In stock
Protective chamfers: <0.25 mm x 45 deg
Surface quality, S-D: 40-20
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Thickness, mm: 3 (±0.1)
S1: AR(R<0.5%) @ 266 nm, AOI = 0°
Material: CaF2 (random orientation)
Dimensions, mm: 15 (+0.0/-0.1 mm)
Damage threshold: >1 J/cm² @ 1 ns, 266 nm
Coatings:
Clear Aperture: 90
Parallelism error: <5 arcmin
S2: AR(R<0.5%) @ 266 nm, AOI = 0°
Surface quality, S-D: 40-20
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Thickness, mm: 3 (±0.1)
S1: AR(R<0.5%) @ 266 nm, AOI = 0°
Material: CaF2 (random orientation)
Dimensions, mm: 15 (+0.0/-0.1 mm)
Damage threshold: >1 J/cm² @ 1 ns, 266 nm
Coatings:
Clear Aperture: 90
Parallelism error: <5 arcmin
S2: AR(R<0.5%) @ 266 nm, AOI = 0°
