In stock
Material: UVFS
Wavelength, nm: 517+1035
Surface quality, S-D: 20-10
Reflectivity, %: R>99.5
Angle of Incidence (AOI), °: 45
Parallelism error: <1 arcmin
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Dimensions, mm: Ø30 (+0/-0.1) x 5 (±0.1)
Clear Aperture: >90
Protective chamfers: <0.25 mm x 45°
Wavelength, nm: 517+1035
Surface quality, S-D: 20-10
Reflectivity, %: R>99.5
Angle of Incidence (AOI), °: 45
Parallelism error: <1 arcmin
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Dimensions, mm: Ø30 (+0/-0.1) x 5 (±0.1)
Clear Aperture: >90
Protective chamfers: <0.25 mm x 45°
