In stock
Surface flatness (PV), S1/S2: < L/2 @ 632.8 nm, per clear aperture
Protective chamfers: 0.1-0.2 mm x 45 deg
Thickness, mm: 1 mm (+/-0.1 mm)
Chips: < 0.2 mm
Material: Infrasil 302
Clear aperture: >85 %, central area
Diameter, mm: 12.7 mm (+0/-0.1 mm)
Surface quality, S1/S2: 20-10 S-D
Parallelism error: < 1 arcmin
Protective chamfers: 0.1-0.2 mm x 45 deg
Thickness, mm: 1 mm (+/-0.1 mm)
Chips: < 0.2 mm
Material: Infrasil 302
Clear aperture: >85 %, central area
Diameter, mm: 12.7 mm (+0/-0.1 mm)
Surface quality, S1/S2: 20-10 S-D
Parallelism error: < 1 arcmin
