In stock
Material: UVFS
Reflection Rs/ Rp/ Ravg, %: 99.7 /99.3 /99.5
Wavelength, nm: 1530-1590
Surface quality, S-D: 20-10
Substrate dimensions, mm: 20 x 40
90° angle tolerance: ±30 arcsec
GDD, fs²: <20
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Angle of Incidence (AOI), °: 45
Pyramidal tolerance: <1 arcmin
Protective chamfers: <0.25 mm x 45°
Reflection Rs/ Rp/ Ravg, %: 99.7 /99.3 /99.5
Wavelength, nm: 1530-1590
Surface quality, S-D: 20-10
Substrate dimensions, mm: 20 x 40
90° angle tolerance: ±30 arcsec
GDD, fs²: <20
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Angle of Incidence (AOI), °: 45
Pyramidal tolerance: <1 arcmin
Protective chamfers: <0.25 mm x 45°
