In stock
LIDT: >20 J/cm², 10 ns, 10 Hz, 532 nm
S1 Surface quality, S-D: 20-10
S1 Flatness, PV: <λ/8 @ 632.8 nm
Reflectivity, %: Rs>99.97, Rp>99.93
Wavelength, nm: 515-532
Protective chamfers: <0.25 mm x 45°
Dimensions, mm: Ø30 (+0/-0.1) x 6 (±0.1)
Clear Aperture: >Ø27.8
Angle of Incidence (AOI), °: 45
Parallelism error: <1 arcmin
Material: UVFS
S1 Surface quality, S-D: 20-10
S1 Flatness, PV: <λ/8 @ 632.8 nm
Reflectivity, %: Rs>99.97, Rp>99.93
Wavelength, nm: 515-532
Protective chamfers: <0.25 mm x 45°
Dimensions, mm: Ø30 (+0/-0.1) x 6 (±0.1)
Clear Aperture: >Ø27.8
Angle of Incidence (AOI), °: 45
Parallelism error: <1 arcmin
Material: UVFS