In stock
S1: AR(R<0.2%)@950 - 1100 nm, AOI=0°
Surface quality, S1/S2: 20/10 S/D (40/20 S/D after coating)
Surface irregularity, P-V, S1: <λ/2@633 nm per CA
S2: AR(R<0.2%)@950 - 1100 nm, AOI=0°
ROC, S2: ∞
ROC, S1: +85.7 mm (+/-1%)
Protective chamfers: <0.25 mm x 45°
Focus length: +200.0 mm (+/-3%) @633 nm
Edge thickness, mm: 1.0 mm (+/-0.1 mm)
Diameter, mm: 25.4 mm (+0.0/-0.1 mm)
Center thickness, mm: 2.0 mm (+/-0.1 mm)
Coatings: IBS, Low GDD
Clear aperture: >90%
Centration error: <3 arcmin
Surface flatness, P-V, S2: <λ/4@633 nm per CA
Material: CaF₂ (laser grade)
Surface quality, S1/S2: 20/10 S/D (40/20 S/D after coating)
Surface irregularity, P-V, S1: <λ/2@633 nm per CA
S2: AR(R<0.2%)@950 - 1100 nm, AOI=0°
ROC, S2: ∞
ROC, S1: +85.7 mm (+/-1%)
Protective chamfers: <0.25 mm x 45°
Focus length: +200.0 mm (+/-3%) @633 nm
Edge thickness, mm: 1.0 mm (+/-0.1 mm)
Diameter, mm: 25.4 mm (+0.0/-0.1 mm)
Center thickness, mm: 2.0 mm (+/-0.1 mm)
Coatings: IBS, Low GDD
Clear aperture: >90%
Centration error: <3 arcmin
Surface flatness, P-V, S2: <λ/4@633 nm per CA
Material: CaF₂ (laser grade)