Search results for: '24.5mm+OD' and 'x'='x'

Angle of Incidence (AOI), °: 56 +/-5
Clear Aperture: >90

Comments: -
Comments: Tp>95%. Rs>99.5%
Dimensions tolerance, mm: +0/-0.1
Dimensions, mm: 20 x 40
Dimensions A x B x C, mm: 20x40
Extinction Ratio: >200:1
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Material: UVFS
Optical material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflection s-pol, %: >99.5
Shape: Rectangular
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Transmission p-pol, %: >95
Transmission s-pol, %:
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1064
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: 55 +/-5
Clear Aperture: >90

Comments: -
Comments: Tp>95%. Rs>99.5%
Dimensions tolerance, mm: +0/-0.1
Dimensions, mm: 20 x 40
Dimensions A x B x C, mm: 20x40
Extinction Ratio: >200:1
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Material: UVFS
Optical material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflection s-pol, %: >99.5
Shape: Rectangular
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Transmission p-pol, %: >95
Transmission s-pol, %:
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1064
Wedge / Parallelism error: <30 arcsec

Reflection s-pol, %: >99.5%
Angle of Incidence (AOI), °: Brewster angle

Wavelength, nm: 355
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Transmission p-pol: >95%
Surface quality, S-D: 20-20
Parallelism error: < 30 arcsec
Material: UVFS
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Clear aperture: 15 x 26.8 mm elliptical centered
Protective chamfers: <0.25 mm x 45°
Extinction Ratio: >200:1
Dimensions, mm: 20 x 40 ( +0/-0.1) x 5 (±0.1)

Surface quality, S-D: 20-20
Wavelength, nm: 343

Transmission p-pol: >95%
Reflection s-pol, %: >99.5%
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Angle of Incidence (AOI), °: Brewster angle
CleClear aperture: 15 x 26.8 mm elliptical centered
Dimensions, mm: 20 x 40 ( +0/-0.1) x 5 (±0.1)
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Extinction Ratio: >200:1
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Parallelism error: < 30 arcsec

Wavelength, nm: 1064
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm

Transmission p-pol: >95%
Surface quality, S-D: 20-20
Parallelism error: <30 arcsec
Reflection s-pol, %: >99.5%
Material: UVFS
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Extinction Ratio: >200:1
Dimensions, mm: 20 (+0/-0.1) x 40 (+0/-0.1) x 5 (±0.1)
Protective chamfers: <0.25 mm x 45°
Clear aperture: 15 x 26.8 mm elliptical centered
Angle of Incidence (AOI), °: Brewster angle

Angle of Incidence (AOI), °: Brewster angle
Reflection s-pol, %: >99.5%

Wavelength, nm: 515
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Transmission p-pol: >95%
Surface quality, S-D: 20-20
Protective chamfers: <0.25 mm x 45°
Parallelism error: < 30 arcsec
Material: UVFS
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Extinction Ratio: >200:1
Clear aperture: 15 x 26.8 mm elliptical centered
Dimensions, mm: 20 (+0/-0.1) x 40 (+0/-0.1) x 5 (±0.1)

Surface quality, S-D: 20-20
Extinction Ratio: >200:1

Wavelength, nm: 532
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Transmission p-pol: >95%
Protective chamfers: <0.25 mm x 45°
Parallelism error: < 30 arcsec
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Angle of Incidence (AOI), °: Brewster angle
Clear aperture: 15 x 26.8 mm elliptical centered
Dimensions, mm: 20 (+0/-0.1) x 40 (+0/-0.1) x 5 (±0.1)
Material: UVFS
Reflection s-pol, %: >99.5%

Angle of Incidence (AOI), °: Brewster angle
Clear aperture: 15 x 26.8 mm elliptical centered

Dimensions, mm: 20 (+0/-0.1) x 40 (+0/-0.1) x 3 (±0.1)
Extinction Ratio: >200:1
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Material: BK7
Parallelism error: <30 arcsec
Protective chamfers: <0.25 mm x 45°
Reflection s-pol, %: >99.5%
Surface quality, S-D: 20-10
Transmission p-pol: >95%
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1550

Protective chamfers: <0.25 mm x 45°
Wavelength, nm: 1020-1040 (centered @ 1030 nm)

Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Transmission p-pol: >95%
Reflection s-pol, %: >99.5%
Parallelism error: <30 arcsec
Material: UVFS
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Extinction Ratio: >200:1
Dimensions, mm: 20 (+0/-0.1) x 40 (+0/-0.1) x 5 (±0.1)
Clear aperture: 15 x 26.8 mm elliptical centered
Angle of Incidence (AOI), °: Brewster angle
Surface quality, S-D: 20-20

Parallelism error: < 30 arcsec
Surface quality, S-D: 20-10

Wavelength, nm: 266
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Transmission p-pol: >95%
Angle of Incidence (AOI), °: 54,9
Clear Aperture: >90
Material: UVFS
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Extinction Ratio: >200:1
Protective chamfers: <0.25 mm x 45°
Dimensions, mm: 20 (+0/-0.1) x 40 (+0/-0.1) x 3 (±0.1)
Reflection s-pol, %: < 99.5%

Protective chamfers: <0.25 mm x 45°
Wavelength, nm: 1020-1040 (centered @ 1030 nm)

Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Transmission p-pol: >95%
Reflection s-pol, %: >99.5%
Parallelism error: <30 arcsec
Material: UVFS
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Komentarai:
Extinction Ratio: >200:1
Dimensions, mm: 20 (+0/-0.1) x 40 (+0/-0.1) x 5 (±0.1)
Clear Aperture: >90
Angle of Incidence (AOI), °: Brewster angle
Surface quality, S-D: 20-20

Angle of Incidence (AOI), °: 56 ±1
Dimensions, mm: 27 x 16

Extinction Ratio: >1000:1
Material: BK7
Protective chamfers: <0.2 mm x 45°
Reflection s-pol, %: >99.9
Surface quality, S-D: 20-10
Thickness, mm: 2
Transmission p-pol, %: >97
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Wavelength, nm: 532
Wedge / Parallelism error: <20 arcsec

Angle of Incidence (AOI), °: 56
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 12.5 x 20
Extinction Ratio: >100:1
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Transmission p-pol, %: >94
Wavelength, nm: 1030
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: 56
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 12.5 x 20
Extinction Ratio: >100:1
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Transmission p-pol, %: >94
Wavelength, nm: 1030
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: 56
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 40 x 90
Extinction Ratio: >200:1
Material: BK7
Protective chamfers: <0.25 mm x 45°
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 12
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Wavelength, nm: 800
Wedge / Parallelism error: <30 arcsec

Dimensions, mm: ∅25.4 (+0/-0.1) x 3 (±0.1)
Protective chamfers: <0.25 mm x 45°

Wavelength, nm: 532
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Transmission p-pol: >95%
Surface quality, S-D: 20-10
Reflection s-pol, %: >99.5%
Parallelism error: < 30 arcsec
Material: UVFS
Angle of Incidence (AOI), °: Brewster angle
Extinction Ratio: >200:1
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Clear Aperture: >90

Parallelism error: < 30 arcsec
Wavelength, nm: 515

Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Transmission p-pol: >95%
Surface quality, S-D: 20-10
Reflection s-pol, %: >99.5%
Material: UVFS
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Extinction Ratio: >200:1
Dimensions, mm: ∅25.4 (+0/-0.1) x 3 (±0.1)
Clear Aperture: >90
Angle of Incidence (AOI), °: Brewster angle
Protective chamfers: <0.25 mm x 45°

Protective chamfers: <0.25 mm x 45°
Dimensions, mm: ∅25.4 (+0/-0.1) x 3 (±0.1)

Wavelength, nm: 400
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Transmission p-pol: >95%
Surface quality, S-D: 20-10
Reflection s-pol, %: >99.5%
Parallelism error: < 30 arcsec
Material: UVFS
Angle of Incidence (AOI), °: Brewster angle
Extinction Ratio: >200:1
Clear Aperture: >90
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz

Transmission p-pol: >95%
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm

Surface quality, S-D: 20-10
Reflection s-pol, %: >99.5%
Protective chamfers: <0.25 mm x 45°
Material: UVFS
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Extinction Ratio: >200:1
Dimensions, mm: ∅25.4 (+0/-0.1) x 3 (±0.1)
Clear Aperture: >90
Angle of Incidence (AOI), °: Brewster angle
Wavelength, nm: 266
Parallelism error: < 30 arcsec

Angle of Incidence (AOI), °: Brewster angle
Clear Aperture: >90

Dimensions, mm: ∅25.4 (+0/-0.1) x 3 (±0.1)
Extinction Ratio: >200:1
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Material: UVFS
Parallelism error: <30 arcsec
Protective chamfers: <0.25 mm x 45°
Reflection s-pol, %: >99.5%
Surface quality, S-D: 20-10
Transmission p-pol: >95%
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 780

Angle of Incidence (AOI), °: Brewster angle
Clear Aperture: >90

Dimensions, mm: ∅25.4 (+0/-0.1) x 3 (±0.1)
Extinction Ratio: >200:1
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Material: UVFS
Parallelism error: < 30 arcsec
Protective chamfers: <0.25 mm x 45°
Reflection s-pol, %: >99.5%
Surface quality, S-D: 20-10
Transmission p-pol: >95%
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 355

Angle of Incidence (AOI), °: 56
Clear aperture: >90 %

Dimensions tolerance, mm: +0.0/-0.1
Dimensions, mm: 30 x 20
Material: UVFS Corning 7980 0F
Protective chamfers: 0.2-0.3 mm x 45 deg
Reflection s-pol, %: >99.9
Surface quality, S-D: 40-20
Thickness tolerance, mm: +/-0.1
Thickness, mm: 6.35
Transmission p-pol, %: >98
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1030
Wedge / Parallelism error: < 1 arcmin

