In stock
Protective chamfers: 0.1-0.3 mm x 45 deg
S2 Surface quality, S-D: commercially polished
S1 Surface quality, S-D: 20-10 S-D
Surface flatness (PV), S1: < L/10 @ 632.8 nm per 17x12 ellipse, any point in clear aperture
S1(^): HRp > 99.9% GDDRp <50 fs^2 @ 511-516 + 1022-1032 nm, AOI=45 deg, IBS, high LIDT design
Thickness, mm: 9 mm (+/-0.1 mm)
Perpendicularity error: +/- 5 arcmin between S1 and base A (28 mm x 9 mm)
Parallelism error between S1 and S2: < 30 arcsec
Material: UVFS
Dimensions, mm: 28 mm x 25 mm (+0/-0.1 mm)
Coatings:
Clear aperture: 27 mm x 24 mm rectangular
base A (28 mm x 9 mm): Cr+Gold coating, minimum coated area 28 mm x 7.5 mm
S2: stress compensation
S2 Surface quality, S-D: commercially polished
S1 Surface quality, S-D: 20-10 S-D
Surface flatness (PV), S1: < L/10 @ 632.8 nm per 17x12 ellipse, any point in clear aperture
S1(^): HRp > 99.9% GDDRp <50 fs^2 @ 511-516 + 1022-1032 nm, AOI=45 deg, IBS, high LIDT design
Thickness, mm: 9 mm (+/-0.1 mm)
Perpendicularity error: +/- 5 arcmin between S1 and base A (28 mm x 9 mm)
Parallelism error between S1 and S2: < 30 arcsec
Material: UVFS
Dimensions, mm: 28 mm x 25 mm (+0/-0.1 mm)
Coatings:
Clear aperture: 27 mm x 24 mm rectangular
base A (28 mm x 9 mm): Cr+Gold coating, minimum coated area 28 mm x 7.5 mm
S2: stress compensation
