In stock
Wavelength, nm: 632.8
Surface quality, S-D: 40-20
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
ROC S1, mm: +22.85
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Focal length, mm: +50 (±3%)
Dimensions, mm: Ø12.7 (+0/-0.1)
Clear Aperture: >90
Centration error: <3 arcmin
Center thickness, mm: 2.9 (±0.1)
Edge thickness, mm: 2 (±0.1)
Surface quality, S-D: 40-20
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
ROC S1, mm: +22.85
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Focal length, mm: +50 (±3%)
Dimensions, mm: Ø12.7 (+0/-0.1)
Clear Aperture: >90
Centration error: <3 arcmin
Center thickness, mm: 2.9 (±0.1)
Edge thickness, mm: 2 (±0.1)
