In stock
Thickness, mm: 1 (±0.1)
S1: AR(Ravg<0.65%) @ 1064 nm, AOI = 45°
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm per CA
Surface quality S1/S2, S-D: 20-10
S2: AR(Ravg<0.65%) @ 1064 nm, AOI = 45°
Parallelism error: <30 arcsec
Material: UVFS (C7980 0F)
Clear aperture: >90%
Dimensions, mm: 15 x 21 (+0/-0.1)
Coatings: e-beam
Protective chamfers: 0.1-0.25 mm x 45°
S1: AR(Ravg<0.65%) @ 1064 nm, AOI = 45°
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm per CA
Surface quality S1/S2, S-D: 20-10
S2: AR(Ravg<0.65%) @ 1064 nm, AOI = 45°
Parallelism error: <30 arcsec
Material: UVFS (C7980 0F)
Clear aperture: >90%
Dimensions, mm: 15 x 21 (+0/-0.1)
Coatings: e-beam
Protective chamfers: 0.1-0.25 mm x 45°
