In stock
Surface quality, S-D: 20-10
AOI, °: 45
Wedge / Parallelism error: <1 arcmin
Wavelength, nm: 340-370
Reflectivity (average), %: >99.5
Protective chamfers: <0.25 mm x 45°
Clear Aperture: >90%
GDD, fs²: s-pol: ±10; p-pol: ±20
Material: UVFS
Dimensions, mm: Ø25.4 (+0/-0.1) x 6 (±0.1)
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
AOI, °: 45
Wedge / Parallelism error: <1 arcmin
Wavelength, nm: 340-370
Reflectivity (average), %: >99.5
Protective chamfers: <0.25 mm x 45°
Clear Aperture: >90%
GDD, fs²: s-pol: ±10; p-pol: ±20
Material: UVFS
Dimensions, mm: Ø25.4 (+0/-0.1) x 6 (±0.1)
S1 Flatness, PV IR S2 Flatness, PV: <λ/8 @ 632.8 nm
