In stock
Surface quality, S-D: 40-20
Wedge / Parallelism error: <5 arcmin
S1, S2 Flatness: <λ/4 @ 633nm
Protective chamfers: <0.35mm at 45deg typical
Material: UVFS
Diameter, mm: 50.8 (±0.25)
Thickness, mm: 3.2 (±0.1)
Clear aperture %: >90
Wedge / Parallelism error: <5 arcmin
S1, S2 Flatness: <λ/4 @ 633nm
Protective chamfers: <0.35mm at 45deg typical
Material: UVFS
Diameter, mm: 50.8 (±0.25)
Thickness, mm: 3.2 (±0.1)
Clear aperture %: >90