In stock
Material: UVFS JGS1
Wedge / Parallelism error: <5 arcsec
TWD, PV: <λ/8 @ 632.8 nm
Surface quality, S-D: 10-5
Polishing technology: polished on 2-side polishing stage, no CeO2 used
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Clear Aperture: >90
Protective chamfers: 0.1-0.25 mm x 45°
Wedge / Parallelism error: <5 arcsec
TWD, PV: <λ/8 @ 632.8 nm
Surface quality, S-D: 10-5
Polishing technology: polished on 2-side polishing stage, no CeO2 used
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Clear Aperture: >90
Protective chamfers: 0.1-0.25 mm x 45°
