In stock
Protective chamfers: 0.2 mm x 45°
Transmitted wavefront distortion, PV: λ/10 @ 632.8 nm
Thickness, mm: 1 (±0.1)
S1 Flatness, PV IR S2 Flatness, PV: <λ/10 @ 632.8 nm
Parallelism error: < 20 arcsec
Dimensions, mm: 3 x 3 (±0.1)
Crystal material: SiO2 Fused Silica
Surface quality, S-D: 10-5
Transmitted wavefront distortion, PV: λ/10 @ 632.8 nm
Thickness, mm: 1 (±0.1)
S1 Flatness, PV IR S2 Flatness, PV: <λ/10 @ 632.8 nm
Parallelism error: < 20 arcsec
Dimensions, mm: 3 x 3 (±0.1)
Crystal material: SiO2 Fused Silica
Surface quality, S-D: 10-5
