In stock
Wavelength, nm: 1020-1070
S1 Surface quality, S-D: 20-10
S1 Flatness, PV: <λ/8 @ 632.8 nm
Protective chamfers: 0.1-0.25 mm x 45°
Parallelism error: <1 arcmin
Material: UVFS
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Clear Aperture: >90
Angle of Incidence (AOI), °: 45
Reflectivity, %: Rs <99,8%; Rp<99,6%
S1 Surface quality, S-D: 20-10
S1 Flatness, PV: <λ/8 @ 632.8 nm
Protective chamfers: 0.1-0.25 mm x 45°
Parallelism error: <1 arcmin
Material: UVFS
Dimensions, mm: Ø25.4 (+0/-0.1) x 5 (±0.1)
Clear Aperture: >90
Angle of Incidence (AOI), °: 45
Reflectivity, %: Rs <99,8%; Rp<99,6%
