In stock
Parallelism error: < 1 arcmin
Thickness, mm: 3 mm (+/-0.1 mm)
Surface quality: 20-10 S-D
S1 Flatness, PV IR S2 Flatness, PV: < L/8 @ 632.8 nm
S2: uncoated
Protective chamfers: 0.1-0.3 mm x 45 deg
Material: FS
Diameter, mm: 12.7 mm (+0/-0.1 mm)
Coatings:
Clear aperture: >85 %
Chips: < 0.3 mm
S1(^): HR(Rs>99.7, Rp>99.3%) @ 515 nm, AOI=45 deg, high LIDT design
Thickness, mm: 3 mm (+/-0.1 mm)
Surface quality: 20-10 S-D
S1 Flatness, PV IR S2 Flatness, PV: < L/8 @ 632.8 nm
S2: uncoated
Protective chamfers: 0.1-0.3 mm x 45 deg
Material: FS
Diameter, mm: 12.7 mm (+0/-0.1 mm)
Coatings:
Clear aperture: >85 %
Chips: < 0.3 mm
S1(^): HR(Rs>99.7, Rp>99.3%) @ 515 nm, AOI=45 deg, high LIDT design
