In stock
Material: UVFS
S2: uncoated
S1/S2 Surface quality, S-D: 20-10
S1(^): HR(Rsp>99.5%) @ 1030 nm, AOI=45 deg
S1 Flatness, PV: <λ/8 @ 632.8 nm
Parallelism error: <1 arcmin
Dimensions, mm: Ø12.7 (+0/-0.1) x 5 (±0.1)
Coatings: e-beam
Clear Aperture: >90
Protective chamfers: <0.25 mm x 45°
S2: uncoated
S1/S2 Surface quality, S-D: 20-10
S1(^): HR(Rsp>99.5%) @ 1030 nm, AOI=45 deg
S1 Flatness, PV: <λ/8 @ 632.8 nm
Parallelism error: <1 arcmin
Dimensions, mm: Ø12.7 (+0/-0.1) x 5 (±0.1)
Coatings: e-beam
Clear Aperture: >90
Protective chamfers: <0.25 mm x 45°
