In stock
Material: UVFS
Surface quality, S-D: 40-20
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Protective chamfers: <0.25 mm x 45°
Focal length, mm: +100 (±3%)
Edge thickness, mm: 2.0 (±0.1)
Dimensions, mm: Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Clear Aperture: >90
Centration error: <3 arcmin
ROC S1, mm: +45.7
Surface quality, S-D: 40-20
S1 Flatness, PV IR S2 Flatness, PV: <λ/4 @ 632.8 nm
Protective chamfers: <0.25 mm x 45°
Focal length, mm: +100 (±3%)
Edge thickness, mm: 2.0 (±0.1)
Dimensions, mm: Ø25.4 (+0/-0.1)
Wavelength, nm: 632.8
Clear Aperture: >90
Centration error: <3 arcmin
ROC S1, mm: +45.7
