In stock
Rs-Rp, %: 10%
Wedge / Parallelism error: <1 arcmin
Wavelength, nm: 532
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Surface quality, S-D: 20-10
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Clear Aperture: >90
Angle of Incidence (AOI), °: 45
Reflectivity, Rsp %: 20 ±5
Wedge / Parallelism error: <1 arcmin
Wavelength, nm: 532
Transmitted wavefront distortion, PV: <λ/8 @ 632.8 nm
Surface quality, S-D: 20-10
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Clear Aperture: >90
Angle of Incidence (AOI), °: 45
Reflectivity, Rsp %: 20 ±5
