In stock
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Surface quality, S-D: 40-20
S2: AR(R<0.5%)@650+AR(R<0.5%)@760 nm – 800 nm, 0°
S1: AR(R<0.5%)@650+AR(R<0.5%)@760 nm – 800 nm, 0°
ROC S1, mm: +68.55
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Edge thickness, mm: 2 (±0.1)
Dimensions, mm: Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Coatings: e-Beam
Clear Aperture: >90
Centration error: <3 arcmin
Focal length, mm: +150 (±3%)
Surface quality, S-D: 40-20
S2: AR(R<0.5%)@650+AR(R<0.5%)@760 nm – 800 nm, 0°
S1: AR(R<0.5%)@650+AR(R<0.5%)@760 nm – 800 nm, 0°
ROC S1, mm: +68.55
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Edge thickness, mm: 2 (±0.1)
Dimensions, mm: Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Coatings: e-Beam
Clear Aperture: >90
Centration error: <3 arcmin
Focal length, mm: +150 (±3%)
