In stock
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Surface quality, S1/S2: 20/10 S/D (40/20 S/D after coating)
Surface irregularity, P-V, S2: <λ/4@633 nm per CA
S1 Flatness, PV: <λ/4@633 nm per CA
S2: AR(R<0.2%)@940 nm, AOI=0°
S1: AR(R<0.2%)@940 nm, AOI=0°
ROC, S2: ∞
Center thickness, mm: 2 mm (+/-0.1 mm)
Focus length: -40.0 mm (+/-3%) @633 nm
Edge thickness, mm: 7.13 mm (+/-0.1 mm)
Diameter, mm: 25.4 mm (+0.0/-0.1 mm)
Coatings: e-Beam
Clear aperture: >90%
Centration error: <3 arcmin
ROC, S1: -18.28 mm (+/-1%)
Material: UVFS
Surface quality, S1/S2: 20/10 S/D (40/20 S/D after coating)
Surface irregularity, P-V, S2: <λ/4@633 nm per CA
S1 Flatness, PV: <λ/4@633 nm per CA
S2: AR(R<0.2%)@940 nm, AOI=0°
S1: AR(R<0.2%)@940 nm, AOI=0°
ROC, S2: ∞
Center thickness, mm: 2 mm (+/-0.1 mm)
Focus length: -40.0 mm (+/-3%) @633 nm
Edge thickness, mm: 7.13 mm (+/-0.1 mm)
Diameter, mm: 25.4 mm (+0.0/-0.1 mm)
Coatings: e-Beam
Clear aperture: >90%
Centration error: <3 arcmin
ROC, S1: -18.28 mm (+/-1%)
