Search results for: 'caf2'"'

Dimensions, mm: 12.7
Wedge / Parallelism error: 40 +/-5 arcmin

Material: CaF2
Clear aperture: >90
Thickness, mm: 3

Parallelism error: <1 arcmin
Surface quality S1/S2, S-D: 20-10

Thickness, mm: 1 (±0.1)
S1 Flatness, PV IR S2 Flatness, PV: λ/2@ 633 nm
Diameter, mm: 6 (+0/-0.1)
Clear Aperture: >85
Protective chamfers: 0.1-0.2 mm x 45°
Chips: <0.1 mm
Material: CaF2 (Hellma 193 nm grade)

Parallelism error: <1 arcmin
Material: CaF2 (DUV grade)

Thickness, mm: 1 (±0.1)
Surface quality S1/S2, S-D: 20-10
Diameter, mm: 6 (+0/-0.1)
Protective chamfers: 0.1-0.2 mm x 45°
Clear Aperture: >85
Chips: <0.1 mm
S1 Flatness, PV IR S2 Flatness, PV: λ/2@ 633 nm

Drawing: LP2216-2_rev00
Chips: <0.1 mm

Wedge (marked with arrow, ^): 0.2° (±0.1°)
Thickness, mm: 1 (±0.1)
Surface quality S1/S2, S-D: 20-10
S1 Flatness, PV IR S2 Flatness, PV: <λ/2@ 632.8 nm
Material: CaF2 (DUV grade)
Dimensions, mm: 6 x 6 (+0/-0.1)
Clear Aperture: >90
Protective chamfers: 0.1-0.2 mm x 45°

S1 Flatness, PV IR S2 Flatness, PV: < L/6 @ 633 nm over clear aperture
Transmitted wavefront distortion, PV: < L/8 @ 633 nm over clear aperture

Thickness thick: 3 mm (+/-0.05 mm)
Surface roughness (RMS): < 10 angstrom
Surface quality, S1/S2: 20-10 S-D
Parallelism error: < 1 arcmin
Material: CaF2 from Hellma (supplied by Altechna)
Diameter, mm: 25.4 mm (+0/-0.1 mm)
Chips: < 0.2 mm
Clear aperture: >21.5 mm diameter central area
Protective chamfers: 0.1-0.3 mm x 45 deg

Protective chamfers: <0.25 mm x 45°
Clear aperture: >90%

Transmitted WFD P-V: <λ/8 @ 633nm CA
Surface quality, S1-S2: 40-20
Parallelism error: <1 arcmin
Material: CaF2--------UV grade
Flatness, P-V: <λ/4 @ 633nm CA
Dimensions, mm: 20x40 mm (+0.0/-0.1 mm)
Thickness, mm: 5 mm (+/- 0.1 mm)

AR coatings: uncoated
Dimensions, mm: 25 x 25

Dimensions, mm: 25x25
Focal length, mm: +400
Material: CaF2

Center thickness, mm: 10
Coatings: uncoated

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 20 x 20
Focal length, mm: +20
Material: CaF2
Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1

Center thickness, mm: 1.6
Centration error: <2 arcmin

Coatings: uncoated
Dimensions, mm: Ø12.5
Focal length tolerance, %: ±2
Focal length, mm: +150
Material: CaF2
Surface quality, S-D: 60-40

Centering: <3arcmin;
Curved face: Irregularity L/4,;

Diam: 12.5mm +0/-0.1mm
Edge thickness, mm: 1.4mm +/- 0.1mm
Material: UV grade CaF2
Plano face: Flatness L/4;

AR coatings: BBAR coated
Dimensions, mm: Ø25.4

Edge thickness, mm: 3
Focal length tolerance, %: ±3
Focal length, mm: +500
Material: CaF2
Surface quality, S-D: 60-40
Wavelength, nm: 1500-1900

Center thickness, mm: 2.30
Centration error: <3 arcmin

Coatings: uncoated
Dimensions, mm: Ø12.5
Focal length tolerance, %: ±2
Focal length, mm: +50
Material: CaF2
ROC S1, mm: +21.64
Surface quality, S-D: 60-40

