In stock
Parallelism error: <1 arcmin
Wavelength, nm: 1030
S2: grinded
S1 Surface quality, S-D: 20-10
S1 Flatness, PV: <λ/8 @ 632.8 nm
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Dimensions, mm: Ø50.8 (+0/-0.1) x 6 (±0.1)
Clear aperture: >90
Angle of Incidence (AOI), °: 45
Reflectivity, %: Rs>99.6; Rp>99.0
Wavelength, nm: 1030
S2: grinded
S1 Surface quality, S-D: 20-10
S1 Flatness, PV: <λ/8 @ 632.8 nm
Protective chamfers: <0.25 mm x 45°
Material: UVFS
Dimensions, mm: Ø50.8 (+0/-0.1) x 6 (±0.1)
Clear aperture: >90
Angle of Incidence (AOI), °: 45
Reflectivity, %: Rs>99.6; Rp>99.0
