In stock
Wavelength, nm: 632.8
Surface quality, S-D: 40-20
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
ROC S1, mm: -34.28
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Dimensions, mm: Ø12.7 (+0/-0.1)
Coatings: AR/AR<0.3%@ 343-355 nm, AOI=0°
Clear Aperture: >90
Centration error: <3 arcmin
Center thickness, mm: 2 (±0.1)
Focal length, mm: -75 (±3%)
Surface quality, S-D: 40-20
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
ROC S1, mm: -34.28
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Dimensions, mm: Ø12.7 (+0/-0.1)
Coatings: AR/AR<0.3%@ 343-355 nm, AOI=0°
Clear Aperture: >90
Centration error: <3 arcmin
Center thickness, mm: 2 (±0.1)
Focal length, mm: -75 (±3%)
