In stock
Reflectivity (average), %: >99.5
Wedge / Parallelism error: <1 arcmin
Wavelength, nm: 760-840
Surface quality, S-D: 20-10
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
GDD, fs²: s-pol: ±10; p-pol: ±20
LIDT: 0.4 J/m² @800 nm
AOI, °: 45
Dimensions, mm: Ø25.4 (+0/-0.1) x 7 (±0.1)
Clear Aperture: >90%
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Wedge / Parallelism error: <1 arcmin
Wavelength, nm: 760-840
Surface quality, S-D: 20-10
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
GDD, fs²: s-pol: ±10; p-pol: ±20
LIDT: 0.4 J/m² @800 nm
AOI, °: 45
Dimensions, mm: Ø25.4 (+0/-0.1) x 7 (±0.1)
Clear Aperture: >90%
Protective chamfers: <0.25 mm x 45°
Material: UVFS