Angle of Incidence (AOI), °: Brewster angle
Clear Aperture: >90

Dimensions, mm: ∅25.4 (+0/-0.1) x 3 (±0.1)
Extinction Ratio: >200:1
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Material: UVFS
Parallelism error: <30 arcsec
Protective chamfers: <0.25 mm x 45°
Reflection s-pol, %: >99.5%
Surface quality, S-D: 20-10
Transmission p-pol: >95%
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 780-820 (centered @ 800 nm)

Angle of Incidence (AOI), °: 72
Dimensions, mm: 20 x 40

Material: UVFS
Reflection s-pol, %: >80
Surface quality, S-D: 60-40
Thickness, mm: 3
Transmission p-pol, %: >90
Wavelength, nm: 1390-1490+720

Angle of Incidence (AOI), °: 56
Dimensions, mm: 10 x 20

Extinction Ratio: >1000:1
Material: UVFS
Reflection s-pol, %: >99.9
Surface quality, S-D: 20-10
Thickness, mm: 5
Transmission p-pol, %: >99
Wavelength, nm: 1053-1064

Angle of Incidence (AOI), °: 56
Dimensions tolerance, mm: +0/-0.25

Dimensions, mm: 10 x 20
Extinction Ratio: >1000:1
Material: UVFS
Reflection s-pol, %: >99.9
Surface quality, S-D: 40-20
Thickness, mm: 5
Transmission p-pol, %: >99
Wavelength, nm: 1053-1064

Angle of Incidence (AOI), °: 45
Clear aperture: >90

Dimensions, mm: 100 x 30
Material: UVFS
Reflection s-pol, %: >98
Surface quality, S-D: 40-20
Thickness, mm: 5
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/4 @ 632.8 nm
Wavelength, nm: 405
Wedge / Parallelism error: <1 arcmin

Angle of Incidence (AOI), °: 56
Clear aperture: 85

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 30 x 20
LIDT:
Material: UVFS
Reflection s-pol, %: >99.9
Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 6.35
Transmission p-pol, %: >98
Wavelength, nm: 1030

Angle of Incidence (AOI), °: Brewster angle
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 12.5 x 20.0
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Transmission p-pol, %: >94
Wavelength, nm: 1030

Angle of Incidence (AOI), °: Brewster angle
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 12.5 x 20.0
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Transmission p-pol, %: >94
Wavelength, nm: 1030

Dimensions, mm: 20 x 40
Extinction Ratio: >200:1

LIDT: >5 J/cm2 for 10 ns pulses at 1064 nm
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness, mm: 5
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 633

Angle of Incidence (AOI), °: 55.5
Dimensions, mm: 30 x 40

Extinction Ratio: >200:1
Material: BK7
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness, mm: 5
Transmission p-pol, %: >98
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1064
Wedge / Parallelism error: < 10 arcsec

Angle of Incidence (AOI), °: Brewster angle
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 20 x 40
Material: BK7
Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Transmission p-pol, %: <80
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 532

Angle of Incidence (AOI), °: 58
Clear aperture: 83

Dimensions, mm: 40 x 70
Extinction Ratio: >200:1
LIDT: >5 J/cm2 for 10 ns pulses at 1064 nm
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 40-10
Thickness, mm: 12
Transmission p-pol, %: >95
Wavelength, nm: 532
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: 58
Clear aperture: >90

Dimensions, mm: 40 x 70
Extinction Ratio: >200:1
LIDT: >5 J/cm2 for 10 ns pulses at 1064 nm
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness, mm: 12
Transmission p-pol, %: >95
Wavelength, nm: 532
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: Brewster angle
Clear aperture: >90

Dimensions, mm: 20 x 40
Extinction Ratio: >200:1
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-20
Thickness, mm: 5
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1020-1040
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: 45
Clear aperture: >85

Dimensions, mm: 25.4
Extinction Ratio: >100:1
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflection s-pol, %: >99
Surface quality, S-D: 20-20
Thickness, mm: 6.35
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/4 @ 632.8 nm
Wavelength, nm: 532
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: 55.4
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 20 x 40
Extinction Ratio: >200:1
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Transmission p-pol, %: >95
Wavelength, nm: 1020-1040
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: 56
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 20 x 40
Extinction Ratio: 100:1
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 780-820

Angle of Incidence (AOI), °: 55.4
Dimensions tolerance, mm: (+0/-0.1)

Dimensions, mm: 20 x 40
Material: UVFS
Reflection s-pol, %: >99.98
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Transmission p-pol, %: >99.5
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1030
Wedge / Parallelism error: < 30 arcsec

Angle of Incidence (AOI), °: 38-40
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflection s-pol, %: >99
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Transmission p-pol, %: >98
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1030

Angle of Incidence (AOI), °: 56
Clear aperture: >95

Dimensions tolerance, mm: +0/-0.12
Dimensions, mm: 50 x 90
Extinction Ratio: >500:1
Material: BK7
Reflection s-pol, %: >99.5
Surface quality, S-D: 10-5
Thickness tolerance, mm: ±0.2
Thickness, mm: 12
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Wavelength, nm: 1053

Angle of Incidence (AOI), °: Brewster angle
Dimensions, mm: 20 x 40

Extinction Ratio: >200:1
LIDT: >5 J/cm2 for 10 ns pulses at 1064 nm
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness, mm: 3
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1645
Wedge / Parallelism error: < 10 arcsec

Angle of Incidence (AOI), °: 56
Dimensions tolerance, mm: (+0/-0.1)

Dimensions, mm: 40 x 20
LIDT: >10 J/cm² @ 1064 nm, 10 ns, 10 Hz
Material: BK7
Surface quality, S-D: 20-10
Thickness tolerance, mm: +0/-0.1
Thickness, mm: 3
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Wavelength, nm: 589
Wedge / Parallelism error: < 10 arcsec

Angle of Incidence (AOI), °: 56
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 12.7 x 10
Extinction Ratio: >200:1
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 60-40
Thickness tolerance, mm: ±0.2
Thickness, mm: 5
Transmission p-pol, %: >95
Wavelength, nm: 527-532
Wedge / Parallelism error: 1 deg +/- 5arcmin along longer side;

Angle of Incidence (AOI), °: Brewster angle
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 20 x 40
Extinction Ratio: >200:1
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Transmission p-pol, %: >92
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 343
Wedge / Parallelism error: < 10 arcsec

Angle of Incidence (AOI), °: Brewster angle
Dimensions tolerance, mm: +0/-0.12

Dimensions, mm: 20 x 40
Extinction Ratio: 3000:1
Material: UVFS
Reflection s-pol, %: >99.9
Surface quality, S-D: 20-10 after coating
Thickness tolerance, mm: ±0.3
Thickness, mm: 3
Transmission p-pol, %: >98
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1015-1045
Wedge / Parallelism error: < 10 arcsec

Angle of Incidence (AOI), °: 55.4
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 20 x 40
Extinction Ratio: >200:1
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 40-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1020-1040
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: Brewster angle
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 12.5 x 20.0
Extinction Ratio: >200:1
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1020 - 1040
Wedge / Parallelism error: < 30 arcsec

Angle of Incidence (AOI), °: 56 ±2
Clear aperture: >90

Dimensions tolerance, mm: +0/-0.12
Dimensions, mm: 20 x 40
Extinction Ratio: >200:1
LIDT: >5 J/cm2 for 10 ns pulses at 1064 nm
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.2
Thickness, mm: 5
Transmission p-pol, %: >95
Wavelength, nm: 1020-1040
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: 56
Dimensions tolerance, mm: (+0/-0.1)

Dimensions, mm: 12.7 x 10
Extinction Ratio: >200:1
LIDT: >5 J/cm2 for 10 ns pulses at 1064 nm
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.2
Thickness, mm: 5
Transmission p-pol, %: >95
Wavelength, nm: 527-532
Wedge / Parallelism error: 1 deg +/- 5arcmin along longer side;

Angle of Incidence (AOI), °: 58
Clear aperture: >90

Dimensions, mm: 50
Extinction Ratio: >200:1
LIDT: >5 J/cm² @ 1064 nm; 10 ns; 10 Hz
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness, mm: 5
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 355
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: 56 ±1
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 30 x 12
LIDT: >5 J/cm2 for 10 ns pulses @ 1064 nm
Material: BK7
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 2
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 694
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: 56
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 12.7 x 10
Extinction Ratio: >200:1
LIDT: >5 J/cm2 for 10 ns pulses at 1064 nm
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.2
Thickness, mm: 5
Transmission p-pol, %: >95
Wavelength, nm: 527-532
Wedge / Parallelism error: 1 deg +/- 5arcmin along longer side;

Angle of Incidence (AOI), °: Brewster angle
Clear aperture: >90

Dimensions tolerance, mm: +0/-0.12
Dimensions, mm: 20 x 40
LIDT: >5 J/cm2 for 10 ns pulses at 1064 nm
Material: IRFS
Reflection s-pol, %: >99.7
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.2
Thickness, mm: 10
Transmission p-pol, %: >98
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1020-1040
Wedge / Parallelism error: < 30 arcsec

Angle of Incidence (AOI), °: 45
Clear aperture: >90

Dimensions tolerance, mm: +0/-0.12
Dimensions, mm: 10 x 15
Extinction Ratio: 100:1
LIDT: 5 J/cm² for 10 ns pulses @ 1064 nm
Material: UVFS
Reflection s-pol, %: >99
Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.1
Thickness, mm: 3
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 878-880
Wedge / Parallelism error: < 10 arcsec

