In stock
S1 Flatness, PV: <λ/2@633 nm per CA
Surface irregularity, P-V, S2: <λ/2@633 nm per CA
S2: AR<0.5% @257, AOI=0°
S1: AR<0.5% @257, AOI=0°
Protective chamfers: <0.25 mm x 45°
Material: CaF2
Edge thickness, mm: 3.0 (±0.1)
Diameter, mm: 25.4 (+0.0/-0.1)
Coatings:
Centration error: <3 arcmin
Clear aperture: >90%
Surface quality, S1/S2: 60/40 S/D
Focus length, mm: +1000.0 (±1%) @ 257 nm
Surface irregularity, P-V, S2: <λ/2@633 nm per CA
S2: AR<0.5% @257, AOI=0°
S1: AR<0.5% @257, AOI=0°
Protective chamfers: <0.25 mm x 45°
Material: CaF2
Edge thickness, mm: 3.0 (±0.1)
Diameter, mm: 25.4 (+0.0/-0.1)
Coatings:
Centration error: <3 arcmin
Clear aperture: >90%
Surface quality, S1/S2: 60/40 S/D
Focus length, mm: +1000.0 (±1%) @ 257 nm
