In stock
S2: AR (R<0.2%) @ 343 nm, AOI 0 deg
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
S1: AR (R<0.2%) @ 343 nm, AOI 0 deg
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Edge thickness, mm: 4 (±0.1)
Dimensions, mm: Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Clear Aperture: >90
Centration error: <3 arcmin
Center thickness, mm: 3.1 (±0.1)
Focal length, mm: -200 (±3%)
Surface quality, S-D: 40-20
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
S1: AR (R<0.2%) @ 343 nm, AOI 0 deg
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Edge thickness, mm: 4 (±0.1)
Dimensions, mm: Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Clear Aperture: >90
Centration error: <3 arcmin
Center thickness, mm: 3.1 (±0.1)
Focal length, mm: -200 (±3%)
Surface quality, S-D: 40-20