Angle of Incidence (AOI), °: 45
Clear aperture: >90

Dimensions tolerance, mm: +0/-0.12
Dimensions, mm: 10 x 15
Extinction Ratio: 100:1
LIDT: >5 J/cm2 for 10 ns pulses at 1064 nm
Material: UVFS
Reflection s-pol, %: >99
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.2
Thickness, mm: 3
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 878-880
Wedge / Parallelism error: < 10 arcsec

Angle of Incidence (AOI), °: Brewster angle
Dimensions tolerance, mm: (+0/-0.1)

Dimensions, mm: 16.5 x 8
Extinction Ratio: >200:1
LIDT: >5 J/cm2 for 10 ns pulses at 1064 nm
Material: BK7
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 3.2
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1053
Wedge / Parallelism error: < 10 arcsec

Angle of Incidence (AOI), °: 55.4
Clear aperture: >90

Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 25 x 50
Extinction Ratio: >200:1
LIDT: >7 J/cm2 for 10 ns pulses @ 1064 nm
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1020-1040
Wedge / Parallelism error: <30 arcsec

Clear aperture: >90
Dimensions, mm: 12.7 x 12.7 x 12.7
Extinction Ratio: 1000:1
S1 Flatness, PV IR S2 Flatness, PV: <λ/10 @ 632.8 nm
Material: UVFS
Protective chamfers: 0.1-0.2 mm x 45°
Reflection s-pol, %: >99.6
Surface quality, S-D: 40-20
Transmission p-pol, %: >95
Wavelength, nm: 1064

Dimensions, mm: 12.7 x 12.7 x 12.7
Extinction Ratio: <10⁻³
LIDT: >10 J/cm2, 10ns, 1064nm, 10Hz
Material: UVFS
Reflection s-pol, %: >99.6
Surface quality, S-D: 20-10
Transmission p-pol, %: >95
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1064

Beam deviation: <3 arcmin
Clear aperture: >90
Dimensions tolerance, mm: +0/-0.3
Dimensions, mm: 12.7 x 12.7 x 12.7
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Material: UVFS
Reflection s-pol, %: 88.4
Surface quality, S-D: 20-10
Transmission p-pol, %: 89.2
Wavelength, nm: 1020-1090 (centered @ 1064 nm)

Beam deviation: <3 arcmin
Clear Aperture: >90
Dimensions, mm: 6.35 x 6.35 x 6.35 (+0/-0.3)
Extinction Ratio: >1000:1
S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm
LIDT: >10 J/cm² @ 266 nm; 10 ns; 20 Hz
Material: UVFS
Reflection s-pol, %: >99.5
Surface quality, S-D: 20-10
Transmission p-pol, %: >94
Wavelength, nm: 264-268 (centered @ 266 nm)

Beam deviation: <3 arcmin
Clear Aperture: >90
Dimensions, mm: 12.7 x 12.7 x 12.7 (+0/-0.3)
Extinction Ratio: <1:200
S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm
LIDT: >0.3 J/cm² @ 1064 nm, 10 ns, 10 Hz
Marking: Dot indicating entrance surfaces
Material: N-BK7 or equivalent
Protective chamfers: 0.1-0.25 mm x 45°
Reflection s-pol, %: >99
Surface quality, S-D: 40-20
Transmission p-pol, %: >90
Wavelength, nm: 400

Beam deviation: <3 arcmin
Clear Aperture: >90
Dimensions, mm: 25.4 x 25.4 x 25.4 (+0/-0.3)
Extinction Ratio: <1:200
S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm
LIDT: >0.3 J/cm² @ 1064 nm, 10 ns, 10 Hz
Marking: Dot indicating entrance surfaces
Material: H-ZF1
Protective chamfers: 0.1-0.25 mm x 45°
Reflection s-pol, %: >99.5
Surface quality, S-D: 40-20
Transmission p-pol, %: >95
Wavelength, nm: 450-650

Marking: Dot indicating entrance surfaces
Surface quality, S-D: 40-20
Transmission p-pol, %: >97
Protective chamfers: 0.1-0.25 mm x 45°
Wavelength, nm: 850
Material: N-BK7 or equivalent
S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm
Extinction Ratio: <1:200
Dimensions, mm: 12.7 x 12.7 x 12.7 (+0/-0.3)
Clear Aperture: >90
Beam deviation: <3 arcmin
Reflection s-pol, %: >99.8
LIDT: >0.3 J/cm² @ 1064 nm, 10 ns, 10 Hz

Marking: Dot indicating entrance surfaces
Protective chamfers: 0.1-0.25 mm x 45°
Wavelength, nm: 1020-1100
Transmission p-pol, %: >97
Reflection s-pol, %: >99.5
Material: N-BK7 or equivalent
S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm
Extinction Ratio: <1:200
Surface quality, S-D: 40-20
Dimensions, mm: 25.4 x 25.4 x 25.4 (+0/-0.3)
LIDT: >0.3 J/cm² @ 1064 nm, 10 ns, 10 Hz
Clear Aperture: >90
Beam deviation: <3 arcmin

Beam deviation: <3 arcmin
Clear Aperture: >90
Dimensions, mm: 25.4 x 25.4 x 25.4 (+0/-0.3)
Extinction Ratio: <1:200
S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm
LIDT: >0.3 J/cm² @ 1064 nm, 10 ns, 10 Hz
Marking: Dot indicating intrance surfaces
Material: N-BK7 or equivalent
Protective chamfers: 0.1-0.25 mm x 45°
Reflection s-pol, %: >99.8
Surface quality, S-D: 40-20
Transmission p-pol, %: >97
Wavelength, nm: 780

Beam deviation: <3 arcmin
Clear Aperture: >90
Dimensions, mm: 12.7 x 12.7 x 12.7 (+0/-0.3)
Extinction Ratio: <1:200
S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm
LIDT: >0.3 J/cm² @ 1064 nm, 10 ns, 10 Hz
Marking: Dot indicating entrance surfaces
Material: N-SF1 or equivalent
Protective chamfers: 0.1-0.25 mm x 45°
Reflection s-pol, %: >99.5
Surface quality, S-D: 40-20
Transmission p-pol, %: >95
Wavelength, nm: 700-900

Clear aperture: >90
Dimensions, mm: 40 x 40 x 40
S1 Flatness, PV IR S2 Flatness, PV: λ/4
LIDT: >0.3 J/cm2
Material: BK7
Surface quality, S-D: 40-20
Wavelength, nm: 940-980

AR coatings: Laser line AR coated
Clear aperture: >90
Dimensions tolerance, mm: +0/-0.2
Dimensions, mm: 50 x 50 x 50
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
LIDT: >0.3 J/cm2
Material: BK7
Surface quality, S-D: 40-20
Wavelength, nm: 940-980

Beam deviation: <3 arcmin
Comments: Dusts inside between glued surfaces.
Dimensions, mm: 12.7 x 12.7 x 12.7
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Material: BK7
Reflection s-pol, %: >99.8
Surface quality, S-D: 40-20
Transmission p-pol, %: >97%
Wavelength, nm: 1550

Beam deviation: 3 arcmin
Dimensions, mm: 20 x 20 x 20
S1 Flatness, PV IR S2 Flatness, PV: λ/4 @ 632.8 nm
LIDT: >0.5 J/cm2 @1064nm 10Hz, 10ns
Material: BK7
Reflection s-pol, %: >99.9
Surface quality, S-D: 60-40
Transmission p-pol, %: >95.8
Wavelength, nm: 780

Beam deviation: <3 arcmin
Dimensions, mm: 25.4 x 25.4 x 25.4
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
LIDT: >20 J/cm² @ 1064 nm; 10 ns; 10 Hz
Material: UVFS (Suprasil 1)
Reflection s-pol, %: >99.8
Surface quality, S-D: 80-50
Transmission p-pol, %: >97
Wavelength, nm: 1030-1064

AR coatings: Laser line AR coated
Beam deviation: <3 arcmin
Clear aperture: >90
Dimensions tolerance, mm: +0/-0.3
Dimensions, mm: 12.7 x 12.7 x 12.7
S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm
Material: BK7
Reflection s-pol, %: >99.8
Surface quality, S-D: 40-20
Transmission p-pol, %: >97
Wavelength, nm: 780

Beam deviation: <3 arcmin
Clear aperture: >80
Dimensions tolerance, mm: +0/-0.3
Dimensions, mm: 20 x 20 x 20
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
LIDT: >0.3 J/cm2
Material: H-ZF
Reflection s-pol, %: >99
Surface quality, S-D: 40-20
Transmission p-pol, %: >95
Wavelength, nm: 450-650

Beam deviation: <3 arcmin
Clear aperture: >90
Dimensions tolerance, mm: +0/-0.3
Dimensions, mm: 25.4 x 25.4 x 25.4
S1 Flatness, PV IR S2 Flatness, PV: λ/4 @ 632.8 nm
LIDT: >0.3 J/cm2
Material: BK7
Reflection s-pol, %: >99.5
Surface quality, S-D: 40-20
Transmission p-pol, %: >95
Wavelength, nm: 1180-1220

AR coatings: BBAR coated
Beam deviation: <3 arcmin
Clear aperture: >90
Dimensions, mm: 12.7 x 12.7 x 12.7
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
LIDT: >0.3 J/cm2
Material: BK7
Reflection s-pol, %: >99.5
Surface quality, S-D: 40-20
Transmission p-pol, %: >95
Wavelength, nm: 600-900