AR coatings: uncoated
Center thickness, mm: 2

Centration error: <3 arcmin
Dimensions, mm: Ø12.5
Focal length tolerance, %: ±2
Focal length, mm: +75
Material: CaF2
ROC S1, mm: +32.64
Surface quality, S-D: 60-40

AR coatings: uncoated
Center thickness, mm: 1.76

Centration error: <3 arcmin
Dimensions, mm: Ø12.5
Focal length, mm: +100
Material: CaF2
ROC S1, mm: +43.53
Surface quality, S-D: 60-40

Center thickness, mm: 4.04
Clear aperture: >90

Coatings: uncoated
Dimensions tolerance, mm: (+0/-0.15)
Dimensions, mm: Ø25.4
Edge thickness, mm: 3.9
Focal length tolerance, %: ±3
Focal length, mm: +1000
Material: CAF2 IR polycrystaline
ROC S1, mm: +432.8
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1

Center thickness, mm: 2.5
Clear aperture: >90

Coatings: uncoated
Dimensions, mm: 12.5
Focal length tolerance, %: ±2
Focal length, mm: +75
Material: CaF2
Protective chamfers: <0.25 mm x 45°
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 20-10

Centration error: <3 arcmin
Clear aperture: >90

Coatings: uncoated
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: Ø25.4
Edge thickness, mm: 2
Focal length tolerance, %: ±3
Focal length, mm: +100
Material: CaF2
ROC S1, mm: +42.2
Surface quality, S-D: 60-40
Thickness tolerance, mm: ±0.1

AR coatings: uncoated
Centration error: <3 arcmin

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: Ø12.5
Edge thickness, mm: 1.4
Focal length tolerance, %: ±1
Focal length, mm: +150
Material: CaF2
ROC S1, mm: +65
Surface quality, S-D: 40-20
Thickness tolerance, mm: +/-0.1

Centration error: <3 arcmin
Clear aperture: >90

Coatings: uncoated
Wavelength, nm: 632.8
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25.4
Edge thickness, mm: 2
Focal length tolerance, %: ±3
Focal length, mm: +100
Material: CaF2
Protective chamfers: <0.25 mm x 45°
ROC S1, mm: +42.2
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 60-40
Thickness tolerance, mm: ±0.1

Angle of Incidence (AOI), °: 45
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: Ø25.4
Material: CaF2
Reflectivity, %: >99.5, <10
S1 Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 2
Wavelength, nm: 620-680/1300+2000

Angle of Incidence (AOI), °: 45
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25.4
Material: CaF2
Protective chamfers: <0.25 mm x 45°
Reflectivity, %: >99.5/ <10
S1 Flatness, PV: <λ/4 @ 632.8 nm
S1 Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 2
Wavelength, nm: 620-680 + 1300 + 2000

Clear Aperture: >90
Coating: AR/AR(Ravg<0.5%) @ 950-1100nm

Dimensions, mm: Ø25 (+0.0/-0.1)
Material: CaF2
S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm
Surface quality, S-D: 40-20
Thickness, mm: 5 (±0.1)

Surface quality, S-D: 40-20
Wedge / Parallelism error: <1 arcmin

Transmitted wavefront distortion, PV: λ/4 @ 632.8nm
Thickness, mm: 3 (±0.1)
S1: AR (R<0.5 %) @ 1030+515+343 nm, AOI=0°
Protective chamfers: <0.25 mm x 45°
Material: CaF2 (monocrystalline)
Dimensions, mm: Ø12.7 (+0/-0.1)
Coating:
S2: AR (R<0.5 %) @ 1030+515+343 nm, AOI=0°
Clear aperture %: 90

Protective chamfers: <0.25 mm x 45 deg
Surface quality, S-D: 40-20

S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Thickness, mm: 3 (±0.1)
S1: AR(R<0.5%) @ 266 nm, AOI = 0°
Material: CaF2 (random orientation)
Dimensions, mm: 15 (+0.0/-0.1 mm)
Damage threshold: >1 J/cm² @ 1 ns, 266 nm
Coatings:
Clear Aperture: 90
Parallelism error: <5 arcmin
S2: AR(R<0.5%) @ 266 nm, AOI = 0°

