In stock
S1/S2 Surface quality: 5/ 2 x 0.016 (10-5 S-D under concentrated light source)
Wedge along 8 mm side: 1° (±0.016°)
S1/S2 Test area, mm: Ø2 central CA
S1/S2 Surface form error, fr: 3/ 0.4 (0.2) (<λ/10 @ 633 nm)
Protective chamfers: 0.1-0.3 mm x 45°
Perpendicularity to A surface: 0.01 mm (according to drawing)
Material: C7979
Laser engraved, height of separated characters 2 mm: 600-01 (as per production drawing)
Chips: <0.1 mm
Grinded 8 x 3 mm sides Surface roughness: 2 μm < Rq < 4 μm
Dimensions, mm: 8 x 6 (±0.1)
Grinded 6 x 3 mm sides Surface roughness: Rq < 4 μm
Thickness of thicker edge, mm: 3.1 (±0.1)
Parallelism to B surface: 0.02 mm (according to drawing)
Wedge along 8 mm side: 1° (±0.016°)
S1/S2 Test area, mm: Ø2 central CA
S1/S2 Surface form error, fr: 3/ 0.4 (0.2) (<λ/10 @ 633 nm)
Protective chamfers: 0.1-0.3 mm x 45°
Perpendicularity to A surface: 0.01 mm (according to drawing)
Material: C7979
Laser engraved, height of separated characters 2 mm: 600-01 (as per production drawing)
Chips: <0.1 mm
Grinded 8 x 3 mm sides Surface roughness: 2 μm < Rq < 4 μm
Dimensions, mm: 8 x 6 (±0.1)
Grinded 6 x 3 mm sides Surface roughness: Rq < 4 μm
Thickness of thicker edge, mm: 3.1 (±0.1)
Parallelism to B surface: 0.02 mm (according to drawing)