AR coatings: Laser line AR coated
Beam deviation: <3 arcmin
Clear aperture: >90
Dimensions tolerance, mm: +0.0/-0.2
Dimensions, mm: 25.4 x 25.4 x 25.4
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
LIDT: >0.3 J/cm2
Material: BK7
Reflection s-pol, %: >99.5
Surface quality, S-D: 40-20
Transmission p-pol, %: >96
Wavelength, nm: 1020-1100

Beam deviation: <3 arcmin
Clear Aperture: >90
Dimensions, mm: 25.4 x 25.4 x 25.4 (+/-0.3)
Extinction Ratio: <1:200
S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm
LIDT: >0.3 J/cm² @ 1064 nm, 10 ns, 10 Hz
Material: N-BK7 or equivalent
Reflection s-pol, %: >99.8
Surface quality, S-D: 40-20
Transmission p-pol, %: >97
Wavelength, nm: 633

Clear Aperture: >90
Surface quality, S-D: 20-20
Wedge / Parallelism error: 1° (±5 arcmin)
Wavelength, nm: 750-850 (centered @ 800 nm)
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Configuration: Max Rs
S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm
Reflection s-pol, %: >98%
Reflection p-pol: <20%
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Dimensions, mm: 20 (+0/-0.1) x 60 (+0/-0.1) x 5 (±0.1)
Angle of Incidence (AOI), °: 72 (±2)
Extinction Ratio: >5:1

Wedge / Parallelism error: 1° (±5 arcmin)
Wavelength, nm: 750-850 (centered @ 800 nm)
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm
Surface quality, S-D: 20-10
Reflection p-pol: <1%
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Extinction Ratio: >60:1
Dimensions, mm: 25 (+0/-0.1) x 75 (+0/-0.1) x 7 (±0.1)
Configuration: Max R contrast
Reflection s-pol, %: >85%
Clear Aperture: >90
Angle of Incidence (AOI), °: 72 (±2)

Angle of Incidence (AOI), °: 72 (±2)
Clear Aperture: >90
Dimensions, mm: 50 (+0/-0.1) x 160 (+0/-0.1) x 10 (±0.1)
Extinction Ratio: >5:1
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflection p-pol: <20%
Reflection s-pol, %: >98%
S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm
Surface quality, S-D: 20-10
Configuration: Max Rs
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Wavelength, nm: 750-850 (centered @ 800 nm)
Wedge / Parallelism error: 1° (±5 arcmin)

Angle of Incidence (AOI), °: 72 (±2)
Clear Aperture: >90
Dimensions, mm: 20 (+0/-0.1) x 60 (+0/-0.1) x 5 (±0.1)
Extinction Ratio: >20:1
Material: UVFS
Parallelism error: <30 arcsec
Protective chamfers: <0.25 mm x 45°
S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm
Surface quality, S-D: 20-10
Configuration: Max T contrast
Transmission p-pol: >85%
Transmission s-pol: <4%
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Wavelength, nm: 750-850 (centered @ 800 nm)

Angle of Incidence (AOI), °: 72 (±2)
Clear Aperture: >90
Dimensions, mm: 20 (+0/-0.1) x 60 (+0/-0.1) x 5 (±0.1)
Extinction Ratio: >5:1
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflection p-pol: <20%
Reflection s-pol, %: >98%
S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm
Surface quality, S-D: 20-10
Configuration: Max Rs
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Wavelength, nm: 980-1090 (centered @ 1030 nm)
Wedge / Parallelism error: 1° (±5 arcmin)

Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 20 x 60
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 2
Configuration: R1 Reflection Rs optimized
Wavelength, nm: 650-750

Angle of Incidence (AOI), °: 72
Dimensions, mm: 20 x 60
Extinction Ratio: >5:1
Protective chamfers: <0.25 mm x 45°
S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm
Surface quality, S-D: 40-20
Thickness, mm: 5
Configuration: Max Rs
Wavelength, nm: 750-850
Wedge / Parallelism error: 1

Angle of Incidence (AOI), °: 72
Clear aperture: >90
Dimensions, mm: 20 x 60
Extinction Ratio: >9:1
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Surface quality, S-D: 20-10
Thickness, mm: 2
Configuration: Max Tp
Transmission p-pol, %: >94
Transmission s-pol, %: <10
Wavelength, nm: 750-850
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: 72 (±2)
Clear Aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.1) x 3 (±0.1)
Extinction Ratio: >5:1
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflection p-pol: <20%
Reflection s-pol, %: >98%
S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm
Surface quality, S-D: 20-10
Configuration: Max Rs
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Wavelength, nm: 980-1090 (centered @ 1030 nm)
Wedge / Parallelism error: 1° (±5 arcmin)

Angle of Incidence (AOI), °: 72 (±2)
Clear Aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.1) x 3 (±0.1)
Extinction Ratio: >5:1
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflection p-pol: <20%
Reflection s-pol, %: >98%
S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm
Surface quality, S-D: 20-10
Configuration: Max Rs
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Wavelength, nm: 750-850 (centered @ 800 nm)
Wedge / Parallelism error: 1° (±5 arcmin)

Angle of Incidence (AOI), °: 72 (±2)
Clear Aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.1) x 3 (±0.1)
Extinction Ratio: >60:1
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Reflection p-pol: <1%
Reflection s-pol, %: >85%
S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm
Surface quality, S-D: 20-10
Configuration: Max R contrast
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Wavelength, nm: 980-1090 (centered @ 1030 nm)
Wedge / Parallelism error: 1° (±5 arcmin)

Angle of Incidence (AOI), °: 72 (±2)
Clear Aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.1) x 3 (±0.1)
Extinction Ratio: >20:1
Material: UVFS
Parallelism error: <30 arcsec
Protective chamfers: <0.25 mm x 45°
S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm
Surface quality, S-D: 20-10
Configuration: Max T contrast
Transmission p-pol: >85%
Transmission s-pol: <4%
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Wavelength, nm: 980-1090 (centered @ 1030 nm)

Angle of Incidence (AOI), °: 72 (±2)
Clear Aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.1) x 3 (±0.1)
Extinction Ratio: >20:1
Material: UVFS
Parallelism error: <1 arcmin
Protective chamfers: <0.25 mm x 45°
S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm
Surface quality, S-D: 20-10
Configuration: Max T contrast
Transmission p-pol: >85%
Transmission s-pol: <4%
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Wavelength, nm: 750-850 (centered @ 800 nm)

Angle of Incidence (AOI), °: 72
Clear aperture: >90
Dimensions, mm: 20 x 60
Extinction Ratio: >20:1
Material: UVFS
Surface quality, S-D: 20-10
Thickness, mm: 2
Configuration: T2 Transmission Contrast optimized
Transmission p-pol, %: >85
Transmission s-pol, %: <4
Wavelength, nm: 750-850
Wedge / Parallelism error: 1° (±5 acmin)

Angle of Incidence (AOI), °: 72
Clear aperture: 76
Dimensions, mm: 20 x 60
Extinction Ratio: >9:1
Material: UVFS
Surface quality, S-D: 20-10
Thickness, mm: 2
Configuration: T1 Transmission Tp optimized
Transmission p-pol, %: >94
Transmission s-pol, %: <10
Wavelength, nm: 750-850
Wedge / Parallelism error: 1° (±5 acmin)

Angle of Incidence (AOI), °: 72
Clear aperture: >90
Dimensions, mm: 20 x 60
Extinction Ratio: >9:1
Material: UVFS
Surface quality, S-D: 20-20
Thickness, mm: 2
Configuration: T1 Transmission Tp optimized
Transmission p-pol, %: >94
Transmission s-pol, %: <10
Wavelength, nm: 750-850
Wedge / Parallelism error: 1° (±5 acmin)

Angle of Incidence (AOI), °: 72
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 20 x 60
Material: UVFS
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 2
Configuration: R2 Reflection Contrast optimized
Transmission p-pol, %: 96-98
Transmission s-pol, %: <15
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Wavelength, nm: 750-850

Angle of Incidence (AOI), °: 72
Clear aperture: >90
Dimensions, mm: 20 x 60
Extinction Ratio: >20:1
Material: UVFS
Surface quality, S-D: 60-40
Thickness, mm: 2
Configuration: T2 Transmission Contrast optimized
Transmission p-pol, %: >85
Transmission s-pol, %: <4
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Wavelength, nm: 750-850
Wedge / Parallelism error: 1° (±5 acmin)

Angle of Incidence (AOI), °: 72
Clear aperture: >90
Dimensions, mm: 20 x 60
Extinction Ratio: >20:1
Material: UVFS
Surface quality, S-D: 40-20
Thickness, mm: 2
Configuration: T2 Transmission Contrast optimized
Transmission p-pol, %: >85
Transmission s-pol, %: <4
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Wavelength, nm: 750-850
Wedge / Parallelism error: 1° (±5 acmin)

Angle of Incidence (AOI), °: 72
Clear aperture: >90
Dimensions, mm: 20 x 60
Extinction Ratio: >20:1
Material: UVFS
Surface quality, S-D: 40-20
Thickness, mm: 2
Configuration: T2 Transmission Contrast optimized
Transmission p-pol, %: >85
Transmission s-pol, %: <4
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Wavelength, nm: 750-850
Wedge / Parallelism error: 1° (±5 acmin)

Angle of Incidence (AOI), °: 72
Clear aperture: >90
Dimensions, mm: 20 x 60
Extinction Ratio: >9:1
Material: UVFS
S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm
Surface quality, S-D: 20-10
Thickness, mm: 2
Configuration: T1 Transmission Tp optimized
Transmission p-pol, %: >94
Transmission s-pol, %: <10
Wavelength, nm: 750-850
Wedge / Parallelism error: 1° (±5 acmin)