Surface quality S1/S2, S-D: 40-20
Thickness, mm: 1 (±0.2

S2: AR (R<0.5%) @ 266 nm, AOI = 0-5°
S1: AR (R<0.5%) @ 266 nm, AOI = 0-5°
Protective chamfers: 0.1-0.2 mm x 45°
Material: CaF2 (Hellma 193 nm grade)
LIDT: >0.5 J/cm² @ 266 nm, 1 ns
Flatness S1/S2, PV: <λ/2 @ 632.8 nm
Dimensions, mm: Ø14 (+0/-0.2)
Coatings:
Clear Aperture: >=Ø12.6 (90%)
Parallelism error: <1 arcmin

S1 Flatness, PV: <λ/2@633 nm per CA
Surface irregularity, P-V, S2: <λ/2@633 nm per CA

S2: AR<0.5% @257, AOI=0°
S1: AR<0.5% @257, AOI=0°
Protective chamfers: <0.25 mm x 45°
Material: CaF2
Edge thickness, mm: 3.0 (±0.1)
Diameter, mm: 25.4 (+0.0/-0.1)
Coatings:
Centration error: <3 arcmin
Clear aperture: >90%
Surface quality, S1/S2: 60/40 S/D
Focus length, mm: +1000.0 (±1%) @ 257 nm

Surface quality, S1/S2: 20-20 S-D
Thickness, mm: 1 (±0.1)

S1 Flatness, PV IR S2 Flatness, PV: <λ/2 @ 532 nm
S2: Rs<1.7% @ 213 nm, Rp>1%@ 266 nm, AOI=45°
S1: Rs<1.7% @ 213 nm, Rp>1%@ 266 nm, AOI=45°
Max energy density: 0.5 J/cm², at 213 nm, 1 ns
Material: CaF2 (193 nm grade, free of laser induced fluorescence at 213 nm)
Drawing: LP2216-1_rev01
Dimensions, mm: 6 x 6 (+0/-0.1)
Coatings:
Clear aperture: >85 %
Chips: <0.1 mm
Protective chamfers: 0.1-0.2 mm x 45°
Wedge, S1: 0.2° (±0.1°)

S2: AR (R<0,5%) @ 213 nm, AOI 0-5° EB1
S1: AR (R<0,5%) @ 213 nm, AOI 0-5° EB1

Wedge / Parallelism error: <1 arcmin
Thickness, mm: 2 (±0.1) mm
Protective chamfers: 45° x 0.1-0.25mm
Clear aperture: >18 mm
Material: CaF2, 193nm grade, LD-A, random orientation, single crystal
S1 Flatness, PV IR S2 Flatness, PV: λ/6 @ 632.8nm
Diameter, mm: Ø20 (+0/-0.1) mm
Surface quality: 40-20 S-D

AR coatings: uncoated
Centration error: <3 arcmin

Clear aperture: >90
Dimensions, mm: 12.5
Edge thickness, mm: 2.50
Focal length tolerance, %: ±2
Focal length, mm: -100
Material: CaF2
ROC S1, mm: -43.32
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 60-40

Angle of Incidence (AOI), °: 0
Clear aperture: >90

Dimensions, mm: 12.7
Material: CaF2
Protective chamfers: <0.25 mm x 45°
Reflectivity, %: <0.5
S1 Flatness, PV IR S2 Flatness, PV: <λ/6
Surface quality, S-D: 40-20
Thickness, mm: 3
Wavelength, nm: 2000-2700
Wedge / Parallelism error: <1 arcmin

Angle of Incidence (AOI), °: 45
Clear aperture: >90

Coatings on S1: HR(Rsp>98%) @ 2600-2800 nm + HT(Tp>95%) @ 1870 nm
Coatings on S2: AR@1870
Dimensions, mm: 25.4
Material: CaF2
S1 Flatness, PV IR S2 Flatness, PV: <λ/4
Surface quality, S-D: 40-20
Thickness, mm: 3
Wedge / Parallelism error: <1 arcmin

