In stock
Reflectivity (average), %: >99
Wedge / Parallelism error: <1 arcmin
Wavelength, nm: 950-1100
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Dimensions, mm: Ø50.8 (+0/-0.1) x 6 (±0.1)
Clear Aperture: >90%
AOI, °: 45
Surface quality, S-D: 20-10
Wedge / Parallelism error: <1 arcmin
Wavelength, nm: 950-1100
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Dimensions, mm: Ø50.8 (+0/-0.1) x 6 (±0.1)
Clear Aperture: >90%
AOI, °: 45
Surface quality, S-D: 20-10