Angle of Incidence (AOI), °: 72
Clear aperture: >90
Dimensions tolerance, mm: +0/-0.12
Dimensions, mm: 20 x 60
Extinction Ratio: >20:1
LIDT: 5 J/cm² for 10 ns pulses @ 1064 nm
Material: UVFS
S1 Flatness, PV IR S2 Flatness, PV: <λ/6 @ 632.8 nm
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.2
Thickness, mm: 2
Configuration: T2 Transmission Contrast optimized
Transmission p-pol, %: >80
Transmission s-pol, %: <4
Wavelength, nm: 750-850

Wavelength, nm: 532
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Transmission s-pol, %: <0.2
Transmission p-pol, %: >98
Protective chamfers: 0.1-0.3 mm x 45°
Parallelism error: <30 arcsec
Material: UVFS
LIDT: >20 J/cm2, 10 ns, 10 Hz, 532 nm for Rs-pol; >5 J/cm2, 10 ns, 10 Hz, 532 nm for Tp-pol
Extinction Ratio: >1000:1
Dimensions, mm: 20 (+0/-0.1) x 40 (+0/-0.1) x 5 (±0.1)
Clear Aperture: >90
Angle of Incidence (AOI), °: 55.6 (±1°)
Surface quality, S-D: 20-10

Extinction Ratio: >1000:1
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Transmission s-pol: <0.1%
Transmission p-pol: >99%
Typical LIDT: 7.1 J/cm² (s-pol); 3.2 J/cm² (p-pol) @ 1064 nm, 12 ns, 100 Hz
Surface quality, S-D: 20-10
Wavelength, nm: 1064
Material: UVFS
Dimensions, mm: 20 (+0/-0.1) x 40 (+0/-0.1) x 5 (±0.1)
Coating transmitted GDD (p-pol), fs²: <500
Coating reflected GDD (s-pol), fs²: <200
Clear aperture: 15 x 26.8 mm elliptical centered
Angle of Incidence (AOI), °: Brewster angle
Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: Brewster angle
Clear aperture: 15 x 26.8 mm elliptical centered
Coating reflected GDD (s-pol), fs²: <200
Coating transmitted GDD (p-pol), fs²: <400
Dimensions, mm: 20 (+0/-0.1) x 40 (+0/-0.1) x 5 (±0.1)
Extinction Ratio: >1000:1
Material: UVFS
Parallelism error: <30 arcsec
Surface quality, S-D: 20-10
Typical LIDT: 7.1 J/cm² (s-pol); 3.2 J/cm² (p-pol) @ 1064 nm, 12 ns, 100 Hz
Transmission p-pol: >99%
Transmission s-pol: <0.1%
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 800

Wavelength, nm: 1064
Transmission s-pol: <0.1%
Transmission p-pol: >99%
LIDT: 10J/cm2, 10ns, 10Hz, 1064nm
Extinction Ratio: >1000:1
Dimensions, mm: 16 x 13 x 3
Coating transmitted GDD (p-pol), fs²: N/A
Coating reflected GDD (s-pol), fs²: N/A
S-D: 20-20
Material: UVFS

S-D: 40-10
Wavelength, nm: 1064
Transmission s-pol: <0.1%
Transmission p-pol: >99%
Material: UVFS
LIDT: 10J/cm2, 10ns, 10Hz, 1064nm
Extinction Ratio: >1000:1
Dimensions, mm: 16 x 13 x 3
Coating reflected GDD (s-pol), fs²: N/A
Coating transmitted GDD (p-pol), fs²: N/A

Angel of incidence: Brewster angle
Clear Aperture: >90%
Coating Reflected GDD (s-pol): GDD<200fs²
Coating Transmitted GDD (p-pol): GDD<500fs²
Dimensions, mm: 20 x 10 x 5
LIDT: >10J/cm2 for 10 ns pulses @ 1064 nm typical
Material: UVFS
Surface quality: 20/10 S/D
Transmission p-pol: >98%
Transmission s-pol: <0.1%
Wavelength, nm: 343

Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions tolerance, mm: ±0.1
Dimensions, mm: 16 x 9.5
Material: UVFS
Protective chamfers: 0.1 mm x 45°
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 6.35
Transmission p-pol, %: >99.5
Transmission s-pol, %: <0.1
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1030
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: Brewster angle
Clear aperture: >90
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 10 x 20
Material: BK7
Protective chamfers: <0.25 mm x 45°
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Transmission p-pol, %: >98
Transmission s-pol, %: <0.1
Transmitted wavefront distortion, PV: <λ/7 @ 632.8 nm
Wavelength, nm: 1645
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions tolerance, mm: ±0.1
Dimensions, mm: 16 x 9.5
Extinction Ratio: 990:1
Material: UVFS
Protective chamfers: 0.1 mm x 45°
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 6.35
Transmission p-pol, %: >99
Transmission s-pol, %: <0.1
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1030
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: Brewster angle
Clear Aperture: >90
Coating reflected GDD (s-pol), fs²: <50
Coating transmitted GDD (p-pol), fs²: <100
Dimensions, mm: 10 (+0/-0.1) x 20 (+0/-0.1) x 5 (±0.1)
Extinction Ratio: >1000:1
Material: UVFS
Parallelism error: <30 arcsec
Surface quality, S-D: 60-10
Transmission p-pol: >97%
Transmission s-pol: <0.3%
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 343

Angle of Incidence (AOI), °: Brewster angle
Clear Aperture: >90
Coating reflected GDD (s-pol), fs²: <200
Coating transmitted GDD (p-pol), fs²: <500
Dimensions, mm: 20 (+0/-0.1) x 40 (+0/-0.1) x 5 (±0.1)
Extinction Ratio: >1000:1
Material: UVFS
Parallelism error: <30 arcsec
Surface quality, S-D: 60-10
Transmission p-pol: >99%
Transmission s-pol: <0.1%
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1030

Angle of Incidence (AOI), °: 59
Clear Aperture: >90
Coating reflected GDD (s-pol), fs²: <200
Coating transmitted GDD (p-pol), fs²: <400
Dimensions, mm: 20 (+0/-0.1) x 40 (+0/-0.1) x 5 (±0.1)
Extinction Ratio: >1000:1
Material: UVFS
Parallelism error: <30 arcsec
Surface quality, S-D: 20-10
Transmission p-pol: >99%
Transmission s-pol: <0.1%
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 800

Angle of Incidence (AOI), °: Brewster angle
Clear Aperture: >90
Coating reflected GDD (s-pol), fs²: <100
Coating transmitted GDD (p-pol), fs²: <300
Dimensions, mm: 10 (+0/-0.1) x 20 (+0/-0.1) x 5 (±0.1)
Extinction Ratio: >1000:1
Material: UVFS
Parallelism error: <30 arcsec
Surface quality, S-D: 40-10
Transmission p-pol: >99%
Transmission s-pol: <0.1%
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 532

Angle of Incidence (AOI), °: Brewster angle
Clear Aperture: >90
Coating reflected GDD (s-pol), fs²: <100
Coating transmitted GDD (p-pol), fs²: <300
Dimensions, mm: 10 (+0/-0.1) x 20 (+0/-0.1) x 5 (±0.1)
Extinction Ratio: >1000:1
Material: UVFS
Parallelism error: <30 arcsec
Surface quality, S-D: 20-10
Transmission p-pol: >99%
Transmission s-pol: <0.1%
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 532

LIDT: 2 J/cm² (s-pol); 3 J/cm² (p-pol) @ 355 nm, 7.8 ns, 100 Hz
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Transmission s-pol: <0.3%
Transmission p-pol: >97%
Surface quality, S-D: 20-10
Wavelength, nm: 355
Extinction Ratio: >1000:1
Dimensions, mm: 10 (+0/-0.1) x 20 (+0/-0.1) x 5 (±0.1)
Coating transmitted GDD (p-pol), fs²: <100
Coating reflected GDD (s-pol), fs²: <50
Clear Aperture: >90
Angle of Incidence (AOI), °: Brewster angle
Material: UVFS
Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: Brewster angle +/-1 deg
Clear aperture: >90%
Coating Reflected GDD (s-pol): GDD < 100 fs²
Coating Transmitted GDD (p-pol): GDD < 300 fs²
Diameter tolerance, mm: +0/-0.1 mm
Dimensions, mm: 60 x 105 x 5
Extinction ratio: Tp/Ts > 1000:1
Parallelism error: <30 arcsec
STANDARD SPECIFICATIONS (substrate):
Material: UVFS
Surface quality: 60-40 – 80-50 S-D after coating
Thickness tolerance, mm: ±0.1 mm
Transmission p-pol: >99%
Transmission s-pol: <0.1%
Transmitted wavefront distortion, PV: < λ/2-λ/4 @ 632.8 nm per D25.4 after coating
Wavelength, nm: 532

Angle of Incidence (AOI), °: 45
Coating reflected GDD (s-pol), fs²: <200
Coating transmitted GDD (p-pol), fs²: <500
Dimensions, mm: 20 x 40
LIDT: >10 J/cm² @ 1064 nm, 10 ns, 10 Hz
Material: UVFS
Surface quality, S-D: 40-10
Thickness, mm: 5
Transmission p-pol, %: >97
Transmission s-pol, %: <0.5
Wavelength, nm: 355
Wedge / Parallelism error: < 30 arcsec

Angle of Incidence (AOI), °: 45
Clear aperture: >90
Coating reflected GDD (s-pol), fs²: <200
Coating transmitted GDD (p-pol), fs²: <500
Dimensions, mm: 20 x 40
LIDT: >10 J/cm² @ 1064 nm, 10 ns, 10 Hz
Material: UVFS
Surface quality, S-D: 20-10
Thickness, mm: 5
Transmission p-pol, %: >97
Transmission s-pol, %: <0.5
Wavelength, nm: 355
Wedge / Parallelism error: < 30 arcsec

