In stock
S1 Flatness, PV IR S2 Flatness, PV: < L/6 @ 633 nm over clear aperture
Transmitted wavefront distortion, PV: < L/8 @ 633 nm over clear aperture
Thickness thick: 3 mm (+/-0.05 mm)
Surface roughness (RMS): < 10 angstrom
Surface quality, S1/S2: 20-10 S-D
Parallelism error: < 1 arcmin
Material: CaF2 from Hellma (supplied by Altechna)
Diameter, mm: 25.4 mm (+0/-0.1 mm)
Chips: < 0.2 mm
Clear aperture: >21.5 mm diameter central area
Protective chamfers: 0.1-0.3 mm x 45 deg
Transmitted wavefront distortion, PV: < L/8 @ 633 nm over clear aperture
Thickness thick: 3 mm (+/-0.05 mm)
Surface roughness (RMS): < 10 angstrom
Surface quality, S1/S2: 20-10 S-D
Parallelism error: < 1 arcmin
Material: CaF2 from Hellma (supplied by Altechna)
Diameter, mm: 25.4 mm (+0/-0.1 mm)
Chips: < 0.2 mm
Clear aperture: >21.5 mm diameter central area
Protective chamfers: 0.1-0.3 mm x 45 deg
