9817411

S2: AR (R<0,5%) @ 213 nm, AOI 0-5° EB1
S1: AR (R<0,5%) @ 213 nm, AOI 0-5° EB1
Wedge / Parallelism error: <1 arcmin
Thickness, mm: 2 (±0.1) mm
Protective chamfers: 45° x 0.1-0.25mm
Clear aperture: >18 mm
Material: CaF2, 193nm grade, LD-A, random orientation, single crystal
S1 Flatness, PV IR S2 Flatness, PV: λ/6 @ 632.8nm
Diameter, mm: Ø20 (+0/-0.1) mm
Surface quality: 40-20 S-D