In stock
S1 (marked): HR (R>99%) @ 532 nm + HT (T>98.2%) @ 1064 nm, AOI 35-55°
Thickness, mm: 5.8 (±0.2)
Clear aperture: >Ø24 mm
Surface quality, S-D: 20-10
S2: AR (R<2%) @ 1064 nm, AOI 35-55°
Parallelism error: < 30 arcmin
Material: UV Fused Silica
Flatness RMS: ≤λ/4 @ 633 nm
Coatings:
Dimensions, mm: Ø25.2 (±0.2)
Protective chamfers: 0.25-0.5 mm
Thickness, mm: 5.8 (±0.2)
Clear aperture: >Ø24 mm
Surface quality, S-D: 20-10
S2: AR (R<2%) @ 1064 nm, AOI 35-55°
Parallelism error: < 30 arcmin
Material: UV Fused Silica
Flatness RMS: ≤λ/4 @ 633 nm
Coatings:
Dimensions, mm: Ø25.2 (±0.2)
Protective chamfers: 0.25-0.5 mm