Chips: <0.1 mm
Clear aperture: >90 %

Coatings:
Dimensions A x B x C, mm: 7 mm x 6 mm (+0/-0.1 mm)
LIDT: >1 J/cm^2 at 1 ns, 266 nm, >5 J/cm^2 at 1 ns, 532 nm
Material: CaF2 (free of laser induced fluorescence at 266 nm)
Protective chamfers: 0.1 – 0.2 mm x 45 deg
S1(wedge, arrow marks): HRs>99.5%@ 532 nm + HTp>90%@ 266 nm, AOI=45 deg
S2(): ARp<0.3%@ 266 nm, AOI=45 deg
S1 Flatness, PV IR S2 Flatness, PV: λ/2@ 633 nm
Surface quality, S1/S2: 20-10 S-D
Thickness (at thin edge): 1 mm (+/-0.1 mm)
Wedge / Parallelism error: 0.2 deg +/-0.1 deg (along 7 mm)

Angle of Incidence (AOI), °: 45
Clear aperture: >90%

Coatings:
Diameter, mm: Ø25.4 (+0/-0.1)
Material: CaF2
S1: HR(R>99.5%)@2280nm+HT(T>95%)@1990nm
S2: AR(R>0.6%)@1990nm
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 60-40
Thickness, mm: 6 (±0.1)

S2: AR(R<0.5%)@ 3500 nm
Material: CaF2

Surface irregul arity, PV: <λ/4 @ 632.8 nm
S1: AR(R<0.5%)@ 3500 nm
Protective chamfers: <0.25 mm x 45°
Edge thickness, m m: 2 (±0.1)
Dimensions, m m: Ø12.7 (+0/-0.1)
Wavelength, nm: 3500
Coatings:
Clear Aperture: >90
Centration error: <3 arcmin
Surface quality, S-D: 40-20
Focal length, mm: +25 ±1%

Clear aperture: >90 %
Surface quality S1/S2, S-D: 40-20

Surface irregularity S1: <λ/4 @ 632.8 nm
Surface flatness S2: <λ/4 @ 632.8 nm
ROC S1, mm: ROC=-3.8 ±2%
Material: CaF2 (DUV grade, free of laser induced fluerescence at 266 nm)
Diameter, mm: 6 (+0/-0.05)
Chips: <0.2 mm
Protective chamfers: 0.1-0.3 mm x 45°
Centration error: <3 acrmin
Center thickness, mm: 2 (±0.2)
Edge thickness, mm: 3 (±0.2)

S1: AR(R<0.5%)@266nm
Surface quality, S-D: 60/40

S2: AR(R<0.5%)@266nm
ROC S1, mm: +21.7
Protective chamfers: <0.25 mm x 45°
Material: CaF2
Dimensions, mm:   Ø25.4 (+0/-0.1)
Wavelength, nm: 588
Center thickness, mm: 6.1 (±0.1)
Coatings:
Centration error: <3 arcmin
Clear Aperture: >90
Edge thickness, mm: 2.0 (±0.1)
S1 Flatness, PV IR S2 Flatness, PV:   <λ/2 @ 632.8 nm

Wavelength, nm: 588
Protective chamfers: <0.25 mm x 45°

Surface quality, S-D: 60-40
S1 Flatness, PV IR S2 Flatness, PV:   <λ/2 @ 632.8 nm
S2: AR(R<0.5%)@266nm
S1: AR(R<0.5%)@266nm
ROC S1, mm: +43.4
Center thickness, mm: 3.9 (±0.1)
Dimensions, mm:   Ø25.4 (+0/-0.1)
Centration error: <3 arcmin
Coatings:
Clear Aperture: >90
Edge thickness, mm: 2.0 (±0.1)
Material: CaF2

Material: CaF2 (DUV grade, free of laser induced fluerescence at 266 nm)
Surface quality S1/S2, S-D: 40-20

Surface irregularity S1: <λ/4@ 632.8 nm
Surface flatness S2: <λ/4 @ 632.8 nm
S2: AR(R<0.5%) @ 266 nm, AOI = 0°
ROC S1, mm: ROC=+19.1 ±0.5%
Drawing: LP1154-1_rev00
Centration error: <3 acrmin
Center thickness, mm: 3 (±0.1)
Coatings:
Clear Aperture: >90
Chips: <0.1 mm
Protective chamfers: 0.1-0.3 mm x 45°
Dimensions, mm: Ø15.0 (+0/-0.1)
S1: AR(R<0.5%) @ 266 nm, AOI = 0°

