9689278

S1 Surface quality, S-D: 20-10
S2 Surface quality, S-D: commercially polished
S1 Flatness, PV: <λ/8 @ 632.8 nm
Reflectivity, %: Rs>99.8; Rp>99.6
Protective chamfers: 0.1-0.25 mm x 45°
Parallelism error: <1 arcmin
LIDT: >10 J/cm², 10 ns, 10 Hz, 1064 nm
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Coating technology: e-beam
Coating Materials: Ta₂O₅+SiO₂
Angle of Incidence (AOI), °: 45
Clear Aperture: >90
Wavelength, nm: 1020-1070
Material: UVFS