In stock
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 40-20
S2: AR(R<0.2%)@ 515 nm, AOI=0 deg
S1: AR(R<0.2%)@ 515 nm, AOI=0 deg
ROC S1, mm: +68.55 +/-0.5%
Protective chamfers: <0.25 mm x 45°
Edge thickness, mm: 2 (±0.1)
Dimensions, mm: Ø25.4 (+0/-0.1)
Coatings:
Clear Aperture: >90
Centration error: <3 arcmin
Material: UVFS
Surface quality, S-D: 40-20
S2: AR(R<0.2%)@ 515 nm, AOI=0 deg
S1: AR(R<0.2%)@ 515 nm, AOI=0 deg
ROC S1, mm: +68.55 +/-0.5%
Protective chamfers: <0.25 mm x 45°
Edge thickness, mm: 2 (±0.1)
Dimensions, mm: Ø25.4 (+0/-0.1)
Coatings:
Clear Aperture: >90
Centration error: <3 arcmin
Material: UVFS
