs>99.3; Rp>98.5
Surface quality, S-D: 20-10
Wavelength, nm: 355+532
125.00
1
9525412
Angle of Incidence (AOI), °: 45
Clear Aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Material: UVFS
Parallelism error: <1 arcmin
Protective chamfers: <0.25 mm x 45°
Reflectivity, %: Rs>99.3; Rp>98.5
Surface quality, S-D: 20-10
Wavelength, nm: 266+532
125.00
7
9525622
Angle of Incidence (AOI), °: 0
Clear Aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Material: UVFS
Parallelism error: <1 arcmin
Protective chamfers: <0.25 mm x 45°
Reflectivity, %: R>99.5
Surface quality, S-D: 20-10
Wavelength, nm: 515+1030
104.00
2
9525822
Angle of Incidence (AOI), °: 45
Clear Aperture: >90
Dimensions, mm: Ø12.7 (+0/-0.1) x 5 (±0.1)
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Material: UVFS
Parallelism error: <1 arcmin
Protective chamfers: <0.25 mm x 45°
Reflectivity, %: Rs>99.3; Rp>98.5
Surface quality, S-D: 20-10
Wavelength, nm: 515+1030
94.00
53
9525862
Angle of Incidence (AOI), °: 45
Clear Aperture: >90
Dimensions, mm: Ø12.7 (+0/-0.1) x 5 (±0.1)
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Material: UVFS
Parallelism error: <1 arcmin
Protective chamfers: <0.25 mm x 45°
Reflectivity, %: Rs>99.3; Rp>98.5
Surface quality, S-D: 20-10
Wavelength, nm: 510-532+1020-1070
125.00
2
9542634
Clear aperture: >90 %
Coatings:
Diameter, mm: 25.4 (+0/-0.1 mm)
Material: UVFS
Protective chamfers: <0.25 mm x 45°
S1: HR>98.5% @ 258 nm+HR>99.5% @ 387 nm, AOI=45°
S2: uncoated
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Surface quality: 20-10 S-D
Thickness, mm: 5 (±0.1 mm)
100.00
1
9553555
Angle of Incidence (AOI), °: 45
Clear Aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Material: UVFS
Parallelism error: <1 arcmin
Protective chamfers: <0.25 mm x 45°
Reflectivity, %: Rs>99.3; Rp>98.5
Surface quality, S-D: 20-10
Wavelength, nm: 400+800
125.00
3
9554985
Angle of Incidence (AOI), °: 45
Clear Aperture: >90
Coating: DHR(Rs>99.3%; Rp>98.5%)@515+1030nm
Dimensions, mm: Ø25.4 (+0/-0.1) x 6 (±0.1)
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Material: BK7
Parallelism error: <1 arcmin
Protective chamfers: <0.25 mm x 45°
Surface quality, S-D: 20-10
104.00
1
9580948
Clear aperture: >5,2 mm
Coatings:
Diameter, mm: 6.0 mm (+0/-0.1 mm)
Material: UVFS (C7980)
Parallelism error: <1 arcmin
Protective chamfers: 0.1 – 0.2 mm x 45 deg
S1 (arrow marks): HR>99.85%@640nm +HR>99.5%@320nm, AOI=0 deg
S2: Uncoated
S1 Flatness, PV IR S2 Flatness, PV: λ/4 @ 633 nm
Surface quality, S1/S2: 20-10 S-D
Thickness, mm: 2.0 mm (+/-0.1 mm
53.00
10
Total: $0.00
Ex Tax: $0.00
0

These multilayer coatings are stacks intended to achieve the highest possible reflectivity at two specific laser line wavelengths at normal or 45˚. Laser line high reflectivity coatings are intended for external beam manipulation applications where even slight losses may be intolerable.

Coatings are provided by Ion Beam Sputtering (IBS) or Electron beam evaporation with/without Ion assistance coating techniques.

Dual Laser Line reflecting mirrors (DHR)

  • Product Code: DHR
  • Availability: In Stock




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