Angle of Incidence (AOI), °: Brewster angle
Clear Aperture: >90
Coating reflected GDD (s-pol), fs²: <50
Coating transmitted GDD (p-pol), fs²: <100
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Extinction Ratio: >1000:1
Material: UVFS
Parallelism error: <30 arcsec
Surface Quality: 20-20
Transmission p-pol: >97%
Transmission s-pol: <0.3%
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 355

Angle of Incidence (AOI), °: 55.4-57
Clear aperture: >90
Coating reflected GDD (s-pol), fs²: <200
Coating transmitted GDD (p-pol), fs²: <500
Dimensions, mm: 20 x 40
LIDT: >10 J/cm² @ 1064 nm, 10 ns, 10 Hz
Material: UVFS
Surface quality, S-D: 20-10
Thickness, mm: 5
Transmission p-pol, %: >97.6
Transmission s-pol, %: <0.2%
Wavelength, nm: 343
Wedge / Parallelism error: < 30 arcsec

Parallelism error: <30 arcsec
Wavelength, nm: 532
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Transmission s-pol: <0.1%
Surface quality, S-D: 20-10
Clear Aperture: >90
Material: UVFS
Coating reflected GDD (s-pol), fs²: <100
Coating transmitted GDD (p-pol), fs²: <300
Transmission p-pol: >99%
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Angle of Incidence (AOI), °: Brewster angle
Extinction Ratio: >1000:1

Extinction Ratio: >1000:1
Wavelength, nm: 515
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Transmission s-pol: <0.1%
Transmission p-pol: >99%
Surface quality, S-D: 20-10
Material: UVFS
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Coating transmitted GDD (p-pol), fs²: <300
Coating reflected GDD (s-pol), fs²: <100
Clear Aperture: >90
Angle of Incidence (AOI), °: Brewster angle
Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: Brewster angle
Clear Aperture: >90
Coating reflected GDD (s-pol), fs²: <100
Coating transmitted GDD (p-pol), fs²: <300
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Extinction Ratio: >1000:1
Material: UVFS
Parallelism error: <30 arcsec
Surface quality, S-D: 20-20
Transmission p-pol: >99%
Transmission s-pol: <0.1%
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 515

Angle of Incidence (AOI), °: Brewster angle
Clear Aperture: >90
Coating reflected GDD (s-pol), fs²: <100
Coating transmitted GDD (p-pol), fs²: <100
Dimensions, mm: Ø50.8 (+0/-0.1) x 6 (±0.1)
Extinction Ratio: >1000:1
Material: UVFS
Parallelism error: <30 arcsec
Surface quality, S-D: 40-10
Transmission p-pol: >97%
Transmission s-pol: <0.3%
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Wavelength, nm: 343

Angle of Incidence (AOI), °: Brewster angle
Clear Aperture: >90
Coating reflected GDD (s-pol), fs²: <100
Coating transmitted GDD (p-pol), fs²: <200
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Extinction Ratio: >1000:1
Material: UVFS
Parallelism error: <30 arcsec
Surface quality, S-D: 20-10
Transmission p-pol: >98%
Transmission s-pol: <0.2%
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 400

Angle of Incidence (AOI), °: 55.9 (angle tunning ±1)
Clear Aperture: >90
Coating reflected GDD (s-pol), fs²: <50
Coating transmitted GDD (p-pol), fs²: <100
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Extinction Ratio: >1000:1
Material: UVFS
Parallelism error: <30 arcsec
Surface quality, S-D: 20-20
Transmission p-pol: >97%
Transmission s-pol: <0.3%
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 343

Angle of Incidence (AOI), °: 45
Clear aperture: >90
Coating reflected GDD (s-pol), fs²: <200
Coating transmitted GDD (p-pol), fs²: <500
Dimensions, mm: 20 x 40
LIDT: >10 J/cm² @ 1064 nm, 10 ns, 10 Hz
Material: UVFS
Surface quality, S-D: 40-10
Thickness, mm: 5
Transmission p-pol, %: >97
Transmission s-pol, %: <0.5
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 355
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: 45
Clear aperture: >90
Coating reflected GDD (s-pol), fs²: <200
Coating transmitted GDD (p-pol), fs²: <500
Dimensions, mm: 20 x 40
LIDT: >10 J/cm² @ 1064 nm, 10 ns, 10 Hz
Material: UVFS
Surface quality, S-D: 20-10
Thickness, mm: 5
Transmission p-pol, %: >97
Transmission s-pol, %: <0.5
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 355
Wedge / Parallelism error: < 30 arcsec

Angle of Incidence (AOI), °: 58
Clear aperture: 88
Coating reflected GDD (s-pol), fs²: <200
Coating transmitted GDD (p-pol), fs²: <500
Dimensions tolerance, mm: +0/-0.12
Dimensions, mm: 20 x 40
Extinction Ratio: >1000:1
LIDT: >10 J/cm² @ 1064 nm, 10 ns, 10 Hz
Material: UVFS
Surface quality, S-D: 40-20
Thickness tolerance, mm: ±0.2
Thickness, mm: 5
Transmission p-pol, %: >99
Transmission s-pol, %: <0.1
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Wavelength, nm: 1030

Angle of Incidence (AOI), °: 57.7
Clear aperture: >90
Coating reflected GDD (s-pol), fs²: <200
Coating transmitted GDD (p-pol), fs²: <500
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 20 x 40
LIDT: >10 J/cm² @ 1064 nm, 10 ns, 10 Hz
Material: UVFS
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Transmission p-pol, %: >98
Transmission s-pol, %: <0.1
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1064
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: 63
Clear aperture: >90
Coating reflected GDD (s-pol), fs²: <100
Coating transmitted GDD (p-pol), fs²: <300
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 20 x 40
LIDT: >10 J/cm² @ 1064 nm, 10 ns, 10 Hz
Material: UVFS
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Transmission p-pol, %: >96.4
Transmission s-pol, %: <0.1
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 532
Wedge / Parallelism error: < 30 arcsec

Angle of Incidence (AOI), °: 61
Clear aperture: >90
Coating reflected GDD (s-pol), fs²: <100
Coating transmitted GDD (p-pol), fs²: <300
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 20 x 40
LIDT: >10 J/cm² @ 1064 nm, 10 ns, 10 Hz
Material: UVFS
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Transmission p-pol, %: >97.4
Transmission s-pol, %: <0.1
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 532
Wedge / Parallelism error: < 10 arcsec

Angle of Incidence (AOI), °: 55.6
Clear aperture: >90
Coating reflected GDD (s-pol), fs²: <200
Coating transmitted GDD (p-pol), fs²: <500
Dimensions tolerance, mm: (+0/-0.1)
Dimensions, mm: 20 x 40
Extinction Ratio: >1000:1
LIDT: >10 J/cm² @ 1064 nm, 10 ns, 10 Hz
Material: UVFS
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 5
Transmission p-pol, %: >99
Transmission s-pol, %: <0.1
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1064
Wedge / Parallelism error: <30 arcsec

Angle of Incidence (AOI), °: 55.4
Clear aperture: >90
Coating reflected GDD (s-pol), fs²: <200
Coating transmitted GDD (p-pol), fs²: <500
Dimensions tolerance, mm: +0/-0.12
Dimensions, mm: 20 x 40
Extinction Ratio: >1000:1
LIDT: >10 J/cm² @ 1064 nm, 10 ns, 10 Hz
Material: UVFS
Surface quality, S-D: 20-20
Thickness tolerance, mm: ±0.2
Thickness, mm: 5
Transmission p-pol, %: >99
Transmission s-pol, %: <0.1
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Wavelength, nm: 1030
Wedge / Parallelism error: < 30 arcsec

Angle of Incidence (AOI), °: Brewster angle
Clear Aperture: >90
Coating reflected GDD (s-pol), fs²: <200
Coating transmitted GDD (p-pol), fs²: <400
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Extinction Ratio: >1000:1
Material: UVFS
Parallelism error: <30 arcsec
Surface quality, S-D: 20-10
Typical LIDT: 7.1 J/cm² (s-pol); 3.2 J/cm² (p-pol) @ 1064 nm, 12 ns, 100 Hz
Transmission p-pol: >99%
Transmission s-pol: <0.1%
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 800

Angular field, °: >15
Beam deviation: <3 arcmin
Clear Aperture: 12.7
Coatings: Single layer MgF2
Extinction Ratio: <5 x 10⁻⁵
LIDT: >100 MW/cm²
Material: CaCO3
Mount: Black anodized aluminum
Surface quality, S-D: 40-20
Transmitted wavefront distortion, PV: <λ/4 @ 632.8 nm
Wavelength, nm: 350-2200

Angular field, °: >15
Beam deviation: <3 arcmin
Clear Aperture: 10
Coatings: Single layer MgF2
Extinction Ratio: <5 x 10⁻⁵
LIDT: >100 MW/cm²
Length, mm: 33
Material: Calcite
Mount: Black anodized aluminum
Outer diameter, mm: 25.4
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/4 @ 632.8 nm
Wavelength, nm: 350-2200

Angular field, °: >15
Beam deviation: <3 arcmin
CA, mm: 10
Clear Aperture: 10
Coatings: Single layer MgF2
Extinction Ratio: <5 x 10⁻⁵
LIDT: >100 MW/cm²
Length, mm: 33
Material: CaCO3
Mount: Black anodized aluminum
Outer diameter, mm: 25.4
Surface quality, S-D: 40-20
Transmitted wavefront distortion, PV: <λ/4 @ 632.8 nm
Wavelength, nm: 350-2200

