In stock
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm over inch diamter at any point in clear aperture
Wedge / Parallelism error: <1 arcmin
Wavelength, nm: 1030-1064
Surface quality, S-D: 20-10
Reflectivity, %: Rs>99.98, Rp>99.93
Material: UVFS
Dimensions, mm: Ø50.8 (+0/-0.1) x 6 ( ±0.1)
Clear Aperture: >90
Angle of Incidence (AOI), °: 45°
Protective chamfers: 0.1-0.3 mm x 45°
Wedge / Parallelism error: <1 arcmin
Wavelength, nm: 1030-1064
Surface quality, S-D: 20-10
Reflectivity, %: Rs>99.98, Rp>99.93
Material: UVFS
Dimensions, mm: Ø50.8 (+0/-0.1) x 6 ( ±0.1)
Clear Aperture: >90
Angle of Incidence (AOI), °: 45°
Protective chamfers: 0.1-0.3 mm x 45°
