In stock
Parallelism error: < 1 arcmin
Thickness, mm: 3 mm (+/-0.1 mm)
S2 Surface quality, S-D: inspection polished
S1 Surface quality, S-D: 40-20 S-D
Surface flatness S2: not specified
Surface flatness S1:
Protective chamfers: 0.1-0.2 mm x 45 deg
Material: UVFS
Dimensions, mm: 6 mm x 6 mm (+0/-0.1 mm)
Coatings:
Clear aperture: 5 mm x 5 mm, central area
Chips: <0.2 mm
S1: PR(R=85% +/-1%) @ 1064 nm, AOI=0 deg
Thickness, mm: 3 mm (+/-0.1 mm)
S2 Surface quality, S-D: inspection polished
S1 Surface quality, S-D: 40-20 S-D
Surface flatness S2: not specified
Surface flatness S1:
Protective chamfers: 0.1-0.2 mm x 45 deg
Material: UVFS
Dimensions, mm: 6 mm x 6 mm (+0/-0.1 mm)
Coatings:
Clear aperture: 5 mm x 5 mm, central area
Chips: <0.2 mm
S1: PR(R=85% +/-1%) @ 1064 nm, AOI=0 deg
