In stock
Surface quality, S-D: 40-20
Surface irregularity, PV: <λ/4 @ 632.8 nm
S2: AR(R<0.2%)@800nm
S1: AR(R<0.2%)@800nm
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Wavelength, nm: 355
Focal length, mm: per request
Dimensions, mm: Ø25.4 (+0/-0.12)
Coatings:
Clear Aperture: >90
Centration error: <3 arcmin
Center thickness, mm: 4 (±0.2)
Focal length tolerance: ± 2%
Focus length: 400 mm
Surface irregularity, PV: <λ/4 @ 632.8 nm
S2: AR(R<0.2%)@800nm
S1: AR(R<0.2%)@800nm
Material: UVFS
Protective chamfers: <0.25 mm x 45°
Wavelength, nm: 355
Focal length, mm: per request
Dimensions, mm: Ø25.4 (+0/-0.12)
Coatings:
Clear Aperture: >90
Centration error: <3 arcmin
Center thickness, mm: 4 (±0.2)
Focal length tolerance: ± 2%
Focus length: 400 mm
