9798849

S1: HR (Rs>99.5%, Rp>99.0%) @ 343-355 nm, AOI 45°
Wedge / Parallelism error: <3 arcmin
Thickness, mm: 9.5 (±0.1)
Surface quality, S-D: Grounded (S2)
S2: Uncoated
Protective chamfers: <0.25 mm x 45°
Material: UVFS C7980
S1 Flatness, PV IR S2 Flatness, PV: Dimensions, mm: Ø38.1 (+0.0/-0.1)
Coatings:
Clear Aperture: >90
Surface quality, S-D: 20-10 (S1)