Parallelism error: <10 arcsec
Thickness, mm: 3 (±0.1)

S2: AR (Rs<0.65%) @ 2080-2100nm, AOI=40-48°
S1: PR (Rs=10±2%) @ 2080-2100nm, AOI=40-48°
S1, S2 Surface quality, S-D: 40-20
Perpendicularity: <2 arcmin
LIDT: >15 J/cm2 @ 2090nm, 10ns, 100Hz
S1 Flatness, PV IR S2 Flatness, PV: λ/6 (before coating), λ/2-λ (after coating)
Dimensions, mm: 12.7 (±0.1)
Coatings:
Clear Aperture: >Ø 10.7mm
Protective chamfers: <0.2mm x 45°
Material: Lithotec CaF2

LIDT: >1 J/cm² @ 1 ns, 266 nm, >5 J/cm² @ 1 ns, 532 nm
Thickness, mm: 1 (±0.1)

S2: AR<0.5% @ 266 nm, AOI = 0-5°
S1: HR>99.5% @ 532 nm + HT>90% @ 266 nm, AOI = 0-5°
S1/S2 Surface quality, S-D: 20-10
S1/S2 Surface flatness: λ/2@ 633 nm
Material: CaF2 (DUV grade)
Diameter, mm: 6 (+0/-0.1)
Coatings:
Clear Aperture: >85
Chips: <0.1 mm
Protective chamfers: 0.1-0.2 mm x 45°
Parallelism error: <1 arcmin

S1(): HR>99.5%@ 532 nm + HT>90%@ 266 nm, AOI=0°-5°
Protective chamfers: 0.1 – 0.2 mm x 45°

Thickness, mm: 1 mm (+/-0.1 mm)
Surface quality, S1/S2: 60-40 S-D
S1 Flatness, PV IR S2 Flatness, PV: λ/2@ 633 nm
Parallelism error: <1 arcmin
Material: CaF2 (DUV grade)
LIDT: >1 J/cm2 @ 1 ns, 266 nm, >5 J/cm2 @ 1 ns, 532 nm
Diameter, mm: 6 mm (+0/-0.1 mm)
Coatings:
Chips: <0.1 mm
Clear aperture: >85 %
S2(): AR<0.5%@ 266 nm, AOI=0°-5°

S1 Flatness, PV IR S2 Flatness, PV: λ/2 @ 633 nm
Protective chamfers: 0.1-0.2 mm x 45°

Surface quality S1/S2, S-D: 40-20
Wedge / Parallelism error: 0.2° ±0.1° (along 7 mm)
S2: ARp<0.3% @ 266 nm, AOI = 45°
S1(wedge, arrow marks): HRs>99.5% @ 532 nm + HTp>90% @ 266 nm, AOI = 45°
LIDT: >1 J/cm² at 1 ns, 266 nm, >5 J/cm² at 1 ns, 532 nm
Drawing: LP2077-2_rev00
Dimensions, mm: 7 x 6 (+0/-0.1)
Coatings:
Clear Aperture: >90
Chips: <0.1 mm
Thickness (at thin edge), mm: 1 (±0.1)
Material: CaF2 (DUV grade, free of laser induced fluorescence at 266 nm)

Material: Lithotec CaF2
S2: AR (Rs<0.65%) @ 2080-2100nm, AOI=40-48°

S1: HR (Rs>99%) @ 2080-2100nm, AOI=40-48°
S1, S2 Surface quality, S-D: 40-20
Clear Aperture: >Ø 10.7mm
Parallelism error: <10 arcsec
LIDT: >15 J/cm2 @ 2090nm, 10ns, 100Hz
S1 Flatness, PV IR S2 Flatness, PV: λ/6 (before coating), λ/2-λ (after coating)
Dimensions, mm: 12.7 (±0.1)
Coatings:
Protective chamfers: <0.2mm x 45°
Thickness, mm: 3 (±0.1)
Perpendicularity: <2 arcmin