Angular field, °: >15
Beam deviation: <3 arcmin
C.A., mm: Ø8
Clear Aperture: >90
Coatings: Single layer MgF2
Extinction ratio: <5 x 10⁻⁵
LIDT: >100 MW/cm²
Length, mm: 28 (±0.1)
Material: Calcite
Mount: Black anodized aluminum
O.D., mm: Ø25.4
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/2 @ 632.8 nm
Wavelength, nm: 350 - 2200

Clear Aperture: 8
LIDT: >500 MW/cm2
Mount: Ø12.7 x 6 mm black anodized metal mount
Retardation order: Low order
Retardation tolerance: λ/500 @ 20 °C
Retardation: λ/4
Surface quality, S-D: 20-10 after coating
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1550
Wedge / Parallelism error: < 3 arcsec

Surface quality, S-D: 20-10
Wavelength, nm: 800
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Retardation tolerance: +/- λ/300@ 20 °C
Retardation order: Low order
Mount: 25mm +0/-0.1 mm x 4 +/- 0.1
AR coatings: AR/AR (R<0.25 %) @ 800 nm
LIDT: >5J/cm2
Material: Crystalline Quartz
Clear Aperture: >18
Retardation: λ/2

Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Surface quality, S-D: 20-10
Retardation order: Zero order
Retardation tolerance: λ/300 @ 20 °C
Wavelength, nm: 1030
Mount: Ø25.4 x 6 mm black anodized metal mount
Material: Crystalline Quartz
LIDT: >10 J/cm² for 10 ns pulses @ 1064 nm
Clear Aperture: >8
AR coatings: (R<0.2%) on each surface
Retardation: λ/4
Parallelism error: <3 arcsec

AR coatings: (R<0.2%) on each surface
Clear Aperture: >10
LIDT: >10 J/cm² for 10 ns pulses @ 1064 nm
Material: Crystalline Quartz
Mount: Ø25.4 x 6 mm black anodized metal mount
Parallelism error: <30 arcsec
Retardation order: Low order
Retardation tolerance: λ/150 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 421.6

AR coatings: (R<0.2%) on each surface
Clear Aperture: >8
LIDT: >10 J/cm² for 10 ns pulses @ 1064 nm
Material: Crystalline Quartz
Mount: Ø12.7 x 6 mm black anodized metal mount
Parallelism error: <3 arcsec
Retardation order: Zero order
Retardation tolerance: λ/300 @ 20 °C
Retardation: λ/4
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1064

AR coatings: (R<0.2%) on each surface
Clear Aperture: >8
LIDT: >10 J/cm² for 10 ns pulses @ 1064 nm
Material: Crystalline Quartz
Mount: Ø25.4 x 6 mm black anodized metal mount
Parallelism error: <3 arcsec
Retardation order: Zero order
Retardation tolerance: λ/300 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1064

AR coatings: (R<0.2%) on each surface
Clear Aperture: >8
LIDT: >10 J/cm² for 10 ns pulses @ 1064 nm
Material: Crystalline Quartz
Mount: Ø25.4 x 6 mm black anodized metal mount
Parallelism error: <3 arcsec
Retardation order: Zero order
Retardation tolerance: λ/300 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1030

AR coatings: (R<0.2%) on each surface
Clear Aperture: >18
LIDT: >10 J/cm² for 10 ns pulses @ 1064 nm
Material: Crystalline Quartz
Mount: Ø25.4 x 6 mm black anodized metal mount
Parallelism error: <3 arcsec
Retardation order: Zero order
Retardation tolerance: λ/300 @ 20 °C
Retardation: λ/4
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 980

AR coatings: (R<0.2%) on each surface
Clear Aperture: >18
LIDT: >10 J/cm² for 10 ns pulses @ 1064 nm
Material: Crystalline Quartz
Mount: Ø25.4 x 6 mm black anodized metal mount
Parallelism error: <30 arcsec
Retardation order: Low order
Retardation tolerance: λ/300 @ 20 °C
Retardation: λ/4
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1030

AR coatings: (R<0.2%) on each surface
Clear Aperture: >18
LIDT: >10 J/cm² for 10 ns pulses @ 1064 nm
Material: Crystalline Quartz
Mount: Ø25.4 x 6 mm black anodized metal mount
Parallelism error: <3 arcsec
Retardation order: Low order
Retardation tolerance: λ/300 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 343

AR coatings: (R<0.2%) on each surface
Clear Aperture: >18
LIDT: >10 J/cm² for 10 ns pulses @ 1064 nm
Material: Crystalline Quartz
Mount: Ø25.4 x 6 mm black anodized metal mount
Parallelism error: <3 arcsec
Retardation order: Zero order
Retardation tolerance: λ/300 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 980

AR coatings: (R<0.2%) on each surface
Clear Aperture: >18
LIDT: >10 J/cm² for 10 ns pulses @ 1064 nm
Material: Crystalline Quartz
Mount: Ø25.4 x 6 mm black anodized metal mount
Parallelism error: <3 arcsec
Retardation order: Low order
Retardation tolerance: λ/300 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 633

AR coatings: (R<0.2%) on each surface
Clear Aperture: >18
LIDT: >10 J/cm² for 10 ns pulses @ 1064 nm
Material: Crystalline Quartz
Mount: Ø25.4 x 6 mm black anodized metal mount
Parallelism error: <30 arcsec
Retardation order: Low order
Retardation tolerance: λ/300 @ 20 °C
Retardation: λ/4
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 473

AR coatings: R<0.2% at each surface
Clear Aperture: >8
LIDT: 5 J/cm² 10 ns pulsed @ 1064 nm typical
Material: Crystalline Quartz
Mount: Mounted in Ø12.7 x 6 mm black anodized metal mount
Parallelism error: < 3 arcsec
Retardation order: Zero order
Retardation tolerance: λ/300 @ 20 °C
Retardation: λ/4
Surface quality, S-D: 20-10 after coating
Transmitted wavefront distortion, PV: λ/10 @ 632.8 nm
Wavelength, nm: 1030

LIDT: >10 J/cm² for 10 ns pulses @ 1064 nm
Wavelength, nm: 800
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Surface quality, S-D: 20-10
Retardation: λ/4
Retardation tolerance: λ/300 @ 20 °C
Retardation order: Zero order
Parallelism error: <3 arcsec
Material: Crystalline Quartz
Configuration: Air spaced
Clear Aperture: >18
AR coatings: R<0.2% @ 800 nm on each surface
Mount: Ø25.4 x 6 mm black anodized metal mount

Retardation order: Zero order
Wavelength, nm: 1064
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Surface quality, S-D: 20-10
Retardation tolerance: λ/300 @ 20 °C
Clear Aperture: >18
AR coatings: R<0.2% @ 1064 nm + R<5% @ 633nm on each surface
Retardation: λ/2
AR coatings: R<0.2% @ 1064 nm on each surface
Configuration: Air spaced
LIDT: >10 J/cm² for 10 ns pulses @ 1064 nm
Material: Crystalline Quartz
Mount: Ø25.4 x 6 mm black anodized metal mount
Parallelism error: <3 arcsec

Angular field, °: >6.0
Beam deviation: <3 arcmin
Clear Aperture: 8
Coatings: Single layer MgF2
Extinction Ratio: <5 x 10⁻⁶
LIDT: >200 MW/cm²
Length, mm: 17
Material: a-BBO
Mount: Black anodized aluminum
Outer diameter, mm: 25.4
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/4 @ 632.8 nm
Wavelength, nm: 220-350

Length, mm: 18 (±0.1)
Transmitted wavefront distortion, PV: <λ/2 @ 632.8 nm
Surface quality, S-D: 20-10
Material: Calcite
Mount: Black anodized aluminum
Wavelength, nm: 350-3000
Extinction Ratio: <5 x 10⁻⁵
Coatings: Single layer MgF2
Clear Aperture: >90
C.A., mm: Ø10
Beam deviation: <3 arcmin
Angular field, °: 19.0 @ 980 nm
LIDT: >100 MW/cm²
O.D., mm: Ø25.4

LIDT: >100 MW/cm²
Wavelength, nm: 200-2300
Transmitted wavefront distortion, PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 20-10
O.D., mm: Ø25.4
Mount: Black anodized aluminum
Length, mm: 28 (±0.1)
Extinction Ratio: <5 x 10⁻⁴
Coatings: Single layer MgF2
Clear Aperture: >90
C.A., mm: Ø10
Beam deviation: <3 arcmin
Angular field, °: 2.0 @ 1064 nm
Material: Quartz

Angle of Incidence (AOI), °: 45
Clear aperture: >90
Dimensions tolerance, mm: +0/-0.1
Dimensions, mm: 50.8
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Surface quality, S-D: 20-10
Thickness tolerance, mm: ±0.1
Thickness, mm: 6
Transmission p-pol, %: >95
Transmission s-pol, %: <1
Wavelength, nm: 1350
Wedge / Parallelism error: <30 arcsec

Thickness, mm: 5 (±0.1)
Material: UVFS
Wavelength, nm: 1064
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Surface quality, S-D: 20-10
S2: N/A
Parallelism error: <30 arcsec
LIDT for Rs: >10 J/cm2, 10 ns, 10 Hz, 1064 nm
Extinction Ratio: >1000:1
Dimensions, mm: 20 x 50 (+0/-0.1)
Coatings:
Clear Aperture: >90
S1: Pol (Tp>99%, Rs>99.9%) @1064, AOI=45 deg (±1°)

