In stock
S1 Flatness, PV IR S2 Flatness, PV: <λ/7.5 @ 632.8 nm
Wavelength, nm: 343-355
Surface quality, S-D: 20-10
Reflectivity, %: Rs>99.9, Rp>99.7
Wedge / Parallelism error: <1 arcmin
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Clear Aperture: >90
Angle of Incidence (AOI), °: 45°
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Wavelength, nm: 343-355
Surface quality, S-D: 20-10
Reflectivity, %: Rs>99.9, Rp>99.7
Wedge / Parallelism error: <1 arcmin
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Clear Aperture: >90
Angle of Incidence (AOI), °: 45°
Protective chamfers: <0.25 mm x 45°
Material: UVFS
