9770487

Protective chamfers: 0.1-0.3 mm x 45 deg
Thickness, mm: 5 mm (+/-0.1 mm)
S2 Surface quality, S-D: polished
S1 Surface quality, S-D: 20-10 S-D
Surface flatness S1: S1(^): HR(R>99.8%) @ 1534 nm, HT(T>99.7%) @ 1000-1030 nm, AOI=0 deg
Parallelism error: <1 arcmin
Material: Fused Silica
Coatings:
Clear aperture: >90 %
Chips: <0.2 mm
Aperture: 40 mm x 10 mm (+0/-0.1 mm)
S2: AR(R<0.1%) @ 1000-1030 nm, AOI=0 deg