In stock
Protective chamfers:
Wedge / Parallelism error: 30 ±5 arcmin (marked ^)
Thickness, mm: 5 (±0.1)
Surface quality, S-D: 20-10
Surface flatness, P-V: λ/8 @ 632. 8 nm
S1: PR (P=92 ±1%) @ 1030 nm, AOI = 0°
Protective chamfers: 0.1-0.3 mm x 45°
Material: UVFS
Dimensions, mm: Ø12.7 (+0/-0.1)
Coatings:
Clear Aperture: >90
S2(^): AR (R<0.25%) @ 1030 nm, AOI = 0°
Wedge / Parallelism error: 30 ±5 arcmin (marked ^)
Thickness, mm: 5 (±0.1)
Surface quality, S-D: 20-10
Surface flatness, P-V: λ/8 @ 632. 8 nm
S1: PR (P=92 ±1%) @ 1030 nm, AOI = 0°
Protective chamfers: 0.1-0.3 mm x 45°
Material: UVFS
Dimensions, mm: Ø12.7 (+0/-0.1)
Coatings:
Clear Aperture: >90
S2(^): AR (R<0.25%) @ 1030 nm, AOI = 0°