Thickness, mm: 5 (±0.1)
Angle of Incidence (AOI), °: 45 (angle tunning ±1.5)
Clear Aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.1)
Extinction Ratio: >1000:1
Material: UVFS
Protective chamfers: 0.1-0.3 mm x 45°
Surface quality, S-D: 20-10
Typical LIDT: 7.1 J/cm² (s-pol); 3.2 J/cm² (p-pol) @ 1064 nm, 12 ns, 100 Hz;
Transmission p-pol, %: >97
Transmission s-pol, %: <0.1
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Wavelength, nm: 1064
Wedge / Parallelism error: <30 arcsec

Thickness, mm: 5 (±0.1)
Angle of Incidence (AOI), °: 45 (angle tunning ±1.5)
Clear Aperture: >90
Dimensions, mm: Ø25.4 (+0/-0.1)
Extinction Ratio: >500:1
LIDT: >4 J/cm² @ 355 nm; 10 ns; 10 Hz for s-pol & >1 J/cm² @ 355 nm; 10 ns; 10 Hz for p-pol;
Material: UVFS
Protective chamfers: 0.2-0.3 mm x 45°
Surface quality, S-D: 20-10
Transmission p-pol, %: >97
Transmission s-pol, %: <0.2
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Wavelength, nm: 355
Wedge / Parallelism error: <30 arcsec

Thickness, mm: 5 (±0.1)
Transmission p-pol, %: >97.5
Wavelength, nm: 532
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Angle of Incidence (AOI), °: 45 (angle tunning ±1.5)
Transmission p-pol, %: >98
Typical LIDT: 15 J/cm² (s-pol); 7 J/cm² (p-pol) @ 1064 nm, 12 ns, 100 Hz
Protective chamfers: 0.1-0.3 mm x 45°
Parallelism error: <30 arcsec
Material: UVFS
Extinction Ratio: ~ 1000:1 (with angular adjustment of ±1.5°)
Dimensions, mm: Ø25.4 (+0/-0.1)
Clear Aperture: >90
Clear Aperture: 90
Surface quality, S-D: 20-10
Transmission s-pol, %: <0.2

AR coatings: AR (R<0.2%) on each surface
Clear Aperture: >18
Clockwise polarization rotation, deg: 90
LIDT: >10 J/cm² @ 1064 nm; 10 ns; 10 Hz
Material: Crystalline Quartz
Mount: Ø25.4 x 6 mm black anodized aluminum mount
Retardation tolerance: <5 arcmin
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Wavelength, nm: 355
Wedge / Parallelism error: <10 arcsec

AR coatings: AR (R<0.2%) on each surface
Clear Aperture: >18
Clockwise polarization rotation, deg: 45
LIDT: >10 J/cm² @ 1064 nm; 10 ns; 10 Hz
Material: Crystalline Quartz
Mount: Ø25.4 x 12 mm black anodized aluminum mount
Retardation tolerance: <5 arcmin
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Wavelength, nm: 1064
Wedge / Parallelism error: <10 arcsec

AR coatings: AR (R<0.2%) on each surface
Clear Aperture: >18
Clockwise polarization rotation, deg: 90
LIDT: >10 J/cm² @ 1064 nm; 10 ns; 10 Hz
Material: Crystalline Quartz
Mount: Ø25.4 x 8 mm black anodized aluminum mount
Retardation tolerance: <5 arcmin
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Wavelength, nm: 532
Wedge / Parallelism error: <10 arcsec

AR coatings: AR (R<0.2%) on each surface
Clear Aperture: 10 x 10
Configuration: Optically bonded on UVFS (C7980) substrate
LIDT: >15 J/cm² @ 1064 nm; 10 ns; 10 Hz
Material: Crystalline Quartz
Mount: unmounted
Retardation order: True Zero order
Retardation tolerance: ±λ/300 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1030
Wedge / Parallelism error: <30 arcsec

Acceptance angle, °: 11
AR coatings: AR(R<0.2%) on each surface
Clear Aperture: >18
LIDT: >20 J/cm² @ 1064 nm; 10 ns; 10 Hz
Material: Crystalline quartz or MgF2
Mount: Ø25.4 x 6 mm black anodized aluminum
Retardation order: 0
Retardation tolerance: λ/300 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 980
Wedge / Parallelism error: <3 arcsec

Wavelength, nm: 515
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Surface quality, S-D: 20-10
Retardation order: 1st
Retardation tolerance: λ/300 @ 20 °C
Wedge / Parallelism error: <3 arcsec
Mount: Ø12.7 x 6 mm black anodized aluminum
Material: Crystalline Quartz
LIDT: >20 J/cm² @ 1064 nm; 10 ns; 10 Hz
Configuration: Optically bonded on UVFS (C7980) substrate
Clear Aperture: >8
Acceptance angle, °: 11
AR coatings: R<0.2% @ 515 nm on each surface
Retardation: λ/2

Acceptance angle, °: 11
AR coatings: R<0.2% @ 400 nm on each surface
Clear Aperture: >18
Configuration: Optically bonded on UVFS (C7980) substrate
LIDT: >20 J/cm² @ 1064 nm; 10 ns; 10 Hz
Material: Crystalline Quartz
Mount: Ø25.4 x 6 mm black anodized aluminum
Retardation order: 2nd
Retardation tolerance: λ/200 @ 20 °C
Retardation: λ/4
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 400
Wedge / Parallelism error: <3 arcsec

Acceptance angle, °: 11
AR coatings: R<0.5% @ 266 nm on each surface
Clear Aperture: >18
Configuration: Optically bonded on UVFS (C7980) substrate
LIDT: >20 J/cm² @ 1064 nm; 10 ns; 10 Hz
Material: Crystalline Quartz
Mount: Ø25.4 x 6 mm black anodized aluminum
Retardation order: 4th
Retardation tolerance: λ/100 @ 20 °C
Retardation: λ/4
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 266
Wedge / Parallelism error: <3 arcsec

Acceptance angle, °: 11
AR coatings: R<0.2% @ 1550 nm on each surface
Clear Aperture: >18
Configuration: Optically bonded on UVFS (C7980) substrate
LIDT: >20 J/cm² @ 1064 nm; 10 ns; 10 Hz
Material: Crystalline Quartz
Mount: Ø25.4 x 6 mm black anodized aluminum
Retardation order: 0
Retardation tolerance: λ/300 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1550
Wedge / Parallelism error: <3 arcsec

Acceptance angle, °: 11
AR coatings: R<0.2% @ 800 nm on each surface
Clear Aperture: >18
Configuration: Optically bonded on UVFS (C7980) substrate
LIDT: >20 J/cm² @ 1064 nm; 10 ns; 10 Hz
Material: Crystalline Quartz
Mount: Ø25.4 x 6 mm black anodized aluminum
Retardation order: 1st
Retardation tolerance: λ/300 @ 20 °C
Retardation: λ/4
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 800
Wedge / Parallelism error: <3 arcsec

Acceptance angle, °: 11
AR coatings: R<0.2% @ 780 nm on each surface
Clear Aperture: >18
Configuration: Optically bonded on UVFS (C7980) substrate
LIDT: >20 J/cm² @ 1064 nm; 10 ns; 10 Hz
Material: Crystalline Quartz
Mount: Ø25.4 x 6 mm black anodized aluminum
Retardation order: 1st
Retardation tolerance: λ/300 @ 20 °C
Retardation: λ/4
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 780
Wedge / Parallelism error: <3 arcsec

Acceptance angle, °: 11
AR coatings: R<0.2% @ 515 nm on each surface
Clear Aperture: >18
Configuration: Optically bonded on UVFS (C7980) substrate
LIDT: >20 J/cm² @ 1064 nm; 10 ns; 10 Hz
Material: Crystalline Quartz
Mount: Ø25.4 x 6 mm black anodized aluminum
Retardation order: 2nd
Retardation tolerance: λ/300 @ 20 °C
Retardation: λ/4
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 515
Wedge / Parallelism error: <3 arcsec

Acceptance angle, °: 11
AR coatings: R<0.2% @ 1064 nm on each surface
Clear Aperture: >18
Configuration: Optically bonded on UVFS (C7980) substrate
LIDT: >20 J/cm² @ 1064 nm; 10 ns; 10 Hz
Material: Crystalline Quartz
Mount: Ø25.4 x 6 mm black anodized aluminum
Retardation order: 1st
Retardation tolerance: λ/300 @ 20 °C
Retardation: λ/4
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1064
Wedge / Parallelism error: <3 arcsec

Acceptance angle, °: 11
AR coatings: R<0.2% @ 1550 nm on each surface
Clear Aperture: >18
Configuration: Optically bonded on UVFS (C7980) substrate
LIDT: >20 J/cm² @ 1064 nm; 10 ns; 10 Hz
Material: Crystalline Quartz
Mount: Ø25.4 x 6 mm black anodized aluminum
Retardation order: 0
Retardation tolerance: λ/300 @ 20 °C
Retardation: λ/4
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 1550
Wedge / Parallelism error: <3 arcsec

Acceptance angle, °: 11
AR coatings: R<0.2% @ 800 nm on each surface
Clear Aperture: >18
Configuration: Optically bonded on UVFS (C7980) substrate
LIDT: >20 J/cm² @ 1064 nm; 10 ns; 10 Hz
Material: Crystalline Quartz
Mount: Ø25.4 x 6 mm black anodized aluminum
Retardation order: 0
Retardation tolerance: λ/300 @ 20 °C
Retardation: λ/2
Surface quality, S-D: 20-10
Transmitted wavefront distortion, PV: <λ/10 @ 632.8 nm
Wavelength, nm: 800
Wedge / Parallelism error: <3 arcsec