In stock
Reflectivity, %: Rs>99.8; Rp>99.6
Wavelength, nm: 1020-1070
S1 Surface quality, S-D: 20-10
S1 Flatness, PV: <λ/8 @ 632.8 nm
Protective chamfers: 0.1-0.25 mm x 45°
Parallelism error: <1 arcmin
Material: UVFS
Dimensions, mm: Ø12.7 (+0/-0.1) x 3 (±0.1)
Angle of Incidence (AOI), °: 45
Clear Aperture: >90
Wavelength, nm: 1020-1070
S1 Surface quality, S-D: 20-10
S1 Flatness, PV: <λ/8 @ 632.8 nm
Protective chamfers: 0.1-0.25 mm x 45°
Parallelism error: <1 arcmin
Material: UVFS
Dimensions, mm: Ø12.7 (+0/-0.1) x 3 (±0.1)
Angle of Incidence (AOI), °: 45
Clear Aperture: >90
