In stock
Angle of Incidence (AOI), °: 0
Material: SiO2 Fused Silica
Thickness, mm: 3 (±0.1)
WFD, PV: <λ/10 @ 632.8 nm
Surface quality, S-D: 20-10
S1 Radius of Curvature (ROC), mm: +75
Protective chamfers: 0.2 mm x 45°
S1 Flatness, PV IR S2 Flatness, PV: <λ/10 @ 632.8 nm
Dimensions, mm: Ø5 (+0/-0.1)
Coatings on S2: uncoated, good polishing for optical contacting
Clear aperture: >90%
Coatings on S1: HR(R=96% ±1%)@607+640nm + HT(T>96%)@444nm
LIDT: 50MW/cm2
Material: SiO2 Fused Silica
Thickness, mm: 3 (±0.1)
WFD, PV: <λ/10 @ 632.8 nm
Surface quality, S-D: 20-10
S1 Radius of Curvature (ROC), mm: +75
Protective chamfers: 0.2 mm x 45°
S1 Flatness, PV IR S2 Flatness, PV: <λ/10 @ 632.8 nm
Dimensions, mm: Ø5 (+0/-0.1)
Coatings on S2: uncoated, good polishing for optical contacting
Clear aperture: >90%
Coatings on S1: HR(R=96% ±1%)@607+640nm + HT(T>96%)@444nm
LIDT: 50MW/cm2