In stock
S1 Flatness, PV IR S2 Flatness, PV: <λ/2 @ 632.8 nm
Material: UVFS
Wedge / Parallelism error: 1° (±5 arcmin)
Wavelength, nm: 720-820 (centered @ 800 nm)
Configuration: Max Rs
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Surface quality, S-D: 20-10
Angle of Incidence (AOI), °: 72 (±2)
Protective chamfers: <0.25 mm x 45°
Extinction Ratio: >5:1
Dimensions, mm: 20 (+0/-0.1) x 60 (+0/-0.1) x 5 (±0.1)
Clear Aperture: >90
Reflection s-pol, %: >98%
Reflection p-pol: <20%
Material: UVFS
Wedge / Parallelism error: 1° (±5 arcmin)
Wavelength, nm: 720-820 (centered @ 800 nm)
Configuration: Max Rs
Transmitted wavefront distortion, PV: <λ/6 @ 632.8 nm
Surface quality, S-D: 20-10
Angle of Incidence (AOI), °: 72 (±2)
Protective chamfers: <0.25 mm x 45°
Extinction Ratio: >5:1
Dimensions, mm: 20 (+0/-0.1) x 60 (+0/-0.1) x 5 (±0.1)
Clear Aperture: >90
Reflection s-pol, %: >98%
Reflection p-pol: <20%
