In stock
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Wavelength, nm: 515
Surface quality, S-D: 20-10
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Angle of Incidence (AOI), °: 45
GDD, fs²: s-pol: ±10 fs²; p-pol: ±30 fs²
Wavelength, nm: 515
Surface quality, S-D: 20-10
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Angle of Incidence (AOI), °: 45
GDD, fs²: s-pol: ±10 fs²; p-pol: ±30 fs²
