In stock
Thickness, mm: 3 (±0.1)
S2: HRavg>99.8% @ 1029-1080 nm + HRavg>99% @ 1100-1120 nm + HRavg>98% @ 650 nm, AOI = 44-46°
S1/S2 Surface quality: 3 x 0.25; L1 x 0.04
Perpendicularity of top to A side: <17 arcmin
S1(^): HRavg>99.8% @ 1029-1080 nm + HRavg>99% @ 1100-1120 nm + HRavg>98% @ 650 nm, AOI = 44-46°
Protective chamfers: 0.1-0.3 mm x 45°
Parallelism error: <5 arcmin
Material: N-BK7 or H-K9L
LIDT: 5 J/cm² @ 1030 nm, 10 ns, 100 Hz
Dimensions, mm: 25 x 18 (±0.1), according to drawing
Coatings: MS
Clear Aperture: 22 x 15 ellipse
Perpendicularity of bottom to A side: <12 arcmin
S1/S2 Surface form error, fr: 0.17 (0.2) @ 633 nm in reduced test area 20 x 13 ellipse
S2: HRavg>99.8% @ 1029-1080 nm + HRavg>99% @ 1100-1120 nm + HRavg>98% @ 650 nm, AOI = 44-46°
S1/S2 Surface quality: 3 x 0.25; L1 x 0.04
Perpendicularity of top to A side: <17 arcmin
S1(^): HRavg>99.8% @ 1029-1080 nm + HRavg>99% @ 1100-1120 nm + HRavg>98% @ 650 nm, AOI = 44-46°
Protective chamfers: 0.1-0.3 mm x 45°
Parallelism error: <5 arcmin
Material: N-BK7 or H-K9L
LIDT: 5 J/cm² @ 1030 nm, 10 ns, 100 Hz
Dimensions, mm: 25 x 18 (±0.1), according to drawing
Coatings: MS
Clear Aperture: 22 x 15 ellipse
Perpendicularity of bottom to A side: <12 arcmin
S1/S2 Surface form error, fr: 0.17 (0.2) @ 633 nm in reduced test area 20 x 13 ellipse
